Differential scanning calorimeter with a second heater
    61.
    发明授权
    Differential scanning calorimeter with a second heater 有权
    差示扫描量热仪带有第二个加热器

    公开(公告)号:US07275862B2

    公开(公告)日:2007-10-02

    申请号:US10990636

    申请日:2004-11-17

    CPC classification number: G01N25/4866 G01N25/4826

    Abstract: A differential scanning calorimeter has a heat sink for accommodating therein a measurement sample and a reference material, and a differential heat flow detector that detects a temperature difference between the sample and the reference material. A cooling mechanism cools the heat sink, and a thermoconductor is disposed between the cooling mechanism and the heat sink and forms a heat flow path between the two. A first heater heats the heat sink, and a second heater heats the thermoconductor to thereby heat the heat sink. The second heater begins operating before the first heater nears its rated maximum output power.

    Abstract translation: 差示扫描量热计具有用于容纳测量样品和参考材料的散热器,以及检测样品和参考材料之间的温度差的差示热流检测器。 冷却机构冷却散热器,并且在冷却机构和散热器之间设置热导体,并​​在两者之间形成热流路径。 第一加热器加热散热器,第二加热器加热导热体从而加热散热器。 第二个加热器在第一个加热器接近额定最大输出功率之前开始运行。

    Thermal analyzer with gas mixing chamber
    62.
    发明授权
    Thermal analyzer with gas mixing chamber 有权
    带气体混合室的热分析仪

    公开(公告)号:US07104680B2

    公开(公告)日:2006-09-12

    申请号:US10974853

    申请日:2004-10-27

    Abstract: In a thermomechanical measuring device and a thermogravimetry device, partition walls are provided in two sections such that two kinds of atmospheric gasses, which have passed a sample chamber and a detector chamber, respectively, do not flow back, and a thermally insulated gas mixing chamber is manufactured anew in the middle of the sample chamber and the detector chamber to make it possible to dilute a reactive gas and a water vapor gas having a high partial pressure. Consequently, it is possible to prevent moisture concentration to reduce an influence of water drops even in a high temperature and high humidity state at the time of humidity control and measurement.

    Abstract translation: 在热机械测量装置和热重分析装置中,分隔壁分两部分设置,使得分别通过样品室和检测器室的两种大气气体不会流回,而隔热气体混合室 在样品室和检测器室的中间重新制造,使得可以稀释反应性气体和具有高分压的水蒸汽气体。 因此,即使在湿度控制和测量时,在高温高湿状态下,也可以防止水分浓度降低水滴的影响。

    Method for extracting objective image
    63.
    发明授权
    Method for extracting objective image 失效
    提取客观图像的方法

    公开(公告)号:US07103209B1

    公开(公告)日:2006-09-05

    申请号:US10130881

    申请日:2000-11-20

    Applicant: Kazuo Aita

    Inventor: Kazuo Aita

    CPC classification number: G01N21/956 G01N2021/95676 G06T5/20

    Abstract: Noted portions of an image, such as a pin point hole in an isolated area or a pattern contour that forms a continuous boundary area, are clearly displayed by first erasing background noise by acquiring information regarding differences between an image detection signal (pixel) of each scanned position (dot) in matrix form and image detection signals of the surrounding scanned positions, and secondly, by adopting a value that is either a largest or smallest value greater than or equal to zero among a plurality of sets of information on value differences as new image information for the scanned position.

    Abstract translation: 通过首先通过获取关于每个图像的图像检测信号(像素)之间的差异的信息来消除背景噪声来清楚地显示诸如形成连续边界区域的孤立区域中的针点孔或图形轮廓的图像的部分, 矩阵形式的扫描位置(点)和周围扫描位置的图像检测信号,其次,通过在多个关于值差异的信息集合中采用大于或等于零的最大值或最小值的值作为 扫描位置的新图像信息。

    TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope
    64.
    发明授权
    TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope 有权
    具有识别功能的TEM样品,用于处理TEM样品的聚焦离子束装置和透射电子显微镜

    公开(公告)号:US07095024B2

    公开(公告)日:2006-08-22

    申请号:US10828001

    申请日:2004-04-20

    Abstract: The problem of the present invention is to provide a TEM sample equipped with an identifying function for easily specifying a detailed TEM sample and to provide a system for handling the management of information relating to the TEM sample using the TEM when making observations that is constructed with the FIB device manufacturing the sample. The TEM sample of the present invention is written with a mark encoding information specifying the sample at a specified location of a peripheral part. Information relating to the sample filed taking sample specifying information as an index is supplied to a TEM as associated matter. The sample working FIB device and observation TEM device of the present invention are provided with a function enabling writing of information relating to the sample and images to the file during operation which is then read out and utilized on a display.

    Abstract translation: 本发明的问题是提供一种具有识别功能的TEM样品,用于容易地指定详细的TEM样品,并提供一个系统,用于当进行观察时使用TEM处理与TEM样品有关的信息的管理, FIB设备制造样品。 本发明的TEM样品用指定样品在周边部分的指定位置处的标记编码信息进行写入。 以采样指定信息为索引的样本提供的信息作为关联事项提供给TEM。 本发明的样品工作FIB装置和观察TEM装置具有能够在操作期间将关于样品和图像的信息写入文件的功能,然后在显示器上读出并利用该功能。

    Micro-sample pick-up apparatus and micro-sample pick-up method
    65.
    发明授权
    Micro-sample pick-up apparatus and micro-sample pick-up method 有权
    微量取样装置和微量取样方法

    公开(公告)号:US07067823B2

    公开(公告)日:2006-06-27

    申请号:US10839508

    申请日:2004-05-05

    CPC classification number: H01J37/20 G01N1/32 H01J2237/208

    Abstract: A micro-sample pick-up apparatus has a probe for picking up a micro sample, a probe holder for holding the probe, an XYZ driver mechanism for moving the probe holder in the three-dimensional directions of X, Y and Z, and an observation mechanism for observing the sample and the probe. A low-vibration rotary mechanism disposed in the probe holder for rotating the probe about an axis of the probe.

    Abstract translation: 微型样品拾取装置具有用于拾取微量样品的探针,用于保持探针的探针支架,用于在X,Y和Z的三维方向上移动探针支架的XYZ驱动机构,以及 用于观察样品和探针的观察机制。 一种低振动旋转机构,设置在探针保持器中,用于围绕探头的轴线旋转探针。

    X-ray analyzer for analyzing plastics
    66.
    发明授权
    X-ray analyzer for analyzing plastics 有权
    用于分析塑料的X射线分析仪

    公开(公告)号:US07062014B2

    公开(公告)日:2006-06-13

    申请号:US10935610

    申请日:2004-09-07

    Inventor: Kiyoshi Hasegawa

    CPC classification number: G01N23/223 G01N33/44 G01N2223/076

    Abstract: An object is to reduce the influence of chlorine in plastics when the metal concentrations in the plastics are analyzed. In an X-ray analyzer including an X-ray generating part for irradiating primary X-rays onto a sample and an X-ray detector for detecting an X-ray from the sample, primary X-rays is irradiated onto a plastic sample from the X-ray generating part, the X-ray intensity of chlorine is obtained from the plastic sample by the X-ray detector, and the scattered X-ray intensity where the primary X-ray has been scattered by the plastic sample is obtained by the X-ray detector. A chlorine X-ray intensity ratio calculating means for dividing the X-ray intensity of chlorine by the scattered X-ray intensity to calculate a chlorine X-ray intensity ratio is provided. The calculated chlorine X-ray intensity ratio and the chlorine concentration in the plastic sample have positive correlation each other. A relative chlorine concentration calculating means adapted to calculate the relative chlorine concentration in the plastic sample from the chlorine X-ray intensity ratio is provided.

    Abstract translation: 当分析塑料中的金属浓度时,目的是减少塑料中氯的影响。 在包括用于将原始X射线照射到样品上的X射线产生部件和用于检测来自样品的X射线的X射线检测器的X射线分析仪中,将主X射线从 X射线产生部,通过X射线检测器从塑料样品获得氯的X射线强度,并且通过塑料样品获得主X射线已被散射的散射X射线强度 X射线探测器。 提供一种用于将X射线强度除以散射X射线强度以计算氯X射线强度比的氯X射线强度比计算装置。 计算的氯X射线强度比和塑料样品中的氯浓度呈正相关。 提供了一种适用于从氯X射线强度比计算塑料样品中的相对氯浓度的相对氯浓度计算装置。

    Radiation detector
    67.
    发明授权
    Radiation detector 有权
    辐射检测器

    公开(公告)号:US06974952B2

    公开(公告)日:2005-12-13

    申请号:US10417907

    申请日:2003-04-17

    CPC classification number: G01J1/42 G01J1/06

    Abstract: A radiation detector comprises an energy/electricity converter having a detection area for detecting incident radiation, and electrodes connecting the converter to an external driving circuit for driving the converter to convert energy of the incident radiation detected by the detection area of the converter into an electric signal. A collimator is integrally connected to the converter and has an opening for transmitting radiation to irradiate the detection area of the converter and portions for preventing radiation from irradiating a part of the converter other than the detection area. A spacer is integrally connected to the collimator and the converter for maintaining a preselected distance between the collimator and the detection area of the converter.

    Abstract translation: 辐射检测器包括具有用于检测入射辐射的检测区域的能量/电力转换器,以及将转换器连接到外部驱动电路的电极,用于驱动转换器以将由转换器的检测区域检测到的入射辐射的能量转换为电 信号。 准直器与变换器一体地连接,并且具有用于发射辐射的照明器,用于照射转换器的检测区域的部分和用于防止辐射照射除了检测区域之外的转换器的一部分的部分。 间隔件与准直器和转换器整体连接,用于保持准直器与转换器检测区域之间的预选距离。

    Light probe microscope including picture signal processing means
    68.
    发明授权
    Light probe microscope including picture signal processing means 有权
    光探头显微镜包括图像信号处理装置

    公开(公告)号:US06867407B2

    公开(公告)日:2005-03-15

    申请号:US10027061

    申请日:2001-12-26

    CPC classification number: G01Q60/22 G01Q10/06 G01Q30/06

    Abstract: A light probe microscope has a probe having a tip, a mechanism for positioning the probe tip closely to a sample surface and causing two-dimensional scanning movement between the probe tip and the sample, a light source for emitting light to an area proximate the probe tip and the sample, a two-dimensional image sensor for receiving the light radiated from the sample and producing a two-dimensional image of the sample in accordance therewith, and a device for producing a light image based on a signal intensity of light in a detection region of the two-dimensional image.

    Abstract translation: 光探针显微镜具有具有尖端的探针,用于将探针尖端紧密地定位在样品表面上并使探针尖端和样品之间进行二维扫描运动的机构,用于将光发射到接近探针的区域的光源 尖端和样品,用于接收从样品辐射的光并根据其产生样品的二维图像的二维图像传感器,以及用于根据其中的光的信号强度产生光图像的装置 检测区域的二维图像。

    X-ray fluorescence analyzer and X-ray fluorescence analysis method
    69.
    发明授权
    X-ray fluorescence analyzer and X-ray fluorescence analysis method 有权
    X射线荧光分析仪和X射线荧光分析方法

    公开(公告)号:US08611493B2

    公开(公告)日:2013-12-17

    申请号:US13174058

    申请日:2011-06-30

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: The X-ray fluorescence analyzer (100) includes: an enclosure (10); a door (20) for putting the sample into and out of the enclosure; a height measurement mechanism (7) capable of measuring a height at the irradiation point; a moving mechanism control unit (9) for adjusting a distance between the sample and the radiation source as well as the X-ray detector based on the measured height at the irradiation point; a laser unit (7) for irradiating the irradiation point with a visible light laser beam; a laser start control unit (9) for irradiating the visible light laser beam by the laser unit (7) when the door is open state; and a height measurement mechanism start control unit (9) for starting the height measurement mechanism to measure the height at the irradiation point when the door is opened.

    Abstract translation: X射线荧光分析仪(100)包括:外壳(10); 用于将样品放入和离开外壳的门(20); 能够测量照射点的高度的高度测量机构(7) 移动机构控制单元,用于根据所述照射点处的测量高度来调整所述样本和所述辐射源之间的距离以及所述X射线检测器; 用于用可见光激光束照射所述照射点的激光单元(7); 激光启动控制单元(9),用于当所述门处于打开状态时,通过所述激光单元(7)照射所述可见光激光束; 以及高度测量机构启动控制单元(9),用于启动高度测量机构以测量门打开时的照射点处的高度。

    Focused ion beam system and sample processing method using the same
    70.
    发明授权
    Focused ion beam system and sample processing method using the same 有权
    聚焦离子束系统和样品处理方法使用相同

    公开(公告)号:US08581206B2

    公开(公告)日:2013-11-12

    申请号:US12707024

    申请日:2010-02-17

    CPC classification number: H01J37/20 G01N1/32 H01J37/3056 H01J2237/208

    Abstract: A focused ion beam system includes a sample holder having a fixing plane for fixing a sample, a sample base on which the sample holder is provided, a focused ion beam irradiating mechanism that irradiates a focused ion beam to the sample, microtweezers that hold the sample and have the axial direction at a predetermined angle to a surface of the sample base, an opening/closing mechanism that opens and closes the microtweezers, a rotating mechanism that rotates the microtweezers about the axial direction, and a moving mechanism that moves the position of the microtweezers.

    Abstract translation: 聚焦离子束系统包括具有用于固定样品的固定平面的样品保持器,其上设置有样品保持器的样品基底,将聚焦离子束照射到样品的聚焦离子束照射机构,保持样品的微量滴定器 并且具有与样品台的表面成预定角度的轴向方向,打开和关闭微型加热器的开闭机构,使微型加热器绕轴向旋转的旋转机构,以及移动机构, 微动员。

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