Cyclohexanecarboxylic acid compound
    71.
    发明申请
    Cyclohexanecarboxylic acid compound 失效
    环己烷羧酸化合物

    公开(公告)号:US20070105936A1

    公开(公告)日:2007-05-10

    申请号:US10562122

    申请日:2004-07-23

    IPC分类号: A61K31/405 C07D403/02

    CPC分类号: C07D403/12

    摘要: The present invention provides a VLA-4 inhibitor having high water-solubility and excellent long-term stability; i.e., sodium trans-4-[1-[2,5-dichloro-4-[(1-methyl-1H-3-indolylcarbonyl)amino]phenylacetyl]-(4S)-methoxy-(2S)-pyrrolidinylmethoxy]cyclohexanecarboxylate pentahydrate.

    摘要翻译: 本发明提供了具有高水溶性和优异的长期稳定性的VLA-4抑制剂; 即反式-4- [1- [2,5-二氯-4 - [(1-甲基-1H-吲哚基羰基)氨基]苯基乙酰基] - (4S) - 甲氧基 - (2S) - 吡咯烷基甲氧基]环己烷羧酸酯五水合物 。

    Laser measurement apparatus
    72.
    发明授权
    Laser measurement apparatus 失效
    激光测量装置

    公开(公告)号:US07022971B2

    公开(公告)日:2006-04-04

    申请号:US10823319

    申请日:2004-04-13

    IPC分类号: G06M7/00

    摘要: In a laser measurement apparatus capable of measuring a moving object or a designated object to be measured by tracking an object to be tracked and detecting the position of the tracked object as needed, optical signal processing units 103 through 105 output laser beams having different wavelengths via a common optical path A toward a corner cube 100 attached to an object to be measured, and detect the laser beams being reflected on the corner cube 100. A control unit 102 controls motors 110, 111 so that the laser beams return to a predetermined position of an optical position sensitive detector 117 of an optical signal processing unit 103, by which the direction of a reflecting mirror 112 is controlled so that the laser beams track the object. The control unit 102 computes the distance, shape, position, speed etc. of the object to be measured based on signals detected via the optical signal processing units 104, 105 while having the laser beams output from optical signal processing units 104, 105 track the object to be tracked.

    摘要翻译: 在能够通过跟踪被跟踪物体来测量移动物体或指定物体的激光测量装置中,根据需要检测被跟踪物体的位置,光信号处理部103〜105输出具有不同波长的激光束 朝向附接到被测量物体的角立方体100的普通光路A,并且检测在角隅立方体100上被反射的激光束。 控制单元102控制电动机110,111,使得激光束返回到光信号处理单元103的光学位置敏感检测器117的预定位置,由此控制反射镜112的方向,使得激光束 跟踪对象。 控制单元102基于从光信号处理单元104,105输出的激光束,经由光信号处理单元104,105检测的信号,计算待测物体的距离,形状,位置,速度等。 对象被跟踪。

    Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device
    74.
    发明授权
    Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device 失效
    检验数据分析程序,缺陷检查装置,半导体装置的缺陷检查系统和方法

    公开(公告)号:US06826735B2

    公开(公告)日:2004-11-30

    申请号:US10196146

    申请日:2002-07-17

    IPC分类号: G06F1750

    摘要: Inspection data output from an inspection apparatus is read, the inspection data containing at least one information piece of coordinate value information and size information of a particle or a pattern defect of an inspected object, and drawing data of a product of the inspected object is read. Information is extracted which is representative of a relation between at least one information piece of coordinated value information and size information of the particle or pattern defect of the inspected object in the read inspection data and the read drawing data input at said drawing data input step. The extracted information is compared with determination criterion information registered beforehand and it is determined whether each particle or pattern defect of the inspected object in the inspection data is a detection error or not.

    摘要翻译: 读取从检查装置输出的检查数据,读取包含检测对象的粒子或图案缺陷的坐标值信息和尺寸信息的至少一个信息的检查数据和被检查对象的乘积的绘制数据 。 提取信息,其代表在读取检查数据中的至少一个协调价值信息信息和被检查对象的粒子或图案缺陷的尺寸信息与在所述绘制数据输入步骤输入的读取绘制数据之间的关系。 将提取的信息与预先登记的确定标准信息进行比较,并且确定检查数据中被检查对象的每个粒子或图案缺陷是否是检测错误。

    Inspection system and semiconductor device manufacturing method
    75.
    发明授权
    Inspection system and semiconductor device manufacturing method 失效
    检测系统和半导体器件制造方法

    公开(公告)号:US06775817B2

    公开(公告)日:2004-08-10

    申请号:US10004168

    申请日:2001-10-30

    IPC分类号: G06F1750

    摘要: A method and system are provided for analyzing defects having the potential to become electrical failures, during the inspection of particles and/or pattern defects of a wafer used in the manufacture of electronic devices such as semiconductor integrated circuits. Defect map data is processed along with failure probability data. Next, defect-dependent failure probability calculations are made to obtain the failure probability of each defect in the defect map data. That data is then used to prepare failure-probability-added defect map data. Further, a selection process of defects to be reviewed is used to reorder and filter defects from the failure-probability-added defect map data, thus selecting one or more defects for review.

    摘要翻译: 提供了一种方法和系统,用于在用于制造诸如半导体集成电路的电子器件的晶片的颗粒和/或图案缺陷的检查期间分析具有变为电气故障的可能性的缺陷。 缺陷图数据与故障概率数据一起处理。 接下来,进行与缺陷相关的故障概率计算,以获得缺陷图数据中的每个缺陷的故障概率。 然后将该数据用于准备故障概率添加缺陷图数据。 此外,使用要检查的缺陷的选择处理用于从故障概率添加缺陷图数据重新排序和过滤缺陷,从而选择一个或多个缺陷以供审查。

    Monitor system, display device and image display method
    76.
    发明授权
    Monitor system, display device and image display method 有权
    监控系统,显示设备和图像显示方式

    公开(公告)号:US06747655B2

    公开(公告)日:2004-06-08

    申请号:US09799474

    申请日:2001-03-05

    IPC分类号: G06F1516

    摘要: To increase support a screen having a different aspect ratio or a large screen by use of existing graphics adapters, thus improving performance and flexibility of the whole system. Disclosed is a monitor system comprising a liquid crystal display having a liquid crystal panel which displays an image and has a display area virtually divided into a plurality of divided area, and a plurality of graphics adapters to for developing image data for the divided areas of the liquid crystal display, wherein the divided areas of a screen in the liquid crystal display are obtained by further dividing an area in which the graphics adapters to create images, and a reconstruction circuit for reading out image data developed in the graphics adapters in turn to reconstruct the image data is provided.

    摘要翻译: 通过使用现有的图形适配器来增加对具有不同宽高比的屏幕或大屏幕的支持,从而提高整个系统的性能和灵活性。公开的是一种监视器系统,包括具有显示图像的液晶面板的液晶显示器 并且具有虚拟地划分为多个分割区域的显示区域和用于显现液晶显示器的划分区域的图像数据的多个图形适配器,其中液晶显示器中的屏幕的分割区域通过 进一步划分图形适配器以创建图像的区域,并且提供用于读取在图形适配器中开发的图像数据以重构图像数据的重建电路。

    Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices
    77.
    发明授权
    Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices 失效
    检测系统,检验仪器,检验程序和半导体器件的生产方法

    公开(公告)号:US06687633B2

    公开(公告)日:2004-02-03

    申请号:US10079518

    申请日:2002-02-22

    IPC分类号: G01N3700

    CPC分类号: H01L21/67288

    摘要: In the wafer production process of a semiconductor integrated circuit, an inspection system and an inspection apparatus that convert and output a yield loss at high accuracy from the result of a defect inspection, such as a dark-field inspection and a bright-field inspection without waiting for the result of the final probing test. Defect map data read processing and kill ratio computation data read processing are performed. Subsequently, kill ratio computation processing every defect computes a kill ratio every defect using defect map data and kill ratio computation data. Subsequently, kill ratio computation processing every chip computes a kill ratio every LSI chip using the kill ratio every defect. Subsequently, yield loss computation processing computes a yield loss of the defect map data using the kill ratio every chip and yield loss output processing outputs the computation result.

    摘要翻译: 在半导体集成电路的晶片生产过程中,检查系统和检查装置从缺陷检查的结果(例如暗场检查和明场检查)转换并输出高精度的屈服损失而没有 等待最终探测测试的结果。 执行缺陷地图数据读取处理和杀死比计算数据读取处理。 随后,每个缺陷的杀伤比计算处理使用缺陷图数据和杀死比计算数据计算每个缺陷的杀伤比。 随后,每个芯片的杀死率计算处理使用每个缺陷的杀死率来计算每个LSI芯片的杀死率。 随后,屈服损失计算处理使用每个芯片的杀死率来计算缺陷图数据的屈服损失,并且屈服损失输出处理输出计算结果。

    Power supply unit
    78.
    发明授权
    Power supply unit 失效
    供电单元

    公开(公告)号:US6075433A

    公开(公告)日:2000-06-13

    申请号:US952118

    申请日:1999-03-12

    IPC分类号: H01F38/14 H02J5/00 H01F27/24

    摘要: The present invention relates to a non-contact type power supply unit intended for use in electronic equipment, aiming at the realization of a small size and low cost and successful achievement in an enhanced capability of electric power transmission. In order to achieve the foregoing objectives, the non-contact type power supply unit comprises a primary coil(11) that is fed with pulsated currents, a secondary coil(13) mounted opposite to the primary coil(11) in an enclosure that is different from an enclosure wherein the primary coil(11) is mounted, whereby electric power is transferred from the primary coil(11) to the secondary coil(13) and wherein a ferrite core(12) is disposed so as to extend from the primary coil(11) towards the secondary coil(13), thus achieving efficient electric power transmission from the primary coil(11) to secondary coil(13).

    摘要翻译: PCT No.PCT / JP96 / 01353 Sec。 371 1999年3月12日 102(e)1999年3月12日PCT PCT 1996年5月22日PCT公布。 公开号WO96 / 38898 日期1996年12月5日本发明涉及一种旨在用于电子设备的非接触型电源装置,其目的在于实现小型化,低成本,并且在增强的电力传输能力方面成功实现。 为了实现上述目的,非接触型电源单元包括馈送有脉动电流的初级线圈(11),在外壳中与初级线圈(11)相对安装的次级线圈(13) 不同于其中安装有初级线圈(11)的外壳,由此电力从初级线圈(11)传递到次级线圈(13),并且其中铁氧体磁芯(12)被布置成从主电极 线圈(11)朝向次级线圈(13),从而实现从初级线圈(11)到次级线圈(13)的有效的电力传输。

    Optical image forming material
    80.
    发明授权
    Optical image forming material 失效
    光学成像材料

    公开(公告)号:US5595853A

    公开(公告)日:1997-01-21

    申请号:US528010

    申请日:1995-09-14

    IPC分类号: G03C1/00 G03C1/675 G03C1/73

    CPC分类号: G03C1/002 G03C1/732

    摘要: An optical image forming material in which the background portions thereof are not color developed (not fogged) during storage in the dark after fixing, comprising a support having thereon at least a coating layer containing (1) microcapsules containing a leuco dye which is form color when it is oxidized and a photooxidizing agent, and (2) a reducing agent and a fixing accelerator present outside of the microcapsules. The reducing agent is a hydroquinone derivative substituted by an alkyl group at each of 2- and 5-positions thereof, and the fixing accelerator is 2,2-bis(4-hydroxy-phenyl)propane.

    摘要翻译: 一种光学成像材料,其固色后在黑暗中保存期间其背景部分未着色(不起雾),其中包括至少一层涂层的载体,该涂层含有(1)含有形成颜色的无色染料的微胶囊 氧化后的光氧化剂,(2)存在于微胶囊外的还原剂和固定促进剂。 还原剂是在2-和5-位各自被烷基取代的氢醌衍生物,定影促进剂是2,2-双(4-羟基 - 苯基)丙烷。