Lithographic apparatus and device manufacturing method
    3.
    发明授权
    Lithographic apparatus and device manufacturing method 有权
    光刻设备和器件制造方法

    公开(公告)号:US07375353B2

    公开(公告)日:2008-05-20

    申请号:US11224303

    申请日:2005-09-13

    IPC分类号: G03F7/20 G03B27/72

    CPC分类号: G03F7/70191 G03F7/70083

    摘要: An attenuation adjustment device is disclosed that includes a plurality of members configured to cast penumbras in a radiation beam illuminating a patterning device in a lithography apparatus. Furthermore, an attenuation control device is provided to adjust the members in such a manner as to control the attenuation of the patterned radiation beam projected onto a target portion of a substrate across the cross-section of the patterned radiation beam. The attenuation control device includes a detector configured to provide an output indicative of the position of each member in dependence on detection of a beam of detecting radiation reaching the detector after attenuation by the member.

    摘要翻译: 公开了一种衰减调节装置,其包括多个构件,所述多个构件构造成在照射光刻设备中的图案形成装置的辐射束中浇铸半圆形。 此外,提供衰减控制装置以调节构件以控制在图案化的辐射束的横截面上投射到基板的目标部分上的图案化的辐射束的衰减。 所述衰减控制装置包括检测器,其被配置为根据检测到由所述构件衰减后到达所述检测器的辐射束的检测来提供指示每个构件的位置的输出。

    Lithographic apparatus and device manufacturing method
    4.
    发明申请
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US20070057201A1

    公开(公告)日:2007-03-15

    申请号:US11224303

    申请日:2005-09-13

    IPC分类号: G03F7/20

    CPC分类号: G03F7/70191 G03F7/70083

    摘要: An attenuation adjustment device is disposed in a radiation system of a lithography device and includes a plurality of members for casting penumbras in the radiation beam illuminating the patterning device. Furthermore an attenuation control device is provided for adjusting the members in such a manner as to control the attenuation of the patterned radiation beam projected onto the target portion of the substrate across the cross-section of the patterned radiation beam. The attenuation control device incorporates a detector for providing an output indicative of the position of each member in dependence on detection of a beam of detecting radiation reaching the angle detector after attenuation by the member.

    摘要翻译: 衰减调节装置设置在光刻装置的辐射系统中,并且包括多个用于在照射图案形成装置的辐射束中铸造半圆形的构件。 此外,提供衰减控制装置,用于以这样的方式调节构件,以便控制在图案化的辐射束的横截面上投射到基板的目标部分上的图案化的辐射束的衰减。 该衰减控制装置包括一个检测器,用于根据检测到被成员衰减后到达角度检测器的辐射束的检测,提供指示每个构件的位置的输出。

    Lithographic apparatus and device manufacturing method
    5.
    发明申请
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US20060139585A1

    公开(公告)日:2006-06-29

    申请号:US11022936

    申请日:2004-12-28

    IPC分类号: G03B27/68

    CPC分类号: G03F7/70266 G03F7/70825

    摘要: A lithographic apparatus is disclosed having a deformable lens element through which a patterned radiation beam is arranged to pass before reaching a substrate and having a deformable lens actuator configured to transmit a combination of a force substantially parallel to the optical axis of the projection system and a localized torque about an axis substantially perpendicular to the optical axis independently at a plurality of sub-regions on the deformable lens element.

    摘要翻译: 公开了一种光刻设备,其具有可变形透镜元件,图案化的辐射束通过该可变形透镜元件布置成在到达基板之前通过,并且具有被配置为透射基本上平行于投影系统的光轴的力的组合的可变形透镜致动器,以及 围绕可变形透镜元件上的多个子区域处于基本上垂直于光轴的轴线的局部扭矩。

    Lithographic apparatus and device manufacturing method
    6.
    发明授权
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US06819400B2

    公开(公告)日:2004-11-16

    申请号:US10386932

    申请日:2003-03-13

    IPC分类号: G03B2752

    摘要: A displacement measurement system constructed and arranged to measure the position of optical elements in a projection system of a lithographic projection apparatus makes use of the interferential measurement principle which involves use of a first diffraction grating mounted on the optical element and a second diffraction grating mounted on a reference frame.

    摘要翻译: 构造和布置为测量光刻投影设备的投影系统中的光学元件的位置的位移测量系统利用了干涉测量原理,其包括使用安装在光学元件上的第一衍射光栅和安装在光学元件上的第二衍射光栅 参考框架。

    Lithographic apparatus and device manufacturing method
    9.
    发明申请
    Lithographic apparatus and device manufacturing method 审中-公开
    平版印刷设备和器件制造方法

    公开(公告)号:US20070170376A1

    公开(公告)日:2007-07-26

    申请号:US11591673

    申请日:2006-11-02

    IPC分类号: G01J3/10

    CPC分类号: G03F7/70191 G03F7/70083

    摘要: An attenuation adjustment device is disclosed that includes a plurality of members configured to cast penumbras in a radiation beam illuminating a patterning device in a lithography apparatus. Furthermore, an attenuation control device may be provided to adjust the members in such a manner as to control attenuation of a radiation beam projected onto a target portion of a substrate across the cross-section of the radiation beam.

    摘要翻译: 公开了一种衰减调节装置,其包括多个构件,所述多个构件构造成在照射光刻设备中的图案形成装置的辐射束中浇铸半圆形。 此外,可以提供衰减控制装置以调节部件,以便控制在辐射束的横截面上投影到基板的目标部分上的辐射束的衰减。