摘要:
A semiconductor chip has shapes on a particular level that are small enough to require a first mask and a second mask, the first mask and the second mask used in separate exposures during processing. A circuit on the semiconductor chip requires close tracking between a first and a second FET (field effect transistor). For example, the particular level may be a gate shape level. Separate exposures of gate shapes using the first mask and the second mask will result in poorer FET tracking (e.g., gate length, threshold voltage) than for FETs having gate shapes defined by only the first mask. FET tracking is selectively improved by laying out a circuit such that selective FETs are defined by the first mask. In particular, static random access memory (SRAM) design benefits from close tracking of six or more FETs in an SRAM cell.
摘要:
A circuit and method erase at power-up all data stored in a DRAM chip for increased data security. All the DRAM memory cells are erased by turning on the transistors for the DRAM storage cells simultaneously by increasing the body voltage of cells. In the example circuit, the body voltage is increased by a charge pump controlled by a power-on-reset (POR) signal applying a voltage to the p-well of the memory cells. The added voltage to the p-well lowers the threshold voltage of the cell, such that the NFET transistor of the memory cell will turn on. With all the devices turned on, the data stored in the memory cells is erased as the voltage of all the cells connected to a common bitline coalesce to a single value.
摘要:
A circuit and method erase at power-up all data stored in a DRAM chip for increased data security. All the DRAM memory cells are erased by turning on the transistors for the DRAM storage cells simultaneously by increasing the body voltage of cells. In the example circuit, the body voltage is increased by a charge pump controlled by a power-on-reset (POR) signal applying a voltage to the p-well of the memory cells. The added voltage to the p-well lowers the threshold voltage of the cell, such that the NFET transistor of the memory cell will turn on. With all the devices turned on, the data stored in the memory cells is erased as the voltage of all the cells connected to a common bitline coalesce to a single value.
摘要:
A circuit and method increases the repeatability of physically undetectable functions (PUFs) by enhancing the variation of signal delay through two delay chains during chip burn-in. A burn-in circuit holds the inputs of the two delay chains at opposite random values during the burn-in process. All the PFETs in the delay chains with a low value at the input will be burned in with a higher turn on voltage. Since the PFETs affected in the two delay chains are driven by opposite transitions at burn-in, alternating sets of delay components in the two delay chains are affected by the burn-in cycle. Under normal operation, both of the delay chains see the same input so only one chain has an increase in delay to achieve a statistically reliable difference in the two delay paths thereby increasing the overall repeatability of the PUF circuit.
摘要:
A circuit and method increases the repeatability of physically undetectable functions (PUFs) by enhancing the variation of signal delay through two delay chains during chip burn-in. A burn-in circuit holds the inputs of the two delay chains at opposite random values during the burn-in process. All the PFETs in the delay chains with a low value at the input will be burned in with a higher turn on voltage. Since the PFETs affected in the two delay chains are driven by opposite transitions at burn-in, alternating sets of delay components in the two delay chains are affected by the burn-in cycle. Under normal operation, both of the delay chains see the same input so only one chain has an increase in delay to achieve a statistically reliable difference in the two delay paths thereby increasing the overall repeatability of the PUF circuit.
摘要:
A method and wordline voltage boosting circuit for implementing boosted wordline voltage in memories, and a design structure on which the subject circuit resides are provided. The wordline voltage boosting circuit receives a precharge signal, uses a switching transistor coupled to a bootstrap capacitor, and generates a boosted voltage level responsive to the precharge signal. The boosted voltage level is applied to a voltage supply of an output stage of a wordline driver, causing the wordline voltage level of a selected wordline to be boosted. The switching transistor is controlled by the precharge signal and a node of the bootstrap capacitor supplying the boosted voltage level is driven high by the switching transistor.
摘要:
A method and wordline voltage boosting circuit for implementing boosted wordline voltage in memories, and a design structure on which the subject circuit resides are provided. The wordline voltage boosting circuit receives a precharge signal, uses a switching transistor coupled to a bootstrap capacitor, and generates a boosted voltage level responsive to the precharge signal. The boosted voltage level is applied to a voltage supply of an output stage of a wordline driver, causing the wordline voltage level of a selected wordline to be boosted. The switching transistor is controlled by the precharge signal and a node of the bootstrap capacitor supplying the boosted voltage level is driven high by the switching transistor.
摘要:
A low power level shifter circuit includes an input inverter operating in a domain of a first voltage supply. The input inverter receives an input signal and provides a first inverted signal. An output inverter operating in a domain of a second voltage supply coupled to the input inverter and provides an output signal having a voltage level corresponding to the second voltage supply and a logic value corresponding to the input signal. The second voltage supply is higher than the first voltage supply. A leakage current control circuit includes a finisher transistor connected between the second voltage supply and the input to the output inverter and a path control transistor control a path between the first voltage supply and the input inverter.
摘要:
A low power level shifter circuit for integrated circuits, and a design structure on which the subject circuit resides are provided. The low power level shifter circuit includes an input inverter operating in a domain of a first voltage supply. The input inverter receives an input signal and provides a first inverted signal. An output inverter operating in a domain of a second voltage supply coupled to the input inverter and provides an output signal having a voltage level corresponding to the second voltage supply and a logic value corresponding to the input signal. The second voltage supply is higher than the first voltage supply. A leakage current control circuit includes a finisher transistor connected between the second voltage supply and the input to the output inverter and a path control transistor control a path between the first voltage supply and the input inverter.
摘要:
A low power level shifter circuit for high performance integrated circuits includes an input inverter operating in a domain of a first voltage supply and receiving an input signal and a design structure on which the subject circuit resides is provided. An output stage operating in a domain of a higher second voltage supply includes a first output inverter connected to the input inverter and a second output inverter connected in series with the first output inverter. The second output inverter provides a level shifted output signal having a voltage level corresponding to the second voltage supply. A series connected finisher transistor and finisher control transistor are connected between the second voltage supply and an input to the first output inverter. The finisher control transistor is activated responsive to the input signal. A path control transistor controls a path between the first voltage supply and the input inverter. The path control transistor being activated responsive to the level shifted output signal.