摘要:
An apparatus for inspecting an electric component in an inverter circuit has a DC power supply for supplying a direct current to a given position in an inverter circuit, a voltage detector for detecting a voltage at a given position in the inverter circuit, a current detector for detecting a current flowing at a given position in the inverter circuit, a switching circuit for changing positions at which the direct current is supplied from the DC power supply, positions at which the voltage is detected by the voltage detector, and positions at which the current is detected by the current detector, and a controller for outputting a switching signal to the switching circuit. The switching circuit is controlled by the controller to charge an electrolytic capacitor in an inverter circuit with a current from the DC power supply. The electrolytic capacitor is determined as to its quality by determining whether the calculated electrolytic capacitance of the electrolytic capacitor falls within a preset range or not. Each of the transistors of the inverter circuit is determined as to its quality by determining whether an V.sub.CE -I.sub.C curve thereof falls in a preset range or not. The electrolytic capacitor, the transistors, and also diodes connected across the transistors can be determined as to whether they are acceptable or not while they are being connected in the inverter circuit.
摘要:
A method and apparatus for inspecting a transistor in an inverter circuit includes turning on only the transistor of the inverter circuit. A predetermined collector current is supplied to the transistor until a transistor junction temperature reaches a predetermined temperature. The transistor is acceptable if a difference between a transistor collector-to-emitter voltage when the predetermined collector current is supplied and a transistor collector-to-emitter voltage when the junction temperature reaches the predetermined temperature falls within a preset range. Switching elements of the inverter circuit are controlled to supply a current through a resistor to charge an electrolytic capacitor of the inverter circuit. A voltage across the electrolytic capacitor during charging and a time period is measured from the beginning of charging until a time when a voltage across the electrolytic capacitor attains a predetermined voltage. An electrostatic capacitance of the electrolytic capacitor is determined based on the measured time period and a resistance value of the resistor. The electrolytic capacitor is discharged and a discharging voltage and current are measured. An equivalent series resistance of the electrolytic capacitor is determined based upon the voltage of the electrolytic capacitor at the beginning of discharge, the electrolytic capacitance and the measured discharge voltage and current.
摘要:
An apparatus for inspecting an electric component in an inverter circuit has a DC power supply for supplying a direct current to a given position in an inverter circuit, a voltage detector for detecting a voltage at a given position in the inverter circuit, a current detector for detecting a current flowing at a given position in the inverter circuit, a switching circuit for changing positions at which the direct current is supplied from the DC power supply, positions at which the voltage is detected by the voltage detector, and positions at which the current is detected by the current detector, and a controller for outputting a switching signal to the switching circuit. The switching circuit is controlled by the controller to charge an electrolytic capacitor in an inverter circuit with a current from the DC power supply. The electrolytic capacitor is determined as to its quality by determining whether the calculated electrolytic capacitance of the electrolytic capacitor falls within a preset range or not. Each of the transistors of the inverter circuit is determined as to its quality by determining whether an V.sub.CE -I.sub.C curve thereof falls in a preset range or not. The electrolytic capacitor, the transistors, and also diodes connected across the transistors can be determined as to whether they are acceptable or not while they are being connected in the inverter circuit.
摘要:
A semiconductor device includes an intermediate layer provided between a semiconductor element and a heat sink. The intermediate layer moderates thermal stress resulting from a difference between thermal expansion of the semiconductor element and thermal expansion of the heat sink arising due to heat produced by the semiconductor element. This thermal stress moderation reduces warping of the semiconductor device as a whole.
摘要:
A semiconductor device includes an intermediate layer provided between a semiconductor element and a heat sink. The intermediate layer moderates thermal stress resulting from a difference between thermal expansion of the semiconductor element and thermal expansion of the heat sink arising due to heat produced by the semiconductor element. This thermal stress moderation reduces warping of the semiconductor device as a whole.
摘要:
A semiconductor device (11) having a switching function of being turned on or off according to a voltage (Vge) of a driving signal supplied to a gate thereof is driven by generating a feedback voltage (VFE) based on a time change (dI/dt) of a collector current (Ic) of the semiconductor device (11) and applying the feedback voltage (VFE) as part of the voltage (Vge) of the driving signal when the semiconductor device (11) is switched from on to off.
摘要:
A turn-off feedback unit (23OFF) of a semiconductor device driving unit generates a feedback voltage as part of a voltage of a drive signal for establishing electrical continuity or disconnection in a bus according to a temporal variation of a collector current of a first semiconductor device (11U) when the first semiconductor device (11U) is turned off from on. A turn-on feedback unit (23ON) generates the feedback voltage according to a commutation current flowing through a free wheeling diode (12D) connected to a second semiconductor device (11D) when the first semiconductor device (11U) is turned on from off.
摘要:
A semiconductor device (11) having a switching function of being turned on or off according to a voltage (Vge) of a driving signal supplied to a gate thereof is driven by generating a feedback voltage (VFE) based on a time change (dI/dt) of a collector current (Ic) of the semiconductor device (11) and applying the feedback voltage (VFE) as part of the voltage (Vge) of the driving signal when the semiconductor device (11) is switched from on to off.
摘要:
A turn-off feedback unit (23OFF) of a semiconductor device driving unit generates a feedback voltage as part of a voltage of a drive signal for establishing electrical continuity or disconnection in a bus according to a temporal variation of a collector current of a first semiconductor device (11U) when the first semiconductor device (11U) is turned off from on. A turn-on feedback unit (23ON) generates the feedback voltage according to a commutation current flowing through a free wheeling diode (12D) connected to a second semiconductor device (11D) when the first semiconductor device (11U) is turned on from off.
摘要:
A turn-off feedback unit (23OFF) of a semiconductor device driving unit generates a feedback voltage as part of a voltage of a drive signal for establishing electrical continuity or disconnection in a bus according to a temporal variation of a collector current of a first semiconductor device (11U) when the first semiconductor device (11U) is turned off from on. A turn-on feedback unit (23ON) generates the feedback voltage according to a commutation current flowing through a free wheeling diode (12D) connected to a second semiconductor device (11D) when the first semiconductor device (11U) is turned on from off.