公开(公告)号：US10991796B2

公开(公告)日：2021-04-27

申请号：US16231671

申请日：2018-12-24

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Lin Hu ,  Veeraraghavan S. Basker ,  Brian J. Greene ,  Kai Zhao ,  Daniel Jaeger ,  Keith Tabakman ,  Christopher Nassar

IPC: H01L29/06 ,  H01L29/417 ,  H01L29/66 ,  H01L21/8234 ,  H01L29/78

Abstract: A dielectric fill layer within source/drain metallization trenches limits the depth of an inlaid metallization layer over isolation regions of a semiconductor device. The modified geometry decreases parasitic capacitance as well as the propensity for electrical short circuits between the source/drain metallization and adjacent conductive structures, which improves device reliability and performance.

公开(公告)号：US20210141610A1

公开(公告)日：2021-05-13

申请号：US16677717

申请日：2019-11-08

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Judson R. Holt ,  Julien Frougier ,  Ryan W. Sporer ,  George R. Mulfinger ,  Daniel Jaeger

IPC: G06F7/58 ,  H04L9/32 ,  H01L29/772 ,  H01L27/07 ,  H01L21/8234

Abstract: Disclosed is a structure for implementing a Physically Unclonable Function (PUF)-based random number generator and a method for forming the structure. The structure includes same-type, same-design devices in a semiconductor layer. While values of a performance parameter exhibited by some devices (i.e., first devices) are within a range established based on the design, values of the same performance parameter exhibited by other devices (i.e., second devices) is outside that range. A random distribution of the first and second devices is achieved by including randomly patterned dopant implant regions in the semiconductor layer. Each first device is separated from the dopant implant regions such that its performance parameter value is within the range and each second device has a junction with dopant implant region(s) such that its performance parameter value is outside the range or vice versa. A random number generator can be operably connected to the devices to generate a PUF-based random number.

公开(公告)号：US10971625B2

公开(公告)日：2021-04-06

申请号：US16458178

申请日：2019-06-30

Applicant: GLOBALFOUNDRIES U.S. INC.

Inventor： Michael V Aquilino ,  Daniel Jaeger ,  Man Gu ,  Bradley Morgenfeld ,  Haiting Wang ,  Kavya Sree Duggimpudi ,  Wang Zheng

IPC: H01L29/08 ,  H01L27/112 ,  H01L29/78 ,  H01L21/822 ,  H01L29/66

Abstract: A semiconductor device is provided, which includes an array of active regions, gate stacks and substantially uniform epitaxial structures. The gate stacks of the array include a first gate stack and a second gate stack over an active region. An active pillar between the first gate stack and the second gate stack, and the active pillar separating two substantially uniform epitaxial structures. A contact structure over the active pillar, positioned equidistant from the first gate stack and the second gate stack.

公开(公告)号：US11907685B2

公开(公告)日：2024-02-20

申请号：US16677717

申请日：2019-11-08

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Judson R. Holt ,  Julien Frougier ,  Ryan W. Sporer ,  George R. Mulfinger ,  Daniel Jaeger

IPC: H04L9/32 ,  G06F7/58 ,  H04L9/08 ,  G06F21/00 ,  G06F21/73 ,  G06F21/72 ,  G06F21/76 ,  H01L21/02 ,  H01L27/088

CPC classification number: G06F7/588 ,  G06F21/00 ,  G06F21/72 ,  G06F21/73 ,  G06F21/76 ,  H01L21/02233 ,  H04L9/0866 ,  H04L9/3278 ,  H01L27/088 ,  H04L2209/12

Abstract: Disclosed is a structure for implementing a Physically Unclonable Function (PUF)-based random number generator and a method for forming the structure. The structure includes same-type, same-design devices in a semiconductor layer. While values of a performance parameter exhibited by some devices (i.e., first devices) are within a range established based on the design, values of the same performance parameter exhibited by other devices (i.e., second devices) is outside that range. A random distribution of the first and second devices is achieved by including randomly patterned dopant implant regions in the semiconductor layer. Each first device is separated from the dopant implant regions such that its performance parameter value is within the range and each second device has a junction with dopant implant region(s) such that its performance parameter value is outside the range or vice versa. A random number generator can be operably connected to the devices to generate a PUF-based random number.