MEMORY DEVICE, TEST OPERATION METHOD THEREOF, AND SYSTEM INCLUDING THE SAME
    1.
    发明申请
    MEMORY DEVICE, TEST OPERATION METHOD THEREOF, AND SYSTEM INCLUDING THE SAME 有权
    存储器件,其测试操作方法和包括其的系统

    公开(公告)号:US20120140576A1

    公开(公告)日:2012-06-07

    申请号:US13239111

    申请日:2011-09-21

    IPC分类号: G11C7/06

    摘要: A test operation method of a memory device is provided. The test operation method includes a reference current generator generating a reference current and providing a reference voltage generated based on the reference current to one of input terminals of a sense amplifier; providing a read voltage generated based on a read current of a memory cell to another one of the input terminals of the sense amplifier; and the sense amplifier comparing the reference voltage with the read voltage.

    摘要翻译: 提供了一种存储器件的测试操作方法。 测试操作方法包括产生参考电流的参考电流发生器,并且将基于参考电流生成的参考电压提供给读出放大器的一个输入端; 将基于存储器单元的读取电流产生的读取电压提供给读出放大器的另一个输入端; 并且读出放大器将参考电压与读取电压进行比较。

    Memories, memory compiling systems and methods for the same
    2.
    发明授权
    Memories, memory compiling systems and methods for the same 有权
    记忆体,内存编译系统和方法相同

    公开(公告)号:US07788619B2

    公开(公告)日:2010-08-31

    申请号:US11819389

    申请日:2007-06-27

    申请人: Soung-Hoon Sim

    发明人: Soung-Hoon Sim

    IPC分类号: G06F17/50

    摘要: A method of compiling a memory for layout by computation includes inputting memory specification, determining a disposition structure of input/output pads with reference to the memory specification, and creating a layout of the memory in accordance with the determined disposition structure of the input/output pads. A memory includes a plurality of memory banks, a plurality of row decoders and a plurality of input/output pads. Each of the plurality of row decoders is arranged between two memory banks adjacent to each other in a row direction. The plurality of row decoders are configured to selectively activate word lines based on row address signals input from an external source. Each row decoder receives row address signals altering a permutation in accordance with a size of the memory banks.

    摘要翻译: 通过计算编译用于布局的存储器的方法包括输入存储器规范,参考存储器规范确定输入/输出焊盘的布置结构,以及根据所确定的输入/输出的配置结构来创建存储器的布局 垫 存储器包括多个存储器组,多个行解码器和多个输入/输出焊盘。 多个行解码器中的每一行被布置在行方向上彼此相邻的两个存储体之间。 多个行解码器被配置为基于从外部源输入的行地址信号选择性地激活字线。 每行解码器接收根据存储体的大小改变排列的行地址信号。

    Negative voltage generator and semiconductor memory device
    3.
    发明授权
    Negative voltage generator and semiconductor memory device 有权
    负电压发生器和半导体存储器件

    公开(公告)号:US08934313B2

    公开(公告)日:2015-01-13

    申请号:US13358121

    申请日:2012-01-25

    IPC分类号: G11C7/12 G11C5/14 G11C11/419

    CPC分类号: G11C11/419 G11C5/145 G11C7/12

    摘要: A negative voltage generator includes a variable-capacitance negative voltage generating unit, a switching unit and a positive voltage applying unit. The negative voltage generating unit includes a plurality of coupling capacitors for varying the capacitance in which the negative voltage is charged. The negative voltage generating unit selects at least one coupling capacitor of the plurality of coupling capacitors according to the number of rows (size) of a memory bank to which data is written, and charges the at least one selected coupling capacitor to a negative voltage. The switching unit selects one bitline of a bitline pair having complementary first and second bitlines in response to the data, and connects the at least one selected coupling capacitor to the selected bitline. The positive voltage applying unit applies a positive (high) voltage to an other bitline of the bitline pair.

    摘要翻译: 负电压发生器包括可变电容负电压产生单元,开关单元和正电压施加单元。 负电压产生单元包括用于改变负电压被充电的电容的多个耦合电容器。 负电压产生单元根据写入数据的存储体组的行数(大小)选择多个耦合电容器中的至少一个耦合电容器,并将至少一个所选择的耦合电容器充电至负电压。 切换单元响应于数据选择具有互补的第一和第二位线的位线对的一个位线,并且将至少一个选择的耦合电容器连接到所选择的位线。 正电压施加单元将正(高)电压施加到位线对的另一位线。

    Memories, memory compiling systems and methods for the same
    4.
    发明申请
    Memories, memory compiling systems and methods for the same 有权
    记忆体,内存编译系统和方法相同

    公开(公告)号:US20080013376A1

    公开(公告)日:2008-01-17

    申请号:US11819389

    申请日:2007-06-27

    申请人: Soung-Hoon Sim

    发明人: Soung-Hoon Sim

    IPC分类号: G11C11/34

    摘要: A method of compiling a memory for layout by computation includes inputting memory specification, determining a disposition structure of input/output pads with reference to the memory specification, and creating a layout of the memory in accordance with the determined disposition structure of the input/output pads. A memory includes a plurality of memory banks, a plurality of row decoders and a plurality of input/output pads. Each of the plurality of row decoders is arranged between two memory banks adjacent to each other in a row direction. The plurality of row decoders are configured to selectively activate word lines based on row address signals input from an external source. Each row decoder receives row address signals altering a permutation in accordance with a size of the memory banks.

    摘要翻译: 通过计算编译用于布局的存储器的方法包括输入存储器规范,参考存储器规范确定输入/输出焊盘的布置结构,以及根据所确定的输入/输出的配置结构来创建存储器的布局 垫 存储器包括多个存储器组,多个行解码器和多个输入/输出焊盘。 多个行解码器中的每一行被布置在行方向上彼此相邻的两个存储体之间。 多个行解码器被配置为基于从外部源输入的行地址信号选择性地激活字线。 每行解码器接收根据存储体的大小改变排列的行地址信号。

    NEGATIVE VOLTAGE GENERATOR AND SEMICONDUCTOR MEMORY DEVICE
    6.
    发明申请
    NEGATIVE VOLTAGE GENERATOR AND SEMICONDUCTOR MEMORY DEVICE 有权
    负电压发生器和半导体存储器件

    公开(公告)号:US20120206988A1

    公开(公告)日:2012-08-16

    申请号:US13358121

    申请日:2012-01-25

    IPC分类号: G11C7/12 G11C7/00

    CPC分类号: G11C11/419 G11C5/145 G11C7/12

    摘要: A negative voltage generator includes a variable-capacitance negative voltage generating unit, a switching unit and a positive voltage applying unit. The negative voltage generating unit includes a plurality of coupling capacitors for varying the capacitance in which the negative voltage is charged. The negative voltage generating unit selects at least one coupling capacitor of the plurality of coupling capacitors according to the number of rows (size) of a memory bank to which data is written, and charges the at least one selected coupling capacitor to a negative voltage. The switching unit selects one bitline of a bitline pair having complementary first and second bitlines in response to the data, and connects the at least one selected coupling capacitor to the selected bitline. The positive voltage applying unit applies a positive (high) voltage to an other bitline of the bitline pair.

    摘要翻译: 负电压发生器包括可变电容负电压产生单元,开关单元和正电压施加单元。 负电压产生单元包括用于改变负电压被充电的电容的多个耦合电容器。 负电压产生单元根据写入数据的存储体组的行数(大小)选择多个耦合电容器中的至少一个耦合电容器,并将至少一个所选择的耦合电容器充电至负电压。 切换单元响应于数据选择具有互补的第一和第二位线的位线对的一个位线,并且将至少一个选择的耦合电容器连接到所选择的位线。 正电压施加单元将正(高)电压施加到位线对的另一位线。

    Static memory device and static random access memory device
    7.
    发明申请
    Static memory device and static random access memory device 有权
    静态存储器件和静态随机存取存储器件

    公开(公告)号:US20090251984A1

    公开(公告)日:2009-10-08

    申请号:US12382858

    申请日:2009-03-25

    IPC分类号: G11C5/14 G11C7/00

    CPC分类号: G11C11/412 G11C11/413

    摘要: A static memory device includes a bit cell connected to an internal voltage line, and a power supply control circuit connected between the internal voltage line and a power supply voltage, wherein the power supply control circuit is configured to supply the power supply voltage level to the internal voltage line, and the power supply control circuit is configured to perform a write assist function that includes floating the internal voltage line during a write operation on the bit cell, the internal voltage line being floated in response to a signal of a mode control signal group.

    摘要翻译: 静态存储器件包括连接到内部电压线的位单元和连接在内部电压线和电源电压之间的电源控制电路,其中电源控制电路被配置为将电源电压电平提供给 内部电压线,并且电源控制电路被配置为执行写入辅助功能,其包括在对位单元的写入操作期间使内部电压线浮动,内部电压线响应于模式控制信号的信号而浮置 组。

    Memory device, test operation method thereof, and system including the same
    9.
    发明授权
    Memory device, test operation method thereof, and system including the same 有权
    存储器件,其测试操作方法和包括其的系统

    公开(公告)号:US08711641B2

    公开(公告)日:2014-04-29

    申请号:US13239111

    申请日:2011-09-21

    IPC分类号: G11C7/10

    摘要: A test operation method of a memory device includes a reference current generator generating a reference current and providing a reference voltage generated based on the reference current to one of input terminals of a sense amplifier; providing a read voltage generated based on a read current of a memory cell to another one of the input terminals of the sense amplifier; and the sense amplifier comparing the reference voltage with the read voltage.

    摘要翻译: 存储器件的测试操作方法包括产生参考电流的参考电流发生器,并且将基于参考电流生成的参考电压提供给读出放大器的一个输入端; 将基于存储器单元的读取电流产生的读取电压提供给读出放大器的另一个输入端; 并且读出放大器将参考电压与读取电压进行比较。

    Static memory device and static random access memory device
    10.
    发明授权
    Static memory device and static random access memory device 有权
    静态存储器件和静态随机存取存储器件

    公开(公告)号:US08018788B2

    公开(公告)日:2011-09-13

    申请号:US12382858

    申请日:2009-03-25

    IPC分类号: G11C5/14

    CPC分类号: G11C11/412 G11C11/413

    摘要: A static memory device includes a bit cell connected to an internal voltage line, and a power supply control circuit connected between the internal voltage line and a power supply voltage, wherein the power supply control circuit is configured to supply the power supply voltage level to the internal voltage line, and the power supply control circuit is configured to perform a write assist function that includes floating the internal voltage line during a write operation on the bit cell, the internal voltage line being floated in response to a signal of a mode control signal group.

    摘要翻译: 静态存储器件包括连接到内部电压线的位单元和连接在内部电压线和电源电压之间的电源控制电路,其中电源控制电路被配置为将电源电压电平提供给 内部电压线,并且电源控制电路被配置为执行写入辅助功能,其包括在对位单元的写入操作期间使内部电压线浮动,内部电压线响应于模式控制信号的信号而浮置 组。