公开(公告)号：US08324725B2

公开(公告)日：2012-12-04

申请号：US11160477

申请日：2005-06-24

申请人： Igor Y. Khandros ,  Charles A. Miller ,  Bruce J. Barbara ,  Barbara Vasquez

发明人： Igor Y. Khandros ,  Charles A. Miller ,  Bruce J. Barbara ,  Barbara Vasquez

IPC分类号： H01L23/485 ,  H01L21/00 ,  H01L25/16 ,  H01L25/065

CPC分类号： H01L24/48 ,  H01L23/13 ,  H01L24/49 ,  H01L24/73 ,  H01L25/0657 ,  H01L2224/05554 ,  H01L2224/05599 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/32245 ,  H01L2224/48091 ,  H01L2224/48145 ,  H01L2224/48147 ,  H01L2224/48227 ,  H01L2224/48465 ,  H01L2224/4911 ,  H01L2224/73215 ,  H01L2224/73265 ,  H01L2224/85186 ,  H01L2225/06506 ,  H01L2225/0651 ,  H01L2225/06527 ,  H01L2225/06555 ,  H01L2225/06562 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01014 ,  H01L2924/01031 ,  H01L2924/01033 ,  H01L2924/01082 ,  H01L2924/15787 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2224/45099 ,  H01L2924/00012 ,  H01L2924/00

摘要： Semiconductor dies are stacked offset from one another so that terminals located along two edges of each die are exposed. The two edges of the dies having terminals may be oriented in the same direction. Electrical connections may connect terminals on one die with terminals on another die, and the stack may be disposed on a wiring substrate to which the terminals of the dies may be electrically connected.

摘要翻译： 半导体管芯彼此堆叠地堆叠，使得沿着每个管芯的两个边缘定位的端子被暴露。 具有端子的模具的两个边缘可以沿相同的方向定向。 电连接可以将一个管芯上的端子连接到另一个管芯上的端子，并且堆叠可以设置在可以电连接管芯的端子的布线基板上。

公开(公告)号：US20100039739A1

公开(公告)日：2010-02-18

申请号：US12606788

申请日：2009-10-27

申请人： Bruce J. Barbara ,  Charles A. Miller

发明人： Bruce J. Barbara ,  Charles A. Miller

IPC分类号： H02H9/00

CPC分类号： G01R1/36 ,  G01R31/2889

摘要： A fault detection and protection circuit can include a comparing circuit (e.g., a comparator or a detector) that can be connected to a power line supplying power to an electronic device being tested. The comparing circuit can be configured to detect a fault in which the power line is shorted to ground. For example, the electronic device being tested may have a fault in which its power terminals are shorted to ground. Upon detection of such a fault, the comparing circuit activates one or more switches that shunt capacitors or other energy storage devices on the power line to ground. The comparing circuit may alternatively or in addition activate one or more switches that disconnect the power supply supplying power to the electronic device under test from probes contacting the electronic device.

摘要翻译： 故障检测和保护电路可以包括比较电路（例如，比较器或检测器），其可以连接到向所测试的电子设备供电的电力线。 比较电路可以被配置为检测电力线短路到地的故障。 例如，被测试的电子设备可能具有其电源端子短路到地的故障。 在检测到这种故障时，比较电路激活将电力线上的电容器或其他能量存储装置分流到地的一个或多个开关。 比较电路可以替代地或者另外激活一个或多个开关，该开关断开供给被测试的电子设备的电源与接触电子设备的探针的电源。

公开(公告)号：US07609080B2

公开(公告)日：2009-10-27

申请号：US11306186

申请日：2005-12-19

申请人： Charles A. Miller ,  Bruce J. Barbara

发明人： Charles A. Miller ,  Bruce J. Barbara

IPC分类号： G01R31/26

CPC分类号： G01R1/36 ,  G01R31/2889

摘要： A fault detection and protection circuit can include a comparing circuit (e.g., a comparator or a detector) that can be connected to a power line supplying power to an electronic device being tested. The comparing circuit can be configured to detect a fault in which the power line is shorted to ground. For example, the electronic device being tested may have a fault in which its power terminals are shorted to ground. Upon detection of such a fault, the comparing circuit activates one or more switches that shunt capacitors or other energy storage devices on the power line to ground. The comparing circuit may alternatively or in addition activate one or more switches that disconnect the power supply supplying power to the electronic device under test from probes contacting the electronic device.

摘要翻译： 故障检测和保护电路可以包括比较电路（例如，比较器或检测器），其可以连接到向所测试的电子设备供电的电力线。 比较电路可以被配置为检测电力线短路到地的故障。 例如，被测试的电子设备可能具有其电源端子短路到地的故障。 在检测到这种故障时，比较电路激活将电力线上的电容器或其他能量存储装置分流到地的一个或多个开关。 比较电路可以替代地或者另外激活一个或多个开关，该开关断开供给被测试的电子设备的电源与接触电子设备的探针的电源。

公开(公告)号：US07863915B2

公开(公告)日：2011-01-04

申请号：US12547260

申请日：2009-08-25

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： G01R31/02

CPC分类号： G01R31/2875 ,  G01R1/06727 ,  G01R1/07385 ,  G01R31/2886 ,  G01R31/2891

摘要： A probe card cooling assembly for use in a test system includes a package with one or more dies cooled by direct cooling. The cooled package includes one or more dies with active electronic components and at least one coolant port that allows a coolant to enter the high-density package and directly cool the active electronic components of the dies during a testing operation.

摘要翻译： 用于测试系统的探针卡冷却组件包括具有通过直接冷却冷却的一个或多个模具的封装。 冷却的包装包括具有有源电子部件的一个或多个模具和允许冷却剂进入高密度封装并且在测试操作期间直接冷却模具的有效电子部件的至少一个冷却剂端口。

公开(公告)号：US07825652B2

公开(公告)日：2010-11-02

申请号：US12273408

申请日：2008-11-18

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： G01R31/28

CPC分类号： G01R31/3008

摘要： A system is provided to enable leakage current measurement or parametric tests to be performed with an isolation buffer provided in a channel line. Multiple such isolation buffers are used to connect a single signal channel to multiple lines. Leakage current measurement is provided by providing a buffer bypass element, such as a resistor or transmission gate, between the input and output of each buffer. The buffer bypass element can be used to calibrate buffer delay out of the test system by using TDR measurements to determine the buffer delay based on reflected pulses through the buffer bypass element. Buffer delay can likewise be calibrated out by comparing measurements of a buffered and non-buffered channel line, or by measuring a device having a known delay.

摘要翻译： 提供了一种系统，用于使泄漏电流测量或参数测试能够与通道线中提供的隔离缓冲器一起进行。 多个这样的隔离缓冲器用于将单个信号通道连接到多条线路。 泄漏电流测量通过在每个缓冲器的输入和输出之间提供缓冲旁路元件（例如电阻器或传输门）来提供。 缓冲旁路元件可用于通过使用TDR测量来确定缓冲器延迟，以通过缓冲旁路元件反射的脉冲来校准测试系统中的缓冲延迟。 同样可以通过比较缓冲和非缓冲通道线的测量值，或通过测量具有已知延迟的器件来校准缓冲器延迟。

公开(公告)号：USD620353S1

公开(公告)日：2010-07-27

申请号：US29327125

申请日：2008-10-31

申请人： Steven J. Block ,  Brad Burlison ,  Charles A. Miller ,  Paul Richardson ,  Raymond L. Zacher

设计人： Steven J. Block ,  Brad Burlison ,  Charles A. Miller ,  Paul Richardson ,  Raymond L. Zacher

公开(公告)号：US20100017662A1

公开(公告)日：2010-01-21

申请号：US12569584

申请日：2009-09-29

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： G06F11/00

CPC分类号： G01R35/005 ,  G01R31/3016 ,  G01R31/31723 ,  G01R31/318511 ,  G01R31/3191 ,  G01R31/31937

摘要： A series of pulses may be driven down each drive channel, which creates a series of composite pulses at the output of the buffer. Each composite pulse is a composition of the individual pulses driven down the drive channels. Timing offsets associated with the drive channels may be adjusted until the individual pulses of the composite pulse align or closely align. Those timing offsets calibrate and/or deskew the drive channels, compensating for differences in the propagation delays through the drive channels. The composite pulse may be feed back to the tester through compare channels, and offsets associated with compare signals for each compare channel may be aligned to the composite pulse, which calibrates and/or deskews the compare channels.

摘要翻译： 可以沿着每个驱动通道驱动一系列脉冲，这在缓冲器的输出端产生一系列复合脉冲。 每个复合脉冲是从驱动通道驱动的各个脉冲的组合。 可以调整与驱动通道相关联的定时偏移，直到复合脉冲的各个脉冲对准或紧密对准。 这些定时偏移校准和/或校正驱动通道，补偿通过驱动通道传播延迟的差异。 复合脉冲可以通过比较通道反馈给测试仪，并且与每个比较通道的比较信号相关的偏移量可以与校准和/或对比比较通道的复合脉冲对准。

公开(公告)号：US20090251162A1

公开(公告)日：2009-10-08

申请号：US12485677

申请日：2009-06-16

申请人： Igor Y. Khandros ,  Benjamin N. Eldridge ,  Charles A. Miller ,  A. Nicholas Sporck

发明人： Igor Y. Khandros ,  Benjamin N. Eldridge ,  Charles A. Miller ,  A. Nicholas Sporck

IPC分类号： G01R31/02

CPC分类号： G01R1/0491 ,  G01R1/073 ,  G01R31/3025

摘要： A base controller disposed in a test cassette receives test data for testing a plurality of electronic devices. The base controller wirelessly transmits the test data to a plurality of wireless test control chips, which write the test data to each of the electronic devices. The wireless test control chips then read response data generated by the electronic devices, and the wireless test control chips wirelessly transmit the response data to the base controller.

摘要翻译： 设置在测试盒中的基本控制器接收用于测试多个电子设备的测试数据。 基站控制器将测试数据无线传输到多个无线测试控制芯片，其将测试数据写入每个电子设备。 然后，无线测试控制芯片读取由电子设备产生的响应数据，无线测试控制芯片将响应数据无线发送到基本控制器。

公开(公告)号：US07579847B2

公开(公告)日：2009-08-25

申请号：US11112034

申请日：2005-04-22

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： G01R31/02 ,  G01R31/26

CPC分类号： G01R31/2875 ,  G01R1/06727 ,  G01R1/07385 ,  G01R31/2886 ,  G01R31/2891

摘要： A probe card cooling assembly for use in a test system includes a package with one or more dies cooled by direct cooling. The cooled package includes one or more dies with active electronic components and at least one coolant port that allows a coolant to enter the high-density package and directly cool the active electronic components of the dies during a testing operation.

摘要翻译： 用于测试系统的探针卡冷却组件包括具有通过直接冷却冷却的一个或多个模具的封装。 冷却的包装包括具有有源电子部件的一个或多个模具和允许冷却剂进入高密度封装并且在测试操作期间直接冷却模具的有效电子部件的至少一个冷却剂端口。

公开(公告)号：US20090134895A1

公开(公告)日：2009-05-28

申请号：US12259785

申请日：2008-10-28

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： G01R31/02 ,  H01R43/00 ,  G01R1/067

CPC分类号： G01R31/2889 ,  G01R1/07314 ,  G01R1/07378 ,  G01R31/31905 ,  Y10T29/49117

摘要： A probe system for providing signal paths between an integrated circuit (IC) tester and input/output, power and ground pads on the surfaces of ICs to be tested includes a probe board assembly, a flex cable and a set of probes arranged to contact the IC's I/O pads. The probe board assembly includes one or more rigid substrate layers with traces and vias formed on or within the substrate layers providing relatively low bandwidth signal paths linking the tester to probes accessing some of the IC's pads. The flex cable provides relatively high bandwidth signal paths linking the tester to probes accessing others of the IC's pads.

摘要翻译： 用于在集成电路（IC）测试器和要测试的IC的表面上的输入/输出，电源和接地焊盘之间提供信号路径的探针系统包括探针板组件，柔性电缆和一组探针， IC的I / O焊盘。 探针板组件包括一个或多个刚性衬底层，其具有形成在衬底层上或衬底层内的迹线和通孔，其提供将测试器连接到访问IC的一些衬垫的探针的相对低带宽的信号路径。 柔性电缆提供相对高带宽的信号路径，将测试仪连接到访问IC其他焊盘的探针。