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    Film, backlight displays, and methods for making the same
    1.
    发明授权
    Film, backlight displays, and methods for making the same 有权
    电影，背光显示及其制作方法

    公开(公告)号：US07859759B2

    公开(公告)日：2010-12-28

    申请号：US12141674

    申请日：2008-06-18

    申请人： Dennis Joseph Coyle ,  Eugene George Olczak ,  Masako Yamada ,  Scott Michael Miller ,  Nitin Garg

    发明人： Dennis Joseph Coyle ,  Eugene George Olczak ,  Masako Yamada ,  Scott Michael Miller ,  Nitin Garg

    IPC分类号： G02B27/10

    CPC分类号： G02B6/0053 ,  G02B5/045 ,  G02B6/0061 ,  G02F1/133606 ,  G02F1/133611 ,  G02F2001/133607

    摘要： In one embodiment a film can comprises a surface comprising a plurality of prism structures. Each prism structure has a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures. The plurality of prism structures can have a variation in the w direction of prism peak height that is discrete and/or continuous. In one embodiment, a method for making a film can comprise forming a plurality of prism structures on a surface. The plurality of prism structures can have a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures, and wherein the plurality of prism structures have a variation in the w direction of prism peak height that is discrete and/or continuous.

    摘要翻译： 在一个实施例中，膜可以包括包括多个棱镜结构的表面。 每个棱镜结构在w方向上具有小于或等于棱镜结构的平均间距的±20％的横向调制。 多个棱镜结构可以具有离散和/或连续的棱镜峰高的w方向的变化。 在一个实施例中，制造薄膜的方法可以包括在表面上形成多个棱镜结构。 多个棱镜结构可以在w方向上具有小于或等于棱镜结构的平均间距的±20％的横向调制，并且其中多个棱镜结构具有棱镜峰高的w方向的变化 这是离散和/或连续的。

    FILM, BACKLIGHT DISPLAYS, AND METHODS FOR MAKING THE SAME
    3.
    发明申请
    FILM, BACKLIGHT DISPLAYS, AND METHODS FOR MAKING THE SAME 有权
    电影，背光显示及其制作方法

    公开(公告)号：US20090052045A1

    公开(公告)日：2009-02-26

    申请号：US12141674

    申请日：2008-06-18

    申请人： Dennis Joseph Coyle ,  Eugene George Olczak ,  Masako Yamada ,  Scott Michael Miller ,  Nitin Garg

    发明人： Dennis Joseph Coyle ,  Eugene George Olczak ,  Masako Yamada ,  Scott Michael Miller ,  Nitin Garg

    IPC分类号： G02B27/12

    CPC分类号： G02B6/0053 ,  G02B5/045 ,  G02B6/0061 ,  G02F1/133606 ,  G02F1/133611 ,  G02F2001/133607

    摘要： In one embodiment a film can comprises a surface comprising a plurality of prism structures. Each prism structure has a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures. The plurality of prism structures can have a variation in the w direction of prism peak height that is discrete and/or continuous. In one embodiment, a method for making a film can comprise forming a plurality of prism structures on a surface. The plurality of prism structures can have a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures, and wherein the plurality of prism structures have a variation in the w direction of prism peak height that is discrete and/or continuous.

    摘要翻译： 在一个实施例中，膜可以包括包括多个棱镜结构的表面。 每个棱镜结构在w方向上具有小于或等于棱镜结构的平均间距的±20％的横向调制。 多个棱镜结构可以具有离散和/或连续的棱镜峰高的w方向的变化。 在一个实施例中，制造薄膜的方法可以包括在表面上形成多个棱镜结构。 多个棱镜结构可以在w方向上具有小于或等于棱镜结构的平均间距的±20％的横向调制，并且其中多个棱镜结构具有棱镜峰高的w方向的变化 这是离散和/或连续的。

    Integrated inspection system and defect correction method
    4.
    发明授权
    Integrated inspection system and defect correction method 失效
    综合检测系统和缺陷校正方法

    公开(公告)号：US07371590B2

    公开(公告)日：2008-05-13

    申请号：US11285331

    申请日：2005-11-21

    申请人： Kevin Patrick Capaldo ,  Mark Allen Cheverton ,  Dennis Joseph Coyle ,  Michael John Davis ,  Sameer Kirti Talsania ,  Masako Yamada ,  Chung-hei Yeung

    发明人： Kevin Patrick Capaldo ,  Mark Allen Cheverton ,  Dennis Joseph Coyle ,  Michael John Davis ,  Sameer Kirti Talsania ,  Masako Yamada ,  Chung-hei Yeung

    IPC分类号： H01L21/66

    CPC分类号： G01N21/95 ,  G01N21/8422 ,  G01N21/8806

    摘要： A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.

    摘要翻译： 用于微复制光学显示膜制造工艺中的缺陷校正的检查系统和校正处理。 制造主机，来自主机的多个垫片以及来自每个垫片的多个显示胶片的工艺步骤与系统缺陷识别和校正处理相结合。 每个主要制造步骤都有自己的检测系统和校正过程，其中反馈和分析该过程的缺陷信息; 并从该分析中调整子过程以消除或减少检测到的缺陷。 将系统缺陷确定为其源，然后在相应子过程的校正步骤中反馈并分析，以固化缺陷的根部。

    Integrated inspection system and defect correction method
    8.
    发明申请
    Integrated inspection system and defect correction method 失效
    综合检测系统和缺陷校正方法

    公开(公告)号：US20070117225A1

    公开(公告)日：2007-05-24

    申请号：US11285331

    申请日：2005-11-21

    申请人： Kevin Capaldo ,  Mark Cheverton ,  Dennis Coyle ,  Michael Davis ,  Sameer Talsania ,  Masako Yamada ,  Chung-hei Yeung

    发明人： Kevin Capaldo ,  Mark Cheverton ,  Dennis Coyle ,  Michael Davis ,  Sameer Talsania ,  Masako Yamada ,  Chung-hei Yeung

    IPC分类号： H01L21/66

    CPC分类号： G01N21/95 ,  G01N21/8422 ,  G01N21/8806

    摘要： A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.

    摘要翻译： 用于微复制光学显示膜制造工艺中的缺陷校正的检查系统和校正处理。 制造主机，来自主机的多个垫片以及来自每个垫片的多个显示胶片的工艺步骤与系统缺陷识别和校正处理相结合。 每个主要制造步骤都有自己的检测系统和校正过程，其中反馈和分析该过程的缺陷信息; 并从该分析中调整子过程以消除或减少检测到的缺陷。 将系统缺陷确定为其源，然后在相应子过程的校正步骤中反馈并分析，以固化缺陷的根部。