摘要:
A semiconductor memory having a burst mode reading function in synchronization with a clock signal comprises a memory array composed of a plurality of memory cells, a sync read control circuit for releasing an upper group of the received address as a memory access address and a lower group of the received address as a burst address in synchronization with the clock signal, a sense amplifier for releasing an output data from each of the memory cells selected by the memory address, a decoder for decoding the burst address, a address latch for latching the decoded burst address in synchronization with the clock signal, a page selector for holding the output data and selecting corresponding one of the output data determined by the burst address of the address latch, and an output latch for latching the output data in synchronization with the clock signal.
摘要:
A DLL circuit having a phase comparison circuit for comparing phases of a reference clock and a delay clock and a variable delay addition circuit for adjusting delay amount according to a signal from the phase comparison circuit comprises a means for inputting a first signal latched at a logic “1” by start of 1 clock cycle of an internal clock to the variable delay addition circuit through a dummy delay at the start of burst and a means for detecting duration time of the logic “1” of the first signal input by the variable delay addition circuit through the dummy delay until the end of the 1 clock cycle of the internal clock and setting an initial value of delay amount of the variable delay addition circuit based on the duration time.
摘要:
A semiconductor memory device includes a memory cell array, a power source circuit, a sense amplifier, a control circuit, and a processor. The memory cell array includes a nonvolatile memory cell. The power source circuit includes a first register and generates a voltage. The sense amplifier includes a second register, reads from the memory cell and amplifies the read data. The control circuit includes a third register and controls operations of the power source circuit and the sense amplifier. The processor controls the operations of the power source circuit, the sense amplifier and the control circuit by giving an instruction to the first to third registers. The control circuit decodes the instruction received at the third register so as to control the power source circuit and the sense amplifier directly based on a result of decoding.
摘要:
A semiconductor memory device includes a memory cell array, a power source circuit, a sense amplifier, a control circuit, and a processor. The memory cell array includes a nonvolatile memory cell. The power source circuit includes a first register and generates a voltage. The sense amplifier includes a second register, reads from the memory cell and amplifies the read data. The control circuit includes a third register and controls operations of the power source circuit and the sense amplifier. The processor controls the operations of the power source circuit, the sense amplifier and the control circuit by giving an instruction to the first to third registers. The control circuit decodes the instruction received at the third register so as to control the power source circuit and the sense amplifier directly based on a result of decoding.
摘要:
A semiconductor memory device includes a memory cell array, a power source circuit, a sense amplifier, a control circuit, and a processor. The memory cell array includes a nonvolatile memory cell. The power source circuit includes a first register and generates a voltage. The sense amplifier includes a second register, reads from the memory cell and amplifies the read data. The control circuit includes a third register and controls operations of the power source circuit and the sense amplifier. The processor controls the operations of the power source circuit, the sense amplifier and the control circuit by giving an instruction to the first to third registers. The control circuit decodes the instruction received at the third register so as to control the power source circuit and the sense amplifier directly based on a result of decoding.
摘要:
A semiconductor memory device includes a memory cell array, a power source circuit, a sense amplifier, a control circuit, and a processor. The memory cell array includes a nonvolatile memory cell. The power source circuit includes a first register and generates a voltage. The sense amplifier includes a second register, reads from the memory cell and amplifies the read data. The control circuit includes a third register and controls operations of the power source circuit and the sense amplifier. The processor controls the operations of the power source circuit, the sense amplifier and the control circuit by giving an instruction to the first to third registers. The control circuit decodes the instruction received at the third register so as to control the power source circuit and the sense amplifier directly based on a result of decoding.
摘要:
A semiconductor memory using a DLL circuit having a phase comparison circuit for comparing phases of an internal clock and a delay clock and a variable delay addition circuit for adjusting delay amount according to a signal from the phase comparison circuit comprises a means for inputting a first signal latched to a logic “1” by start of one clock cycle of the internal clock to the variable delay addition circuit through a dummy delay at the start of burst and a means for detecting the duration time of the logic “1” of the first signal inputted by the variable delay addition circuit through the dummy delay until one clock cycle of the internal clock is completed and setting the initial value of delay amount of the variable delay addition circuit based on the duration time.
摘要:
A semiconductor memory device includes a memory cell array, a power source circuit, a sense amplifier, a control circuit, and a processor. The memory cell array includes a nonvolatile memory cell. The power source circuit includes a first register and generates a voltage. The sense amplifier includes a second register, reads from the memory cell and amplifies the read data. The control circuit includes a third register and controls operations of the power source circuit and the sense amplifier. The processor controls the operations of the power source circuit, the sense amplifier and the control circuit by giving an instruction to the first to third registers. The control circuit decodes the instruction received at the third register so as to control the power source circuit and the sense amplifier directly based on a result of decoding.
摘要:
A DLL circuit comprises a dummy delay corresponding to an internal clock delay from an external clock, a variable delay addition circuit having a coarse and fine delay circuits adjusting delay amount according to a delay amount adjustment signal, and a phase comparison circuit comparing phases of the internal clock and a delay clock input via the variable delay addition circuit and the dummy delay and outputting the delay amount adjustment signal to the variable delay addition circuit. At the start of burst, a first signal set at a logic “1” during 1 clock cycle of the internal clock is input to the variable delay addition circuit via the dummy delay, and duration time of the logic “1” of the first signal is detected until 1 clock cycle of the internal clock is completed and delay amount of the variable delay addition circuit is initialized by setting one of the coarse delay circuit based on the duration time.