摘要:
An integrated circuit memory is disclosed which has its primary memory array arranged into blocks and which has redundant columns, each of which can replace a column in any one of the blocks. The redundant columns are selected by way of a redundant column decoder, associated with each column. A plurality of redundant sense amplifiers are each associated with selected redundant columns. Each of the redundant column decoders includes a set of fuses for storing the column address responsive to which its associated redundant column is to be selected. The coupling of each redundant sense amplifier is controlled by a redundant multiplexer associated with each of the input/output terminals. Each redundant multiplexer receives the redundant column select signals from each redundant column decoder corresponding thereto, and includes fuses which indicate if its input/output terminal is to be placed in communication with its associated sense amplifier upon selection of a redundant column.
摘要:
A circuit includes a volatile memory array and a logic circuit operable to detect a memory array tamper situation and generate at least one control signal responsive thereto. Circuitry associated with each of the individual cells within the volatile memory array responds to the at least one control signal by destroying any data stored by the associated memory cell. Data is destroyed using one of several options including: shorting a true node of the latch to a complement node of the latch, shorting the true and complement nodes of the latch to a bit line and a complement bit line, shorting one of the true/complement nodes of the latch to a reference voltage, shorting both the true and complement nodes of the latch to at least one reference voltage, coupling a first and second positive reference voltage inputs to a positive/ground voltage supply, or shorting the bit line to a reference voltage while the pass gate is activated.
摘要:
An integrated circuit and method for providing a switchover from the primary power source to the secondary power source to prevent a volatile element from losing stored data. The integrated circuit includes a forced power source switchover circuit for detecting that the supply level of the primary power source drops below a predefined threshold level. A switchover circuit on the integrated circuit initiates a switchover operation based upon the forced power source switchover circuit detecting that the supply level being received from the primary power source drops below the predefined threshold level. The detection by the forced power source switchover circuitry may occur on a signal level that transitions faster than a predetermined negative rate of change. The integrated circuit may be incorporated in any system having volatile elements, such as memory or a clock.
摘要:
A substantially noise-free address input buffer for an asynchronous device, such as a static random access memory (SRAM). The input buffer generates both a logical true and complement representation of an address input signal and includes timing circuitry to place the logical true and complement signals in the same deasserting logical state for a predetermined period of time prior to asserting either the logical true signal or the logical complement signal, in response to a signal edge transition appearing on the address input signal. The input buffer further includes edge transition detection (ETD) circuitry for generating an initialization signal in response to the generation of the logical true and complement signals.
摘要:
A substantially noise-free data input buffer for an asynchronous device, such as a static random access memory (SRAM). The input buffer generates either a logical true or complement output signal representation of a data input signal and includes timing circuitry to delay an edge transition on the output signal for a predetermined period of time in response to a signal edge transition appearing on the data input signal. The input buffer further includes edge transition detection (ETD) circuitry for generating an initialization signal in response to the generation of the data output signal.
摘要:
A reference voltage trim circuit includes a voltage follower receiving the reference voltage to be trimmed, with one or more resistive loads providing predefined voltage shifts serially connected between the output of the voltage follower and the output of the trim circuit. The voltage follower includes a current mirror differential amplifier receiving the reference voltage at one input and the output of the voltage follower at the other input, and a transistor with a resistive load connected between the power supply voltages and receiving the output of the current mirror differential amplifier at the transistor's gate. The resistive loads provide varying preselected voltage drop and are each shunted by corresponding fuses, with the entire series of resistive loads shunted by a master fuse. To trim the reference voltage, at least the master fuse is blown, together with the fuse(s) shunting resistive loads which combine to result in the desired trim voltage. Pass gates control which end of the resistive load series is connected to the output of the voltage follower and which is connected to the output of the trim circuit. To decrement the reference voltage, a first end is connected to the output of the voltage follower and the second end is connected to trim circuit output; to increment the reference voltage, the second end of the resistive load series is connected to the voltage follower output and the first end is connected to the trim circuit output.
摘要:
A control circuit for terminating a memory access cycle in a memory block having at least one memory cell is disclosed. The at least one memory cell has unique process characteristics. The control circuit includes a memory block activation circuit for generating a memory block activation signal. The memory block activation circuit includes a reset circuit for terminating the memory block activation signal when activated. The control circuit also includes a memory access cycle tracking circuit, responsive to the memory block activation signal, for generating a reset signal. The memory access cycle tracking circuit includes the unique process characteristics of the at least one memory cell for tracking an operation of the at least one memory cell. The reset signal activates the reset circuit so as to terminate the memory block activation signal and terminate the memory access cycle in the memory block.
摘要:
An integrated circuit device such as an SRAM operating in a battery backup mode, or operating in a quiescent mode when deselected in the operation of a portable electronic device, includes a power dissipation control circuit that reduces the voltage on an internal power supply node so that the memory array is powered at a minimum level sufficient to retain the data stored therein intact.
摘要:
A semiconductor integrated-circuit die includes a substrate of semiconductor material that has an edge. A conductive layer is disposed on the substrate, and a first insulator layer is disposed between the said substrate and the conductive layer. A functional circuit is disposed in the die. A conductive path is disposed beneath the insulator layer and is coupled to the circuit, the conductive path having an end portion that is located substantially at the edge of the substrate. The wafer on which the die is disposed has one or more signal lines that run along the scribe lines of the wafer. Before the die is scribed from the wafer, the conductive path couples the circuit on the die to one of these signal lines. The end portion of the conductive path is formed when the die is scribed from the wafer.
摘要:
A circuit and method for varying the time of a write cycle. A variable timer circuit is provided coupled to a write simulation circuit. The write simulation circuit receives a signal from a start write sensing circuit indicating that data is being written to memory cells of the array. The write simulation circuit includes a memory cell replicate which replicates the time required for writing data to memory cells of the array. After the memory cell replicate has changed state, a signal is output via a switching circuit to the variable timer circuit for generation of a write termination signal. The memory cells are tested at various write cycle speeds by controlling the variable timer circuit. The variable timer circuit is set to terminate the write as quickly as possible after a successful write to the memory cells has been completed. The time interval for permitting a write can be selectively controlled over a large range to provide extremely fast devices or somewhat slower devices, all of which operate faster than standard devices on the market and thus are in high demand.