STRUCTURES FORMED USING AN ADDITIVE MANUFACTURING PROCESS FOR REGENERATING SURFACE TEXTURE IN SITU

    公开(公告)号:US20220250203A1

    公开(公告)日:2022-08-11

    申请号:US17172152

    申请日:2021-02-10

    摘要: Embodiments of the present disclosure generally relate to structures formed using an additive manufacturing process, and more particularly, to polishing pads, and methods for manufacturing polishing pads, which may be used in a chemical mechanical polishing (CMP) process. The structures described herein are formed from a plurality of printed layers. The structure comprises a first material domain having a first material composition and a plurality of second material domains having a second material composition different from the first material composition. The first material domain is configured to have a first rate of removal and the plurality of second material domains are configured to have a different second rate of removal when an equivalent force is applied to a top surface of the first material domain and the plurality of second material domains.

    THIN PLASTIC POLISHING ARTICLE FOR CMP APPLICATIONS

    公开(公告)号:US20180207770A1

    公开(公告)日:2018-07-26

    申请号:US15875867

    申请日:2018-01-19

    摘要: A method and apparatus for polishing a substrate that includes a polishing article comprising a polymeric sheet having a raised surface texture, which is formed on the surface of the polymeric sheet is provided. According to one or more implementations of the present disclosure, an advanced polishing article has been developed, which does not require abrasive pad conditioning. In some implementations of the present disclosure, the advanced polishing article comprises a polymeric sheet having a polishing surface with a raised surface texture or “micro-features” and/or a plurality of grooves or “macro-features” formed in the polishing surface. In some implementations, the raised surface texture is embossed, etched, machined or otherwise formed in the polishing surface prior to installing and using the advanced polishing article in a polishing system. In one implementation, the raised features have a height within one order of magnitude of the features removed from the substrate during polishing.