Circuit and method for repairing column in semiconductor memory device
    1.
    发明授权
    Circuit and method for repairing column in semiconductor memory device 失效
    半导体存储器件中修复柱的电路和方法

    公开(公告)号:US06711074B2

    公开(公告)日:2004-03-23

    申请号:US10175385

    申请日:2002-06-19

    申请人: Oh Won Kwon

    发明人: Oh Won Kwon

    IPC分类号: G11C700

    CPC分类号: G11C29/785 G11C29/808

    摘要: Circuits and methods for repairing a column in repairing a row by using an adjacent block are disclosed. An adjacent block selecting fuse unit generates an adjacent block selecting signal in response to a column redundancy start signal. The adjacent block selecting signal determines whether to use either row repair lines of a block designated by an externally inputted block address or row repair lines of an adjacent block of the block. A fuse unit receives the column redundancy start signal, the adjacent block designating bit, the inverted adjacent block designating bit and a plurality block address bits in which the adjacent block designated bit and the inverted adjacent block designating bit are removed from the block address and the inverting block address, and outputs an output signal.

    摘要翻译: 公开了通过使用相邻块来修复列修复列的电路和方法。 相邻块选择熔丝单元响应于列冗余启动信号产生相邻块选择信号。 相邻块选择信号确定是否使用由外部输入的块地址指定的块的块修复行或块的相邻块的行修复行。 熔丝单元接收列冗余启动信号,相邻块指定位,反相邻块指定位和多个块地址位,其中相邻块指定位和反相邻块指定位从块地址中移除,并且 反转块地址,并输出一个输出信号。

    Device for automatically analyzing nucleic acid
    2.
    发明授权
    Device for automatically analyzing nucleic acid 有权
    用于自动分析核酸的装置

    公开(公告)号:US08759079B2

    公开(公告)日:2014-06-24

    申请号:US13314571

    申请日:2011-12-08

    申请人: Oh Won Kwon

    发明人: Oh Won Kwon

    摘要: An apparatus for automatically analyzing a nucleic acid includes: a sample preprocessing device including a plurality of chambers in which reagents mixed with a sample are accommodated according to sample preprocessing process order for extracting a nucleic acid from the sample; and a nucleic amplifying and detecting device connected with the sample preprocessing device to receive the nucleic acid extracted from the sample.

    摘要翻译: 用于自动分析核酸的装置包括:样品预处理装置,其包括多个室,其中根据从样品中提取核酸的样品预处理程序顺序容纳与样品混合的试剂; 以及与样品预处理装置连接以接收从样品提取的核酸的核酸扩增和检测装置。

    Circuit to check overerasing of repair fuse cells
    3.
    发明授权
    Circuit to check overerasing of repair fuse cells 有权
    检查维修保险丝电池的过电流

    公开(公告)号:US06404680B1

    公开(公告)日:2002-06-11

    申请号:US09468933

    申请日:1999-12-22

    申请人: Oh Won Kwon

    发明人: Oh Won Kwon

    IPC分类号: G11C1604

    摘要: The present invention comprises a first means to select all repair fuse cells, using a test mode, and to sense each repair fuse cell state depending on the applied read-out voltage; a logical means to generate decision signals to decide the overerasing state of said repair fuse cells by logically combining sensed signals from said each repair fuse cell; and a second means to read output signals of said logical means.

    摘要翻译: 本发明包括使用测试模式选择所有修理保险丝单元并根据所应用的读出电压感测每个修复熔丝单元状态的第一装置; 通过逻辑地组合来自所述每个修复熔丝单元的感测信号,产生决定信号以决定所述修复熔丝单元的过度曝光状态的逻辑装置; 以及读取所述逻辑装置的输出信号的第二装置。

    Word line voltage regulation circuit
    4.
    发明授权
    Word line voltage regulation circuit 有权
    字线电压调节电路

    公开(公告)号:US06377496B1

    公开(公告)日:2002-04-23

    申请号:US09722490

    申请日:2000-11-28

    IPC分类号: G11C700

    CPC分类号: G11C16/30 G11C8/08 G11C16/08

    摘要: A word line voltage regulation circuit includes a first comparator for comparing a first reference voltage and the potential of an output node; a first switching element for supplying the supply voltage to the output node depending on the output signal of the first comparator; a second comparator for comparing a second reference voltage and the potential of the output node; a second switching element for regulating the potential of the output node depending on the output signal of the second comparator; a third switching element for transmitting the potential of the output node to a decoder circuit depending on a first control signal; and a fourth switching element for supplying the supply voltage to the decoder circuit depending on a second control signal.

    摘要翻译: 字线电压调节电路包括用于比较第一参考电压和输出节点的电位的第一比较器; 第一开关元件,用于根据第一比较器的输出信号将输出电压提供给输出节点; 用于比较第二参考电压和输出节点的电位的第二比较器; 第二开关元件,用于根据第二比较器的输出信号调节输出节点的电位; 第三开关元件,用于根据第一控制信号将输出节点的电位传输到解码器电路; 以及第四开关元件,用于根据第二控制信号向解码器电路提供电源电压。

    Antifuse circuit being programmable by using no connection pin
    5.
    发明授权
    Antifuse circuit being programmable by using no connection pin 失效
    防漏电路可通过不使用连接引脚进行编程

    公开(公告)号:US06333666B2

    公开(公告)日:2001-12-25

    申请号:US09737854

    申请日:2000-12-18

    IPC分类号: H01H3776

    CPC分类号: G11C17/18

    摘要: An antifuse circuit provides a stabilized high voltage to an antifuse programming circuit through the use of an NC pin which is not used in the chip operation. For the purpose, the antifuse circuit includes a power-up detecting circuit for generating a power stabilization signal by detecting a supply voltage; a power-up pulse circuit for generating a first and a second control signal in response to the power stabilization signal; an antifuse programming circuit for, under the control of the first and the second control signals, detecting whether an antifuse element is programmed or not, latching the result of the detection and programming the antifuse element in response to an external high voltage and a precharge signal; a pin for receiving the external high voltage so as to program the antifuse element; a pad for providing the external high voltage to the inside of the chip; and a diode for supplying the external high voltage to the antifuse programming circuit and preventing a voltage of the antifuse programming circuit from being provided to the pin.

    摘要翻译: 反熔丝电路通过使用不用于芯片操作的NC引脚向反熔丝编程电路提供稳定的高电压。 为此,反熔丝电路包括用于通过检测电源电压来产生功率稳定信号的上电检测电路; 上电脉冲电路,用于响应于所述功率稳定信号产生第一和第二控制信号; 反熔丝编程电路,用于在第一和第二控制信号的控制下检测反熔丝元件是否被编程,锁存检测结果并响应于外部高电压和预充电信号编程反熔丝元件 ; 用于接收外部高电压以便对反熔丝元件进行编程的引脚; 用于向芯片内部提供外部高电压的焊盘; 以及用于将外部高电压提供给反熔丝编程电路并防止反熔丝编程电路的电压被提供给引脚的二极管。

    Flash memory cell
    6.
    发明授权
    Flash memory cell 失效
    闪存单元

    公开(公告)号:US5998830A

    公开(公告)日:1999-12-07

    申请号:US999349

    申请日:1997-12-29

    申请人: Oh Won Kwon

    发明人: Oh Won Kwon

    摘要: A flash memory cell of the present invention comprises a silicon substrate consisted of an insulating film and a silicon film in which a first and second channel regions are formed and a pair of gate electrodes formed on the first and second channel regions, respectively. Each channel region has a drain region and source region formed at both sides thereof.

    摘要翻译: 本发明的闪存单元包括由绝缘膜和硅膜构成的硅衬底,其中形成有第一和第二沟道区,并且分别在第一和第二沟道区上形成一对栅电极。 每个沟道区域具有在其两侧形成的漏极区域和源极区域。

    DEVICE FOR AUTOMATICALLY ANALYZING NUCLEIC ACID
    7.
    发明申请
    DEVICE FOR AUTOMATICALLY ANALYZING NUCLEIC ACID 有权
    用于自动分析核酸的装置

    公开(公告)号:US20130122576A1

    公开(公告)日:2013-05-16

    申请号:US13314571

    申请日:2011-12-08

    申请人: Oh Won KWON

    发明人: Oh Won KWON

    IPC分类号: C12M1/34

    摘要: An apparatus for automatically analyzing a nucleic acid includes: a sample preprocessing device including a plurality of chambers in which reagents mixed with a sample are accommodated according to sample preprocessing process order for extracting a nucleic acid from the sample; and a nucleic amplifying and detecting device connected with the sample preprocessing device to receive the nucleic acid extracted from the sample.

    摘要翻译: 用于自动分析核酸的装置包括:样品预处理装置,其包括多个室,其中根据从样品中提取核酸的样品预处理程序顺序容纳与样品混合的试剂; 以及与样品预处理装置连接以接收从样品提取的核酸的核酸扩增和检测装置。