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137 条记录 (耗时 0.028 秒)

    Navigation system
    61.
    发明授权
    Navigation system 有权
    导航系统

    公开(公告)号：US06658352B2

    公开(公告)日：2003-12-02

    申请号：US09979514

    申请日：2001-11-14

    申请人： Yuichi Abe ,  Tomoyuki Yoshimura ,  Susumu Iida ,  Akiyoshi Yamamoto

    发明人： Yuichi Abe ,  Tomoyuki Yoshimura ,  Susumu Iida ,  Akiyoshi Yamamoto

    IPC分类号： G01C2130

    CPC分类号： G01C21/3629 ,  G01C21/3655

    摘要： The present invention is directed to a navigation apparatus capable of performing a proper voice guidance even in such a case that signals transmitted from GPS satellites cannot be received, but a current location cannot be judged. The navigation apparatus of the present invention is featured by such a navigation apparatus in which signals transmitted from GPS satellites are received so as to measure a current location, the measured current location is displayed on a screen in connection with a map, a guidance route up to a destination place is set, and a guidance is notified every predetermined guidance point. In this navigation apparatus, when the signals transmitted from the GPS satellites cannot be received, if a current location is located on the guidance route, then a virtual current location is displayed in such a manner that the virtual current location is moved on the guidance route at a predetermined speed, and a guidance is notified every predetermined guidance point.

    摘要翻译： 本发明涉及即使在不能接收到从GPS卫星发送的信号但不能判断当前位置的情况下也能够进行适当语音引导的导航装置。 本发明的导航装置具有这样的导航装置，其中接收从GPS卫星发送的信号以测量当前位置，所测量的当前位置与地图相关联地显示在屏幕上，引导路线向上 设定目的地，并且每个预定的引导点通知指导。 在该导航装置中，当不能接收到从GPS卫星发送的信号时，如果当前位置位于引导路线上，则以虚拟当前位置在引导路径上移动的方式显示虚拟当前位置 以预定速度，并且每个预定的引导点通知引导。

    Navigation apparatus
    62.
    发明授权
    Navigation apparatus 有权
    导航仪

    公开(公告)号：US06385534B1

    公开(公告)日：2002-05-07

    申请号：US09711455

    申请日：2000-11-13

    申请人： Tomoyuki Yoshimura ,  Yuichi Abe

    发明人： Tomoyuki Yoshimura ,  Yuichi Abe

    IPC分类号： G01C2100

    CPC分类号： G01S19/13 ,  G01C21/30 ,  G01S19/50

    摘要： Navigation apparatus has a controller that performs map-matching in which present position detected by a position detector is checked against a road on a map. When a road on which the present position lies is found, the controller causes the apparatus to display a name of the road. When a road on which the present position lies is not found, the controller causes the apparatus to display area information indicative of the present position.

    摘要翻译： 导航装置具有执行地图匹配的控制器，其中由地图检测器检测到的当前位置与地图上的道路相对。 当发现当前位置所在的道路时，控制器使该装置显示道路的名称。 当找不到当前位置所在的道路时，控制器使该装置显示指示当前位置的区域信息。

    Probe apparatus and burn-in apparatus
    63.
    发明授权
    Probe apparatus and burn-in apparatus 失效
    探头装置和老化装置

    公开(公告)号：US5510724A

    公开(公告)日：1996-04-23

    申请号：US251365

    申请日：1994-05-31

    申请人： Taketoshi Itoyama ,  Yuichi Abe ,  Masao Yamaguchi

    发明人： Taketoshi Itoyama ,  Yuichi Abe ,  Masao Yamaguchi

    IPC分类号： G01R31/28 ,  G01R31/02

    CPC分类号： G01R31/2849

    摘要： A loader section for supplying semiconductor wafers is arranged at one end of a linear first convey path for a convey unit. Burn-in test sections, probe test sections, a laser repair section, a deposition repair section, a marking section, a baking section, and visual test sections are arranged on both the sides of the first convey path. In the burn-in test section arranged in the loader section, each semiconductor wafer picked up from a cassette is pre-aligned. The pre-aligned semiconductor wafers are loaded/unloaded into/from the respective test sections and the repair section by the convey unit in accordance with a predetermined test procedure, thereby performing a plurality of test items and repair steps by an inline scheme. Each burn-in test section includes a probe card having conductive projections which are brought into contact with all of many semiconductor chips formed on each semiconductor wafer at once. Each burn-in test section performs burn-in tests on a plurality of semiconductor chips with which the conductive projections are brought into contact at once, while temperature/voltage stresses are applied to the semiconductor chips.

    摘要翻译： 用于提供半导体晶片的装载器部分布置在用于输送单元的线性第一输送路径的一端。 在第一传送路径的两侧布置了老化测试部分，探针测试部分，激光修复部分，沉积修复部分，标记部分，烘烤部分和视觉测试部分。 在安装在装载器部分中的老化测试部分中，从盒子拾取的每个半导体晶片被预对准。 预定半导体晶片根据预定的测试程序由输送单元装载/卸载到相应的测试部分和修理部分，从而通过在线方案执行多个测试项目和修理步骤。 每个老化测试部分包括具有导电突起的探针卡，该探针卡立刻与形成在每个半导体晶片上的所有许多半导体芯片接触。 每个老化测试部分在对半导体芯片施加温度/电压应力的同时，对导体突起一次接触的多个半导体芯片执行老化测试。

    Semiconductor inspection system
    65.
    发明授权
    Semiconductor inspection system 有权

    公开(公告)号：US09704235B2

    公开(公告)日：2017-07-11

    申请号：US14234977

    申请日：2012-07-20

    申请人： Akiyuki Sugiyama ,  Yuichi Abe

    发明人： Akiyuki Sugiyama ,  Yuichi Abe

    IPC分类号： G06T7/00 ,  G01B15/08 ,  H01L21/66

    CPC分类号： G06T7/001 ,  G01B15/08 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

    摘要： When the lengths of FEM wafers are automatically measured, not only the sizes of targets, the lengths of which are to be measured, are often varied from those in registration, but also the patterns of the targets are often deformed. Therefore, it is difficult to automatically determine whether the length measurement is possible or not. Therefore, the following are executed with a semiconductor inspection system: (1) a process of identifying the position of the contour line of an inspected image using a distance image calculated from a reference image, (2) a process of calculating a defect size image based on the position of the contour line with respect to the identified distance image, and detecting a defect candidate from the defect size image, and (3-1) a process of, upon detection of the defect candidate, calculating the size of the detected defect candidate, or (3-2) a process of detecting a portion different between the first and second contour lines as the defect candidate.

    Water-proof sound transmitting member
    66.
    发明授权
    Water-proof sound transmitting member 有权
    防水传声器

    公开(公告)号：US09319762B2

    公开(公告)日：2016-04-19

    申请号：US14122520

    申请日：2012-04-02

    申请人： Yuki Karube ,  Yuichi Abe ,  Yuri Horie

    发明人： Yuki Karube ,  Yuichi Abe ,  Yuri Horie

    IPC分类号： H04R1/02 ,  H04R9/06 ,  H04M1/03 ,  H04R1/44 ,  H04M1/18

    CPC分类号： H04R1/02 ,  H04M1/03 ,  H04M1/18 ,  H04R1/44 ,  H04R2499/11

    摘要： Provided is a water-proof sound transmitting member that is less likely to be bonded to a housing at a position other than a normal attachment position. The present invention provides a waterproof sound transmitting member (2) having a multilayer structure. This water-proof sound transmitting member (2) includes: a water-proof sound transmitting membrane (11) to be attached to a housing having a hole that allows sound to pass therethrough; a support layer (12) to be attached to the housing together with the waterproof sound transmitting membrane (11), the support layer (12) allowing sound to pass therethrough; and a housing-side adhesive layer (21) for bonding the waterproof sound transmitting membrane (11) to the housing. The entire peripheral portion of the support layer (12) extends outwardly beyond the housing-side adhesive layer (21).

    摘要翻译： 提供一种防水传声构件，其在除了正常安装位置之外的位置处不太可能结合到壳体。 本发明提供一种具有多层结构的防水传声构件（2）。 该防水传声构件（2）包括：防水传声膜（11），其附接到具有允许声音通过的孔的壳体; 与防水传声膜（11）一起附接到壳体的支撑层（12），允许声音通过的支撑层（12）; 以及用于将防水传声膜（11）接合到壳体的壳体侧粘合剂层（21）。 支撑层（12）的整个周边部分向外延伸超过壳体侧粘合剂层（21）。

    Inspection apparatus
    67.
    发明授权
    Inspection apparatus 有权
    检验仪器

    公开(公告)号：US09183450B2

    公开(公告)日：2015-11-10

    申请号：US11790883

    申请日：2007-04-27

    申请人： Yuichi Abe ,  Mitsuji Ikeda

    发明人： Yuichi Abe ,  Mitsuji Ikeda

    IPC分类号： G06K9/62 ,  G06K9/00 ,  G06K9/03 ,  G06T7/00

    CPC分类号： G06K9/03 ,  G06K9/6253 ,  G06T7/001 ,  G06T2207/10048 ,  G06T2207/10056 ,  G06T2207/10116 ,  G06T2207/30128 ,  G06T2207/30148

    摘要： An inspection apparatus and method are provided, wherein even when an image that cannot be processed by a current image processing algorithm is input to an image processing unit while a working line is in operation, the inspection can be continued by newly generating an image processing algorithm optimized in keeping with a particular image. The apparatus includes an erroneous recognition detector, a teacher data generator and a switching unit for switching the current image processing algorithm to a new image processing algorithm generated based on an updated teacher data group. As a result, the inspection can be continued without extremely decreasing the accuracy even when an unexpected image is input to the working line.

    摘要翻译： 提供了一种检查装置和方法，其中即使在工作线处于运行中，当图像处理单元不能被当前图像处理算法处理的图像输入到图像处理单元时，也可以通过新生成图像处理算法来继续检查 根据特定图像进行优化。 该装置包括错误识别检测器，教师数据发生器和用于将当前图像处理算法切换到基于更新的教师数据组生成的新图像处理算法的切换单元。 结果，即使当意外的图像被输入到工作线路时，也可以继续检查，而不会极大地降低精度。

    Pattern matching method and pattern matching apparatus
    69.
    发明授权
    Pattern matching method and pattern matching apparatus 有权
    模式匹配方法和模式匹配装置

    公开(公告)号：US08885950B2

    公开(公告)日：2014-11-11

    申请号：US13502823

    申请日：2010-10-06

    申请人： Wataru Nagatomo ,  Yuichi Abe ,  Mitsuji Ikeda

    发明人： Wataru Nagatomo ,  Yuichi Abe ,  Mitsuji Ikeda

    IPC分类号： G06K9/00 ,  G06K9/62 ,  G06T7/00 ,  G06K9/68

    CPC分类号： G06K9/6203 ,  G06K9/6253 ,  G06K9/6255 ,  G06K9/6857 ,  G06T7/74 ,  G06T2207/10061 ,  G06T2207/20016 ,  G06T2207/30148 ,  H01J2237/221 ,  H01J2237/226

    摘要： Provided is a template matching method and a template matching apparatus, where the degree of matching between a template and the actual image upon template matching is maintained at a high level, without depending on a partial appearance of a lower layer. Proposed as one embodiment, is a method and an apparatus for template matching, where either an area is set in which comparison of the template and the image is not conducted, or a second area is set inside the template where comparison different from comparison conducted in a first comparison area is to be conducted, and the template matching is conducted on the basis either of comparison excluding the non-comparison area, or of comparison using the first and second areas.

    摘要翻译： 提供了一种模板匹配方法和模板匹配装置，其中模板匹配之间的模板和实际图像之间的匹配程度保持在高水平，而不依赖于较低层的部分外观。 作为一个实施例，提出了一种用于模板匹配的方法和装置，其中设置了不进行模板和图像的比较的区域，或者在模板内部设置第二区域，其中比较不同于进行比较 将进行第一比较区域，并且基于除非比较区域之外的比较或使用第一和第二区域的比较进行模板匹配。