Electro-Optical Device and Electronic Apparatus
    71.
    发明申请
    Electro-Optical Device and Electronic Apparatus 有权
    电光器件和电子设备

    公开(公告)号:US20090057669A1

    公开(公告)日:2009-03-05

    申请号:US12142527

    申请日:2008-06-19

    申请人: Tatsuya Ishii

    发明人: Tatsuya Ishii

    IPC分类号: H01L27/02

    摘要: An electro-optical device includes a switching element with a gate electrode provided opposite to the channel region. The gate electrode has a ring-shaped structure that surrounds a junction region between the channel region and a source/drain region.

    摘要翻译: 电光装置包括具有与沟道区相对设置的栅电极的开关元件。 栅极电极具有围绕沟道区域和源极/漏极区域之间的结区域的环形结构。

    Substrate for electro-optical device, testing method thereof, electro-optical device and electronic apparatus
    72.
    发明授权
    Substrate for electro-optical device, testing method thereof, electro-optical device and electronic apparatus 失效
    电光装置用基板,其测试方法,电光装置及电子设备

    公开(公告)号:US07312624B2

    公开(公告)日:2007-12-25

    申请号:US11295432

    申请日:2005-12-07

    申请人: Tatsuya Ishii

    发明人: Tatsuya Ishii

    IPC分类号: G00R31/00 G09G3/36

    CPC分类号: G09G3/3648 G09G3/006

    摘要: A substrate for an electro-optical device includes amplifiers each has a first node and a second node, the first node connected to a signal line and being input with a first potential signal, the second node being input with a second potential signal, each amplifier outputting signals such that the potential of the first node is further decreased when the first potential signal is low, and the potential of the first node is further increased when the first potential signal is high. At least two signal lines correspond to at least one of the first and second nodes. A selection unit that selects one signal line. A connection unit connect the selected signal line to at least one of the first and second nodes.

    摘要翻译: 一种用于电光装置的衬底包括放大器,每个放大器具有第一节点和第二节点,第一节点连接到信号线并且被输入第一电位信号,第二节点用第二电位信号输入,每个放大器 输出信号,使得当第一电位信号为低时第一节点的电位进一步减小,并且当第一电位信号为高时,第一节点的电位进一步增加。 至少两条信号线对应于第一和第二节点中的至少一个。 选择一个信号线的选择单元。 连接单元将所选择的信号线连接到第一和第二节点中的至少一个。

    Nonvolatile memory system, semiconductor memory, and writing method
    73.
    发明授权
    Nonvolatile memory system, semiconductor memory, and writing method 有权
    非易失性存储器系统,半导体存储器和写入方法

    公开(公告)号:US07283399B2

    公开(公告)日:2007-10-16

    申请号:US11498230

    申请日:2006-08-03

    IPC分类号: G11C16/04

    摘要: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.

    摘要翻译: 非易失性半导体存储器由于与字线相关的干扰而恢复存储器单元的阈值的变化。 非易失性存储器在每次写入操作之后连续执行许多写入操作,而不执行单扇区擦除,执行比通常的写入操作更快的附加写入操作,以及减轻用于附加写入的软件的负担。 存储在指定扇区中的数据在保存在寄存器中之前被读出,并且当给出预定命令时,所选扇区被进行单扇区擦除。 然后写入预期值数据由保存的数据和要另外编写的数据形成,完成写入操作。

    Nonvolatile memory
    75.
    发明申请

    公开(公告)号:US20060114726A1

    公开(公告)日:2006-06-01

    申请号:US11330233

    申请日:2006-01-12

    IPC分类号: G11C16/04 G11C7/10

    摘要: For a nonvolatile memory permitting electrical writing and erasing of information to be stored, such as a flash memory, the load on the system developer is to be reduced, and it is to be made possible to avoid, even if such important data for the system as management and address translation information are damaged, an abnormal state in which the system becomes unable to operate. The nonvolatile memory is provided with a replacing function to replace a group of memory cells including defective memory cells which are incapable of normal writing or erasion with a group of memory cells including no defective memory cell, a numbers of rewrites averaging function to grasp the number of data rewrites in each group of memory cells and to so perform replacement of memory cell groups that there may arise no substantial difference in the number of rewrites among a plurality of memory cell groups, and an error correcting function to detect and correct any error in data stored in the memory array, wherein first address translation information deriving from the replacing function and second address translation information deriving from the numbers of rewrites averaging function are stored in respectively prescribed areas in the memory array, and the first address translation information and second address translation information concerning the same memory cell group are stored in a plurality of sets in a time series.

    Variable-gain digital filter
    76.
    发明授权
    Variable-gain digital filter 失效
    可变增益数字滤波器

    公开(公告)号:US06985522B2

    公开(公告)日:2006-01-10

    申请号:US09741194

    申请日:2000-12-21

    申请人: Tatsuya Ishii

    发明人: Tatsuya Ishii

    IPC分类号: H04H7/30 H03K5/159

    CPC分类号: H03H17/06

    摘要: A variable-gain digital filter includes a selector and multiplier arranged inside the digital filter for regulating gain whereby the number of bits of filter input is X, the number of flip-flops inside the filter is X×n bits, and a (Y×n bit) reduction in the number of flip-flops is enabled. The gain regulation circuit incorporated within the digital filter enables a reduction in circuit scale.

    摘要翻译: 可变增益数字滤波器包括布置在数字滤波器内的选择器和乘法器,用于调节增益,由此滤波器输入的位数为X,滤波器内的触发器数为Xxn位,并且(Yxn位)减小 在触发器的数量被启用。 数字滤波器内部的增益调节电路使电路规模缩小。

    NONVOLATILE MEMORY
    78.
    发明申请
    NONVOLATILE MEMORY 有权
    非易失性存储器

    公开(公告)号:US20050007860A1

    公开(公告)日:2005-01-13

    申请号:US10914363

    申请日:2004-08-10

    摘要: For a nonvolatile memory permitting electrical writing and erasing of information to be stored, such as a flash memory, the load on the system developer is to be reduced, and it is to be made possible to avoid, even if such important data for the system as management and address translation information are damaged, an abnormal state in which the system becomes unable to operate. The nonvolatile memory is provided with a replacing function to replace a group of memory cells including defective memory cells which are incapable of normal writing or erasion with a group of memory cells including no defective memory cell, a numbers of rewrites averaging function to grasp the number of data rewrites in each group of memory cells and to so perform replacement of memory cell groups that there may arise no substantial difference in the number of rewrites among a plurality of memory cell groups, and an error correcting function to detect and correct any error in data stored in the memory array, wherein first address translation information deriving from the replacing function and second address translation information deriving from the numbers of rewrites averaging function are stored in respectively prescribed areas in the memory array, and the first address translation information and second address translation information concerning the same memory cell group are stored in a plurality of sets in a time series.

    摘要翻译: 对于允许电子写入和擦除要存储的信息(例如闪存)的非易失性存储器,系统开发者的负载将被减少,并且即使这样的系统的重要数据也可以避免 由于管理和地址转换信息被破坏,系统无法运行的异常状态。 非易失性存储器设置有替换功能,以替换包括不能正常写入或擦除的缺陷存储器单元的存储器单元组,所述存储器单元不包括不存在缺陷存储器单元的存储单元组,重写次数用于掌握数量 的每个存储器单元组中的数据重写,并且因此执行存储单元组的替换,使得多个存储单元组之间的重写次数可能没有显着差异,以及用于检测和校正任何错误的错误校正功能 存储在存储器阵列中的数据,其中从替换功能导出的第一地址转换信息和从重写平均函数导出的第二地址转换信息被存储在存储器阵列中的分别规定的区域中,并且第一地址转换信息和第二地址 关于相同存储单元组的翻译信息是sto 以时间序列的多个集合中的红色。

    Electron beam test system and electron beam test method
    79.
    发明授权
    Electron beam test system and electron beam test method 失效
    电子束测试系统和电子束测试方法

    公开(公告)号:US06839646B2

    公开(公告)日:2005-01-04

    申请号:US10280018

    申请日:2002-10-25

    申请人: Tatsuya Ishii

    发明人: Tatsuya Ishii

    CPC分类号: G01R31/307

    摘要: An electron beam test system which can determine whether a potential is high or low for a DC signal or a signal having no potential change before the time of observation. The electron beam test system obtains potential contrast data for analysis by irradiating electron beam to a semiconductor integrated circuit device which is an analysis object. This system has a tester which supplies a test pattern signal for analysis to the semiconductor integrated circuit device and holds the supplied test pattern signal at a given time; an electron gun which irradiates electron beam to the semiconductor integrated circuit device in response to the hold; and a detector which detects the potential contrast data of the semiconductor integrated circuit device which is irradiated with electron beam.

    摘要翻译: 一种电子束测试系统,其可以确定DC信号的电位是高电平还是低电平,或者在观察时间之前没有电位变化的信号。 电子束测试系统通过将电子束照射到作为分析对象的半导体集成电路器件而获得用于分析的潜在对比度数据。 该系统具有向半导体集成电路装置提供测试图案信号以供分析的测试器,并在给定时间保持所提供的测试图案信号; 电子枪,其响应于所述保持向半导体集成电路装置照射电子束; 以及检测器,其检测被电子束照射的半导体集成电路器件的潜在对比度数据。