Abstract:
A test socket is provided that includes a socket body to receive an object to be tested, a lid disposed on the socket body, one or more pushers coupled to a first surface of lid to apply force to a first surface of the object toward the socket body, and a temperature controlling member to provide a temperature to the object. A semiconductor package may be tested in a test apparatus that includes the test socket, the methods of testing including receiving a semiconductor package in a socket in a test chamber, applying a first temperature to the test chamber to test the semiconductor package at a first test temperature, and applying a second temperature to the semiconductor package to test the semiconductor package at a second test temperature by controlling the application of the second temperature with the socket.
Abstract:
An injection preform having a pattern on a surface thereof and realizing a transparent pattern paint layer for forming a crack pattern in a transparent or semi-transparent substrate, and a method of manufacturing the same. The injection preform preferably includes: a substrate injection molded so as to be transparent or semi-transparent; a primer layer painted on a rear surface of the substrate; a transparent pattern paint layer painted on a rear surface of the primer layer, a surface of the transparent pattern paint layer being dried with hot air in an oven such that a pattern is formed; a deposition layer deposited on a rear surface of the transparent pattern paint layer; a finishing layer painted on a rear surface of the deposition layer; and a clear coating layer painted on a front surface of the substrate.
Abstract:
A capacitor structure includes an insulating layer, first conductive patterns, second conductive patterns, an insulating interlayer, third conductive patterns, and fourth conductive patterns. The first and second conductive patterns are alternately arranged on the insulating layer to be spaced apart from one another. The first and second conductive patterns have side faces where concave portions and convex portions are formed. The insulating interlayer is formed on the insulating layer to cover the first and second conductive patterns. The third and fourth conductive patterns are alternately arranged on the insulating interlayer to be spaced apart from one another. The third and fourth conductive patterns have side faces where concave portions and convex portions are formed.
Abstract:
A projection-type display apparatus and a display method thereof are disclosed, the projection-type display apparatus including a coated portion which is formed on a surface of a substrate, and which scans a video onto a screen, and a patterned portion which is formed on another surface of the substrate in a serrated pattern, wherein the serrated pattern is formed on the substrate according to the surface area of the patterned portion and the depth of the serrated pattern. A serrated pattern is formed on a substrate forming a reflective portion to reflect a video on a screen, so the cooling surface area of the substrate is increased, thereby compensating for distortions in video scanned onto the screen.
Abstract:
A method of forming an information storage pattern, includes placing a semiconductor substrate in a process chamber, injecting first, second and third process gases into the process chamber during a first process to form a lower layer on the substrate based on a first injection time and/or a first pause time, injecting the second process gas into the process chamber during a second process, wherein the second process gas is injected into the process chamber during a first elimination time, injecting a fourth process gas together with the second and third process gases into the process chamber during a third process in accordance with a second injection time and/or a second pause time to form an upper layer on the lower layer, and injecting the second process gas into the process chamber during a fourth process, wherein the second process gas is injected into the process chamber during a second elimination.
Abstract:
Provided are methods of forming a phase change memory device. A semiconductor device having a lower electrode and an interlayer insulating layer may be prepared. The lower electrode may be surrounded by the interlayer insulating layer. Source gases, a reaction gas and a purge gas may be injected into a process chamber of a semiconductor fabrication device to form a phase change material layer on a semiconductor substrate. The source gases may be simultaneously injected into the process chamber. The phase change material layer may be in contact with the lower electrode through the interlayer insulating layer. The phase change material layer may be etched to form a phase change memory cell in the interlayer insulating layer. An upper electrode may be formed on the phase change memory cell.
Abstract:
In a capacitor structure and a method of manufacturing the capacitor structure, first and second conductive patterns are formed on a substrate. The first and second conductive patterns extend in a first direction. The first and second conductive patterns are alternately arranged to be spaced apart from one another in a second direction substantially perpendicular to the first direction. An insulating interlayer is formed on the substrate to cover the first and second conductive patterns. Third and fourth conductive patterns extending in a third direction lying at an angle of between about 0° and about 90° relative to the first direction are formed on the insulating interlayer. The third and fourth conductive patterns are alternately arranged to be spaced apart from one another in a fourth direction substantially perpendicular to the third direction.
Abstract:
A damper including a cylinder, a piston inserted in the cylinder, a movable member disposed in the piston to be movable in the cylinder in a length direction of the cylinder, and a weight sensor mounted on an inner surface of the cylinder, facing an end of the piston, to perceive weight loaded on the piston through contact with the movable member. When applied to a washing machine, the damper is capable of perceiving accurate weight of the laundry supplied in the washing machine.
Abstract:
A stacked semiconductor module, a method of fabricating the same, and an electronic system using the module are provided. A first semiconductor module having a plurality of semiconductor devices mounted on a rigid printed circuit board (PCB) and a second semiconductor module having a plurality of other semiconductor devices mounted on a flexible PCB are provided. On the rigid PCB a number L of first tabs may be disposed on a first surface, and a number K of second tabs may be disposed on a second surface of the rigid PCB. The flexible PCB may have a number M of third tabs on a third surface, and a number N of fourth tabs on a fourth surface of the flexible PCB. The second tabs may be combined with the third tabs using a conductive adhesive. The third tabs may be electrically connected to corresponding ones of the second tabs.
Abstract:
A burn-in board connection device includes a first connection unit to hold a burn-in board and move in a first direction perpendicular to the burn-in board that is inserted in a chamber of a burn-in test device, a second connection unit to move in a second direction parallel to the burn-in board to attach/detach the burn-in board that is held by the first connection unit to/from a connector disposed in the chamber. A burn-in board connection method includes coupling a finger to the burn-in board by moving the finger in a first direction, attaching the burn-in board to a connector by moving the finger in a second direction, and driving the finger by converting a rotation of a servo motor into a linear movement of the finger.