公开(公告)号：US06229473B1

公开(公告)日：2001-05-08

申请号：US09441814

申请日：1999-11-17

Applicant: Guenter Doemens ,  Wolfgang Wichner

Inventor： Guenter Doemens ,  Wolfgang Wichner

IPC: G01S1388

CPC classification number: B66C13/063 ,  G01S13/878

Abstract: The stopping of a load suspended from a crane requires a swing control or, respectively, a swing damping. Upon employment of microwave measuring units, spacings between a carrying cable suspension and a load suspension point are determined on the basis of transit time measurements. The position of the load suspension point can be determined from the transit time measurements quickly and with high precision. Swinging motions are avoided by controlled opposing control of the carrying cable suspension.

Abstract translation: 停止从起重机悬挂的负载需要摆动控制或分别摆动阻尼。 在使用微波测量单元时，承载电缆悬架和负载悬挂点之间的间距是基于通过时间测量来确定的。 负载悬挂点的位置可以从运输时间测量中快速，高精度地确定。 摆动运动可以通过控制相对控制承载电缆悬架来避免。

公开(公告)号：US4904067A

公开(公告)日：1990-02-27

申请号：US168986

申请日：1988-03-16

Applicant: Guenter Doemens

Inventor： Guenter Doemens

IPC: G01R31/02 ,  G01R31/309 ,  H03K17/78 ,  H03K17/94

CPC classification number: G01R31/309 ,  G01R31/024 ,  H03K17/78 ,  H03K17/941 ,  Y10T307/773

Abstract: A selection device for reliable selection of a plurality of lines or of a plurality of contact locations. In order to select at least two of a plurality of lines, at least two selection lines are connected to every line via a photoresistor, whereby every photoresistor is preferably controllably chargeable with light via a deflectable beam. The selection occurs when selected photoresistors are changed to a low resistance state by light impingement. For selecting at least two of a plurality of contact locations arranged in a grid pattern, the contact locations are connected to the lines via photoresistors. The device of the present invention is preferably utilized for the electrical function testing of printed circuit boards.

Abstract translation: 一种用于可靠地选择多条线或多个接触位置的选择装置。 为了选择多条线中的至少两条线，至少两条选择线经由光电晶体管连接到每条线上，由此每个光电晶体优选地通过可偏转光束可控地对光进行充电。 当选择的光敏电阻通过光照而变为低电阻状态时，进行选择。 为了选择以网格图案布置的多个接触位置中的至少两个，接触位置通过光敏电阻连接到线路。 本发明的装置优选用于印刷电路板的电功能测试。

公开(公告)号：US4305097A

公开(公告)日：1981-12-08

申请号：US161076

申请日：1980-06-19

Applicant: Guenter Doemens ,  Ulrich Hendricks ,  Richard Schneider ,  Karl Wild

Inventor： Guenter Doemens ,  Ulrich Hendricks ,  Richard Schneider ,  Karl Wild

IPC: G01N21/88 ,  G01B11/24 ,  G01N21/956 ,  G01R31/28 ,  G01R31/309 ,  G03F1/08 ,  G06T1/00 ,  G06T7/00 ,  H01L21/027 ,  H01L21/66 ,  H04N7/18

CPC classification number: G01R31/309 ,  G01R31/2806 ,  G06T7/001 ,  G06T2207/30141

Abstract: An automated opto-electronic test system for quality control of two-dimensional elements with high geometric figure density, such as printed circuits, intermediate printed circuit products, and printing tools has a semiconductor image sensor disposed above a compound table having a position sensor which moves the test specimen beneath a lens in a meandering path at a velocity which is known relative to the semiconductor image sensor. The signals from the image sensor are first analyzed in an analog signal pre-precessor to which are connected a number of error recognition circuits operating in parallel each of which produces an error report which is transmitted to an error coordinating circuit. The error reports are therein associated with position coordinates on the test specimen which are supplied by the position sensor of the compound table and stored until a complete scan of the test specimen has been undertaken and are subsequently employed to move the test specimen to the positions at which the errors occur for visual examination such as by magnification. If the test specimen is a printed circuit, tests which are undertaken are a minimum geometry test measuring respective track and insulation widths, a solder eye test and a special geometry test for open and short circuits.

Abstract translation: 用于质量控制具有高几何图形密度的二维元件（例如印刷电路，中间印刷电路产品和印刷工具）的自动光电测试系统具有设置在复合台上方的半导体图像传感器，该复合台具有移动的位置传感器 以相对于半导体图像传感器已知的速度在曲折路径中的透镜下面的测试样本。 来自图像传感器的信号首先在模拟信号预处理器中进行分析，模拟信号预处理器连接有并行操作的多个错误识别电路，每个错误识别电路产生错误报告，该误差报告被发送到误差协调电路。 其中的错误报告与测试样本上的位置坐标相关联，由坐标传感器提供的化合物台的位置传感器进行存储，直到已经进行了试样的完全扫描，并随后用于将试样移动到 错误发生在视觉检查中，例如通过放大。 如果测试样本是印刷电路，则进行的测试是测量相应磁道和绝缘宽度的最小几何测试，焊接眼测试和开路和短路的特殊几何测试。

公开(公告)号：US06865960B2

公开(公告)日：2005-03-15

申请号：US10355615

申请日：2003-01-31

Applicant: Guenter Doemens ,  Dieter Spriegel ,  Hans Wuensche

Inventor： Guenter Doemens ,  Dieter Spriegel ,  Hans Wuensche

IPC: B60N2/00 ,  B60R21/01 ,  B60R21/015 ,  G01G7/06 ,  G01G19/414 ,  G01L1/14 ,  G01L1/12

CPC classification number: B60R21/01516 ,  B60N2/002 ,  B60R21/0152 ,  G01G7/06 ,  G01G19/4142 ,  G01L1/142

Abstract: The invention relates to a capacitive microsystem, which can be used to replace conventional strain gauges used currently. The microsystem has substantial advantages with regard to handling, overload stability and endurance. Capacitive microsystems of this type can be used to record deformations and to calculate forces, torque etc. They can be used in particular to determine the weight of vehicle seats, to provide for example deployment data for an airbag.

Abstract translation: 本发明涉及一种电容微系统，其可用于替代当前使用的常规应变计。 微处理系统在处理，过载稳定性和耐久性方面具有重要的优势。 这种类型的电容微系统可以用于记录变形并计算力，扭矩等。它们可以特别用于确定车辆座椅的重量，以提供例如安全气囊的部署数据。

公开(公告)号：US06614536B1

公开(公告)日：2003-09-02

申请号：US09562373

申请日：2000-05-01

Applicant: Guenter Doemens ,  Michael Stockmann

Inventor： Guenter Doemens ,  Michael Stockmann

IPC: G01C308

CPC classification number: G08G1/04 ,  G01S7/4802 ,  G01S17/58 ,  G01S17/89 ,  G08G1/015

Abstract: Surface shape determination and an exact speed measurement of a moving object is undertaken with an arrangement including semiconductor elements and having two spaced semiconductor sensor lines. Illumination of the moving object occurs via at least one laser diode that is arranged in the proximity of the semiconductor sensor lines. The semiconductor sensor lines are used to perform a registration of cross-sectional profiles by integrating a number of range vectors calculated from sensed reflected light pulses at times when the moving object is not present and present. Successively registered cross-sectional profiles of a vehicle are converted into cross-sectional areas and into longitudinal profiles. The speed can be identified on the basis of the time-offset between identical registration in the first and second semiconductor sensor lines. A categorization of different types of moving object is accomplished by comparing the calculated cross-sectional areas and longitudinal profiles with known object characteristics.

Abstract translation: 通过包括半导体元件并且具有两个间隔开的半导体传感器线的布置来进行移动物体的表面形状确定和精确的速度测量。 通过布置在半导体传感器线附近的至少一个激光二极管发生移动物体的照明。 半导体传感器线用于通过在移动物体不存在和存在时积分从感测到的反射光脉冲计算的多个范围向量来执行横截面轮廓的对准。 车辆的连续注册的横截面轮廓被转换成横截面区域并且被转换成纵向轮廓。 可以基于第一和第二半导体传感器线路中的相同配准之间的时间偏移来识别速度。 通过将计算的横截面积和纵向轮廓与已知的对象特征进行比较来实现不同类型的移动物体的分类。

公开(公告)号：US4967148A

公开(公告)日：1990-10-30

申请号：US398430

申请日：1989-08-28

Applicant: Guenter Doemens ,  Thomas Rose

Inventor： Guenter Doemens ,  Thomas Rose

IPC: G01R31/02 ,  G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07371

Abstract: Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards. In the electrical function testing of wiring matrices, particularly of printed circuit boards, the number of required leads and switch elements can be drastically reduced. In the present apparatus, every measuring locations of the printed circuit board can be selected by an associated busbar and by an intermediate mask that prevents the contacting of non-selected measuring locations. The busbars preferably are orientated transversely relative to the principal direction of the wiring of the printed circuit board. The bus bar interconnecting a number of elements, each of the contact elements being a test probe.

公开(公告)号：US4863280A

公开(公告)日：1989-09-05

申请号：US193674

申请日：1988-05-12

Applicant: Guenter Doemens

Inventor： Guenter Doemens

IPC: G01K11/24 ,  G01K11/22 ,  H02H5/00 ,  H02H5/04 ,  H02K11/00

CPC classification number: G01K11/22

Abstract: Integral temperature measurement in electrical machines, transformers and energy conversion systems. An integral temperature measurement for electrical machines, transformers and energy conversion systems produces no additonal potential or voltage in the windings of such equipment. As a result, no conductive or semiconductive material can be used in a temperature sensor. The present invention utilizes the temperature dependency of the propagation conditions of sound or ultrasound in gases and also makes use of light waveguide technology. The sound or ultrasound is guided in a flexible capillary along a path along which an integral temperature measurement is to be taken.

Abstract translation: 电机，变压器和能量转换系统中的积分温度测量。 电机，变压器和能量转换系统的集成温度测量在这种设备的绕组中不产生额外的电位或电压。 结果，在温度传感器中不能使用导电或半导体材料。 本发明利用气体中声音或超声波的传播条件的温度依赖性，并且还利用光波导技术。 声音或超声波在柔性毛细管中沿着要进行整体温度测量的路径被引导。

公开(公告)号：US06772647B2

公开(公告)日：2004-08-10

申请号：US10148948

申请日：2002-09-09

Applicant: Guenter Doemens ,  Dieter Spriegel ,  Hans Wuensche

Inventor： Guenter Doemens ,  Dieter Spriegel ,  Hans Wuensche

IPC: G01L104

CPC classification number: G01L1/142 ,  G01L5/28

Abstract: The present invention is based on an use of the already existing actuator bottom as a deformation element for a direct measurement of braking force, and on its geometric configuration in order to measure a force in a way which is largely independent of temperature and free of hysteresis. Accordingly, a force sensor is integrated into an actuator for generally or transmitting a force in the force flux. The actuator bottom is transverse to the force flux.

Abstract translation: 本发明基于已经存在的致动器底部作为用于直接测量制动力的变形元件以及其几何构型的用途，以便以大体上独立于温度和无滞后的方式测量力 。 因此，力传感器被集成到致动器中，以大致地或者传递力通量中的力。 致动器底部横向于力通量。

公开(公告)号：US06249598B1

公开(公告)日：2001-06-19

申请号：US08968125

申请日：1997-11-12

Applicant: Toshifumi Honda ,  Yukio Matsuyama ,  Guenter Doemens ,  Peter Mengel ,  Ludwig Listl

Inventor： Toshifumi Honda ,  Yukio Matsuyama ,  Guenter Doemens ,  Peter Mengel ,  Ludwig Listl

IPC: G06K900

CPC classification number: G01R31/048 ,  G01R31/309

Abstract: A solder testing apparatus comprising image processing means for performing image processing on an image of an appearance of a soldered portion to identify shape characterizing amounts for the soldered portion; and defect determining means for performing good/bad determination on the soldered portion from data derived by the image processing means and data from test parameter storing means for storing shape characterizing amounts at design time, wherein tested-object standard shape estimating means is included for extracting shape characterizing amounts of a non-defective soldered portion by statistically processing shape characterizing amounts for soldered portions identified by the image processing means, and defect determining parameters stored in the test parameter storing means are updated based on standard shape values from the tested-object standard shape estimating means, so that a highly reliable test is realized by setting defect determining parameters based on actual shapes and dimensions of leads and pads of electronic components on a printed circuit board.

Abstract translation: 一种焊料测试装置，包括图像处理装置，用于对焊接部分的外观的图像进行图像处理，以识别焊接部分的形状特征量; 以及缺陷确定装置，用于根据由图像处理装置导出的数据对焊接部分进行良好/不良确定，以及用于在设计时存储形状特征量的测试参数存储装置的数据，其中包括用于提取的测试对象标准形状估计装置 通过统计处理由图像处理装置识别的焊接部分的形状特征量的无缺陷焊接部分的形状特征量，以及存储在测试参数存储装置中的缺陷确定参数基于来自测试对象标准的标准形状值而被更新 形状估计装置，使得通过基于印刷电路板上的电子部件的引线和焊盘的实际形状和尺寸设置缺陷确定参数来实现高度可靠的测试。

公开(公告)号：US4897598A

公开(公告)日：1990-01-30

申请号：US164856

申请日：1988-03-07

Applicant: Guenter Doemens ,  Thomas Rose

Inventor： Guenter Doemens ,  Thomas Rose

IPC: G01R31/02 ,  G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07371

Abstract: Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards. In the electrical function testing of wiring matrices, particularly of printed circuit boards, the number of required leads and switch elements can be drastically reduced. In the present apparatus, every measuring locations of the printed circuit board can be selected by an associated busbar and by an intermediate mask that prevents the contacting of non-selected measuring locations. The busbars preferably are orientated transversely relative to the principal direction of the wiring of the printed circuit board.

Abstract translation: 布线基体，特别是印刷电路板的电气功能测试装置。 在布线基体的电气功能测试中，特别是印刷电路板的电气功能测试中，所需导线和开关元件的数量可以大大降低。 在本装置中，印刷电路板的每个测量位置都可以由相关联的母线和中间掩模选择，以防止未被选择的测量位置的接触。 母线优选地相对于印刷电路板的布线的主要方向横向定向。