SILICON-COMPATIBLE COMPOUND JUNCTIONLESS FIELD EFFECT TRANSISTOR
    2.
    发明申请
    SILICON-COMPATIBLE COMPOUND JUNCTIONLESS FIELD EFFECT TRANSISTOR 有权
    有机硅化合物无效场效应晶体管

    公开(公告)号:US20140131769A1

    公开(公告)日:2014-05-15

    申请号:US13653523

    申请日:2012-10-17

    IPC分类号: H01L29/786 H01L29/267

    摘要: The present invention provides a silicon-compatible compound junctionless field effect transistor enabled to be compatible to a bulk silicon substrate for substituting an expensive SOI substrate, to form a blocking semiconductor layer between a silicon substrate and an active layer by a semiconductor material having a specific difference of energy bandgap from that of the active layer to substitute a prior buried oxide for blocking a leakage current at an off-operation time and to form the active layer by a semiconductor layer having electron or hole mobility higher than that of silicon, and to operate perfectly as a junctionless device though the dopant concentration of the active layer is much lower than the prior junctionless device.

    摘要翻译: 本发明提供一种能兼容于体硅衬底的硅兼容化合物无连接场效应晶体管,用于代替昂贵的SOI衬底,通过具有特定的硅衬底的半导体材料在硅衬底和有源层之间形成阻挡半导体层 能量带隙与有源层的能隙的差异取代以前的掩埋氧化物以阻止在非工作时间的漏电流,并且通过具有高于硅的电子或空穴迁移率的半导体层形成有源层,并且 尽管有源层的掺杂剂浓度远低于现有的无连接器件,但它们作为无连接器件完美地工作。

    Translation Kinetic Mapping, Modification and Harmonization
    3.
    发明申请
    Translation Kinetic Mapping, Modification and Harmonization 审中-公开
    翻译动力学映射,修改与协调

    公开(公告)号:US20130149699A1

    公开(公告)日:2013-06-13

    申请号:US13664252

    申请日:2012-10-30

    IPC分类号: C07H21/02

    摘要: The profile of translation elongation rate along an mRNA is modulated in a directed manner by locally altering codon usage, in particular utilizing differences in ribosomal dwell times among pairs of synonymous codons translated by a single tRNA through wobble base pairing. Unlike codon optimization based on organism-specific codon frequencies or tRNA pools, the methods of the invention need not change the tRNA that translates the codon, rather modulating the interaction between a given tRNA and the mRNA coding sequence.

    摘要翻译: 通过局部改变密码子使用,特别是利用通过摆动碱基配对通过单个tRNA翻译的同义密码子对之间的核糖体停留时间的差异,以有向的方式调节沿着mRNA的翻译延伸率的分布。 与基于生物特异密码子频率或tRNA库的密码子优化不同,本发明的方法不需要改变翻译密码子的tRNA,而是调节给定tRNA和mRNA编码序列之间的相互作用。

    Method and system for operating electron guns in magnetic fields

    公开(公告)号:US20130035905A1

    公开(公告)日:2013-02-07

    申请号:US13622212

    申请日:2012-09-18

    IPC分类号: G06F17/50

    摘要: A method of configuring an electron gun for generating and injecting an electron beam into a linac accelerating waveguide operating in magnetic fringe fields of an MRI scanner in the absence of a magnetic shield is provided using an appropriately programmed computer to determining an anode drift tube diameter at an injection point of a linac according to a magnetic field value from an MRI scanner and to a predetermined current density, where the magnetic field has an isocenter, determining a transverse diameter of a Type M cathode in an electron gun, according to the anode drift tube diameter and the current density, and minimizing an emittance value in an electron beam of the electron gun at an entry point of the anode drift tube by optimizing the distance between the cathode and the anode, where the electron beam is along an axis of symmetry of the magnetic field.

    Scanning probe microscopy-based metrology tool with a vacuum partition
    10.
    发明申请
    Scanning probe microscopy-based metrology tool with a vacuum partition 审中-公开
    用真空分隔扫描探针显微镜计量工具

    公开(公告)号:US20130097740A1

    公开(公告)日:2013-04-18

    申请号:US13705701

    申请日:2012-12-05

    IPC分类号: G01Q60/10

    摘要: A method of monitoring of semiconductor processes is provided that includes monitoring the processes using a scanning probe microscope (SPM), where a first partition is located below a second partition, where the second partition is hermetically isolated from the first partition, where a SPM probe tip of the SPM is disposed in the first partition, where a remaining portion of the SPM is disposed in the second partition that is hermetically isolated from the first partition, and where the semiconductor processes may occur in either the first partition or a third partition.

    摘要翻译: 提供了一种监测半导体工艺的方法,其包括使用扫描探针显微镜(SPM)来监测过程,其中第一分区位于第二分区下方,其中第二分区与第一分区气密隔离,其中SPM探针 SPM的尖端设置在第一分区中,其中SPM的剩余部分设置在与第一分区气密隔离的第二分区中,并且半导体处理可以在第一分区或第三分区中发生。