Method for exposing a substrate, patterning device, and lithographic apparatus
    3.
    发明申请
    Method for exposing a substrate, patterning device, and lithographic apparatus 审中-公开
    曝光基板,图案形成装置和光刻装置的方法

    公开(公告)号:US20050134820A1

    公开(公告)日:2005-06-23

    申请号:US10740830

    申请日:2003-12-22

    IPC分类号: G03B27/54 G03F7/20

    摘要: A method using a lithographic apparatus comprising a reflective integrator is claimed that optimizes the exposure of features on a target area of a substrate, when the features make an angle between 5 and 85 degrees with respect to the target area. The method comprises rotating the reflective integrator with respect to the target area providing a rotated mirror-symmetric pupil shape, which is implemented by either rotating the substrate or rotating the reflective integrator with respect to the machine or the patterning device. The patterning device comprises a maximum usable area and a patterned area which are rotated with respect to each other if a rotated substrate is employed. The method can be used in single exposure or double exposure mode. A further advantage of the method of using a rotated wafer is that it can be used for exposing features on a substrate in any direction even when the projection system of the lithographic apparatus shows a preferred polarization direction.

    摘要翻译: 要求使用包括反射积分器的光刻设备的方法,当特征相对于目标区域形成5至85度的角度时,可优化基板目标区域上的特征的曝光。 该方法包括使反射积分器相对于目标区域旋转,从而提供旋转的对称瞳孔形状,其通过旋转基底或相对于机器或图案形成装置旋转反射积分器来实现。 如果使用旋转的衬底,则图案形成装置包括相对于彼此旋转的最大可用面积和图案化区域。 该方法可用于单次曝光或双曝光模式。 使用旋转晶片的方法的另一个优点是,即使当光刻设备的投影系统显示优选的偏振方向时,其可以用于在任何方向上曝光衬底上的特征。