摘要:
An integrated circuit that includes memory containing wordlines and bitcells having SRAM storage elements and being connected to the wordlines. Wordline up-level assist circuitry is provided that is designed and configured to provide a plurality of selectable voltage values that can be selected to provide the wordline up-level voltage that is provided to the bitcells during a memory read cycle and/or write cycle. In one example, the voltage value selected is selected based on characterization of the as-fabricated bitcells so as to decrease the likelihood of the bitcells experiencing a stability failure.
摘要:
A method for sensing the contents of a memory cell within a static random access memory (SRAM) includes holding a bit line associated with the memory cell at a zero voltage potential when the memory cell is not being accessed; energizing the bit line to a first voltage potential different than the zero voltage potential during an access of the memory cell; and sensing the memory cell contents when the associated bit line has reached the first voltage potential.
摘要:
A method and circuit for adjusting the read margin of a self-timed memory array. The electronic circuit, including: a memory cell array including a sense amplifier self-timed decode circuit adapted to set a base read time delay of the memory cell array; and a read delay adjustment circuit coupled to the memory cell array, the read delay adjustment circuit adapted to adjust the base read time delay of the memory array based on an operating frequency of the memory cell array.
摘要:
Methods and structures for configuring an integrated circuit including repeated cells that are divided into banks having a respective power assist and a respective operational assist are provided. A method includes configuring the banks without power assist and operational assist. The method further includes selecting the power assist for a bank based on a determination that a weak cell remains in the bank after configuring the bank with the respective operational assist.
摘要:
An approach for providing fine granularity power gating of a memory array is described. In one embodiment, power supply lines are disposed in a horizontal dimension of the memory array parallel to the word lines that access cells arranged in rows and columns of the array, wherein each of the supply lines are shared by adjacent cells in the memory. Power supply lines that activate a row selected by one of the word lines are supplied a full-power voltage value and power supply lines that activate rows adjacent to the selected row are supplied a half-power voltage value, while the power supply lines of the remaining rows in the memory array are supplied a power-gated voltage value.
摘要:
An approach for providing fine granularity power gating of a memory array is described. In one embodiment, power supply lines are disposed in a horizontal dimension of the memory array parallel to the word lines that access cells arranged in rows and columns of the array, wherein each of the supply lines are shared by adjacent cells in the memory. Power supply lines that activate a row selected by one of the word lines are supplied a full-power voltage value and power supply lines that activate rows adjacent to the selected row are supplied a half-power voltage value, while the power supply lines of the remaining rows in the memory array are supplied a power-gated voltage value.
摘要:
Methods of setting wordline up-level voltage in as-fabricated SRAM. In one example, the method includes determining the relative speed, or strength, of 1) the combination of the pass-gate and pull-down devices and 2) the pull-up devices in the bitcells of the SRAM. These relative strengths are then used to adjust the wordline up-level voltage, if needed, to decrease the likelihood of the SRAM experiencing a stability failure. Corresponding systems are provided for determining the relative strengths of the devices of interest, for determining the amount of up-level voltage adjustment needed, and for selecting and setting the up-level voltage.
摘要:
A digital clock signal multiplier circuit for generating an on-chip clock signal having a higher frequency than a system clock signal. A variable delay line, coupled to receive the system clock signal, is partitioned into (N) equal segments with each segment having multiple delay elements. Each of the delay elements is tapped to allow selective output of a corresponding delay signal. Multiple control switches, each associated with one of the delay elements, provide selective control for issuance of only one delay signal from each segment of the variable delay line. Delay signals selected for output are symmetrically offset and are fed to (N) pulse generators for the production of (N) pulse signals of duration substantially less than the period of the external clock signal. An output generator is coupled to receive the pulse signals output from the (N) pulse generators and produce therefrom the internal clock signal of desired frequency. Control circuitry selects the delay signals output from the (N) equal segments via appropriate activation of the associated control switches.
摘要:
Methods and structures for configuring an integrated circuit including repeated cells that are divided into banks having a respective power assist and a respective operational assist are provided. A method includes configuring the banks without power assist and operational assist. The method further includes selecting the power assist for a bank based on a determination that a weak cell remains in the bank after configuring the bank with the respective operational assist.
摘要:
An SRAM delay circuit that tracks bitcell characteristics. A circuit is disclosed that includes an input node for receiving an input signal; a reference node for capturing a reference current from a plurality of reference cells; a capacitance network having a discharge that is controlled by the reference current; and an output circuit that outputs the input signal with a delay, wherein the delay is controlled by the discharge of the capacitance network.