摘要:
Input CAD data and run-length data obtained by performing a RIP process on the input CAD data are acquired. A predetermined conversion process is performed on at least one of the input CAD data and the run-length data to make the data formats of both data comparable and then both data are compared with each other to detect an area having a difference as a defect area in the run-length data. This provides a technique to detect a defect in the run-length data to be used for drawing of a figure before the execution of drawing with a simple structure.
摘要:
An image display device for direct drawing apparatus for performing direct drawing comprising: an acquisition part for acquiring design data in a vector format describing the pattern; a specified parameter setting part for setting a specified parameter to be used for RIP development of the design data; a processing area setting part for setting a processing area of the design data to be subjected to RIP development; a display RIP development part for performing RIP development of a portion of the design data, which corresponds to the processing area, by using the specified parameter, to thereby obtain a specified image; and a display part for visibly displaying the specified image, wherein the RIP development performed by the display RIP development part is a display RIP development in which the amount of processed data is smaller than that in drawing RIP development for the direct drawing.
摘要:
An image display device for direct drawing apparatus for performing direct drawing comprising: an acquisition part for acquiring design data in a vector format describing the pattern; a specified parameter setting part for setting a specified parameter to be used for RIP development of the design data; a processing area setting part for setting a processing area of the design data to be subjected to RIP development; a display RIP development part for performing RIP development of a portion of the design data, which corresponds to the processing area, by using the specified parameter, to thereby obtain a specified image; and a display part for visibly displaying the specified image, wherein the RIP development performed by the display RIP development part is a display RIP development in which the amount of processed data is smaller than that in drawing RIP development for the direct drawing.
摘要:
In a computer, fixed pattern information indicating respective shapes of fixed pattern elements included in a fixed pattern and respective position vectors of the fixed pattern elements with respect to a reference position in the fixed pattern is prepared and key pattern elements coincident with any of fixed pattern elements are specified from writing pattern elements. Subsequently, a value is added to a position designated by a reverse vector of position vector of a corresponding fixed pattern element with each of the key pattern elements as a starting point in a setting area which corresponds to a writing pattern, and a position is specified to which a value coincident with the number of fixed pattern elements is given, to detect an existing position of the fixed pattern in the writing pattern. It is thereby possible in the computer to extract a fixed pattern from a writing pattern at high speed.
摘要:
A drawing device draws a pattern on a substrate by radiating light from an optical head part on a target object (for example, substrate) which relatively moves with respect to the optical head part. Here, the optical head part has a spatial modulating unit which spatially modulates light from a light source, based on pattern data, and an optical path corrector which shifts the route of light spatially modulated in the spatial modulating unit at precision subdivided more than units of spatial modulation in the spatial modulating unit (more specifically, for example, units of pixels of spatial light modulator).
摘要:
A drawing device draws a pattern on a substrate by radiating light from an optical head part on a target object (for example, substrate) which relatively moves with respect to the optical head part. Here, the optical head part has a spatial modulating unit which spatially modulates light from a light source, based on pattern data, and an optical path corrector which shifts the route of light spatially modulated in the spatial modulating unit at precision subdivided more than units of spatial modulation in the spatial modulating unit (more specifically, for example, units of pixels of spatial light modulator).
摘要:
A lubricating oil composition for an internal combustion engine contains: a base oil having a viscosity index of 120 or more; and a polymer compound that includes a first constituent having a mass average molecular weight of less than 100,000 and a second constituent having a mass average molecular weight of 100,000 or more, the first constituent of 0.01 mass % to 10 mass % being contained relative to a total amount of the lubricating oil composition, preferably 0.1 mass % to 10 mass %, the second constituent of less than 0.5 mass % being contained relative to the total amount of the lubricating oil composition. A viscosity index of the lubricating oil composition is 130 or more.
摘要:
A lubricating oil composition for an internal combustion engine contains: a base oil having a viscosity index of 120 or more; and a polymer compound that includes a first constituent having a mass average molecular weight of less than 100,000 and a second constituent having a mass average molecular weight of 100,000 or more, the first constituent of 0.01 mass % to 10 mass % being contained relative to a total amount of the lubricating oil composition, preferably 0.1 mass % to 10 mass %, the second constituent of less than 0.5 mass % being contained relative to the total amount of the lubricating oil composition. A viscosity index of the lubricating oil composition is 130 or more.
摘要:
Correction values (ΔX1 to ΔX4) at the X position (X=xe) of a target point (E (xe, ye)) are calculated by calculating the amounts of shift (ΔX) in the positions of alignment marks (M11 to M14, M21 to M24, M31 to M34, M41 to M44) in the X direction and plotting first spline curves (SL1) using the amounts of shift. Then, a first sub-spline curve (SL1S) is plotted using the correction values (ΔX1 to ΔX4) in order to calculate a correction value (ΔXe) at the Y position (Y=ye) of the target point (E (xe, ye)), and the calculated correction value is taken as the correction amount in the X direction. The correction amount in the Y direction is also calculated in the same manner.
摘要:
Input CAD data and run-length data obtained by performing a RIP process on the input CAD data are acquired. A predetermined conversion process is performed on at least one of the input CAD data and the run-length data to make the data formats of both data comparable and then both data are compared with each other to detect an area having a difference as a defect area in the run-length data. This provides a technique to detect a defect in the run-length data to be used for drawing of a figure before the execution of drawing with a simple structure.