摘要:
Some embodiments of the present invention provide a system that schedules read operations for disk drives in a set of disk drives. During operation, the system monitors a write rate for write operations to a given disk drive in the set of disk drives, wherein vibrations generated by the read operations directed to disk drives in the set of disk drives are transmitted to the given disk drive. Then, the read operations for disk drives in the set of disk drives are scheduled based on the write rate for the given disk drive, thereby limiting interference between the write operations and the vibrations generated by the read operations.
摘要:
A multi-chip module (MCM) is described. This MCM includes multiple sites, where a given site in the multiple sites includes multiple chips with proximity connectors that communicate information through proximity communication within the MCM via multiple components associated with the given site. Note that the MCM includes global redundancy and local redundancy at the given site. In particular, the global redundancy involves providing one or more redundant sites in the multiple sites. Furthermore, the local redundancy involves providing one or more redundant chips in the multiple chips and one or more redundant components in the multiple components.
摘要:
Some embodiments of the present invention provide a system that detects the presence of constrained motion in one or more components in a computer system. First, a vibrational spectrum of the computer system is monitored while the computer system operates. Then, the vibrational spectrum is analyzed using a pattern-recognition model to detect constrained motion in one or more components in the computer system, wherein the pattern-recognition model classifies the vibrational spectrum as indicating constrained motion or as not indicating constrained motion.
摘要:
A method for testing a substrate by using a photoemission microscope is provided which includes providing the substrate and applying a reverse bias voltage to the substrate. The method further includes detecting light emissions from a top surface of the substrate and characterizing viability of the substrate from the detection of the light emissions.
摘要:
Apparatus, systems, and methods are provided for testing the integrity of electrical interconnections in electronic systems. Apparatus may be constructed by modifying a substrate designed for deployment in an end-use product by shorting together multiple contacts on one side of it. Such vehicles may be used to test the characteristics of interconnections between the vehicle and its support, the shorted contacts enabling testing of individual interconnects under both DC and AC conditions. A system for testing the interconnects may include the modified substrate, an input signal generator, and an output signal monitor.
摘要:
A method for increasing the resistance of a light emitting diode and other semiconductor devices to extremes of temperature is disclosed. During the manufacture of the light emitting diode, a liquid coating is applied to the light emitting die after the die has been placed in its lead frame. After the liquid coating has been placed on the die and its lead frames, a thermosetting encapsulant material is placed over the coating. The operation that cures the thermosetting material leaves the coating liquid intact. As the die and the encapsulant expand and contract at different rates with respect to changes in temperature, and as in known light emitting diodes the encapsulating material adheres to the die and lead frames, this liquid coating reduces the stresses that these different rates of expansion and contraction normally cause by eliminating the adherence of the encapsulating material to the die and frame.
摘要:
Some embodiments of the present invention provide a system that schedules read operations for disk drives in a set of disk drives. During operation, the system monitors a write rate for write operations to a given disk drive in the set of disk drives, wherein vibrations generated by the read operations directed to disk drives in the set of disk drives are transmitted to the given disk drive. Then, the read operations for disk drives in the set of disk drives are scheduled based on the write rate for the given disk drive, thereby limiting interference between the write operations and the vibrations generated by the read operations.
摘要:
A method and system for identifying voids in solder balls in a ball-grid array (BGA) using an image of the BGA include localizing an image of a solder ball on the BGA image, the solder ball image having a radius and having multiple points each having an image intensity, and producing a void-free model image of the solder ball based on the radius of the solder ball image, the void-free model image having multiple points each having an image intensity. The method and system also include computing a difference between the image intensities of the points of the solder ball image and the image intensities of the points of the void-free model image to produce a residual image, and identifying a void using the residual image.
摘要:
A test system including a package with switchable paths. The package may have conductive paths that are selected by switches. The electrically switchable conductive paths may yield increased data without significantly increasing the required testing hardware.
摘要:
A method for generating a service action for a computer system is described. During the method, a longevity index value for a packaging technology (such as solder joints in a BGA) in the computer system is calculated using thermal and vibration telemetry data (which is collected in the computer system) and a longevity model. This longevity model may be based on accelerated failure testing of the packaging technology, field failures of the packaging technology in a group of computer systems (which includes the computer system) and/or thermal and vibration telemetry data for the group of computer systems. Furthermore, using the longevity index value, the service action for the computer system is determined. Based on the longevity index value, remedial action (such as repairs to the computer system) may be scheduled and performed.