公开(公告)号：USRE41879E1

公开(公告)日：2010-10-26

申请号：US12155392

申请日：2008-06-03

申请人： Shunichi Iwanari ,  Masahiko Sakagami ,  Hiroshige Hirano ,  Tetsuji Nakakuma ,  Takashi Miki ,  Yasushi Gohou ,  Kunisato Yamaoka ,  Yasuo Murakuki

发明人： Shunichi Iwanari ,  Masahiko Sakagami ,  Hiroshige Hirano ,  Tetsuji Nakakuma ,  Takashi Miki ,  Yasushi Gohou ,  Kunisato Yamaoka ,  Yasuo Murakuki

IPC分类号： G11C16/06

CPC分类号： G11C11/4076 ,  G11C7/1051 ,  G11C7/1063 ,  G11C2207/229

摘要： Provided is a semiconductor memory device compatible with a SRAM and capable of a high-speed data transfer operation while maintaining data reliability. An access to a memory core 6 starts when an external chip enable signal XCE performs a falling transition. Simultaneously, an external write enable signal XWE and an external address signal ADD are received, and a memory cell 1, in the memory core 6, corresponding to the received external address signal ADD is selected. When a data read-out from the memory cell 1 or a data write-in to the memory cell 1 is complete, a rewrite timer 7 is activated in accordance with a rising transition of an external chip enable signal XCE or a rising transition of the external write enable signal XWE for performing a data rewrite for the memory cell 1.

摘要翻译： 提供了与SRAM兼容的半导体存储器件，并且能够在保持数据可靠性的同时进行高速数据传输操作。 当外部芯片使能信号XCE执行下降转换时，对存储器核心6的访问开始。 同时，接收外部写入使能信号XWE和外部地址信号ADD，并且选择与存储器核心6中对应于所接收的外部地址信号ADD的存储单元1。 当从存储器单元1读出的数据或对存储器单元1的数据写入完成时，根据外部芯片使能信号XCE的上升转变或者上升沿的转换激活重写定时器7 用于对存储单元1执行数据重写的外部写使能信号XWE。

公开(公告)号：US07136313B2

公开(公告)日：2006-11-14

申请号：US11121939

申请日：2005-05-05

申请人： Yasuo Murakuki ,  Hiroshige Hirano ,  Yasushi Gohou ,  Masahiko Sakagami ,  Kunisato Yamaoka ,  Shunichi Iwanari ,  Tetsuji Nakakuma ,  Takashi Miki

发明人： Yasuo Murakuki ,  Hiroshige Hirano ,  Yasushi Gohou ,  Masahiko Sakagami ,  Kunisato Yamaoka ,  Shunichi Iwanari ,  Tetsuji Nakakuma ,  Takashi Miki

IPC分类号： G11C7/00 ,  G11C8/00

CPC分类号： G11C29/816 ,  G11C11/22 ,  G11C29/789 ,  G11C2029/4402

摘要： To provide a semiconductor storage device which can adapt to assembly processes involving different treatment temperatures, can become unrewritable when rewriting of data by the user is prohibited, negates the necessity for developing different semiconductor storage devices, and lowers development cost.A semiconductor storage device is provided with, as areas for storing faulty address information indicating a faulty area and operation mode setting information about the semiconductor storage device, a first setting function storage area 103 formed from electrically-rewritable nonvolatile memory and a second setting function storage area 102 formed from once-rewritable nonvolatile memory. Transfer of faulty address information to a faulty address register 111 and transfer of operation mode setting information to an operation mode register 110 are selectively performed.

摘要翻译： 为了提供可以适应涉及不同处理温度的装配过程的半导体存储装置，当用户重写数据被禁止时，可以变得不可改变，否定了开发不同的半导体存储装置的必要性，并且降低了开发成本。 半导体存储装置设置有用于存储指示故障区域的有缺陷的地址信息和关于半导体存储装置的操作模式设置信息的区域，由可重写非易失性存储器和第二设置功能存储器形成的第一设置功能存储区域103 区域102由一次性可重写的非易失性存储器形成。 选择性地执行将故障地址信息传送到故障地址寄存器111和将操作模式设置信息传送到操作模式寄存器110。

公开(公告)号：US5953277A

公开(公告)日：1999-09-14

申请号：US037864

申请日：1998-03-10

申请人： Toshio Mukunoki ,  Hiroshige Hirano ,  George Nakane ,  Tetsuji Nakakuma ,  Tatsumi Sumi ,  Nobuyuki Moriwaki

发明人： Toshio Mukunoki ,  Hiroshige Hirano ,  George Nakane ,  Tetsuji Nakakuma ,  Tatsumi Sumi ,  Nobuyuki Moriwaki

IPC分类号： G11C14/00 ,  G11C5/14 ,  G11C7/06 ,  G11C7/14 ,  G11C7/22 ,  G11C11/22 ,  G11C11/401 ,  G11C7/02

CPC分类号： G11C11/22 ,  G11C5/147 ,  G11C7/06 ,  G11C7/14 ,  G11C7/22

摘要： A reference potential generator is constituted of two signal lines 21 and 22; a charge supplying circuit to supply charge to signal lines 21 and 22; a first connection circiut 24a and 24b connecting the charge supplying circuit 23 and two signal lines 21 and 22 in order to supply charge to the two signal lines; and a second connection circuit 25 connecting two signal lines 21 and 22 together by the second control signal, and two signal lines are disconnected after the potentials of the two signal lines determined by the supplied charge and each of load capacitances of signal lines are averaged. A semiconductor memory device of the invention incorporating the above reference potential generator generating an exact reference potential, is able to amplify and output the potential difference between the reference potential and the potential of data readout in the bit line, and by this, "1" or "0" of readout data can be precisely determined.

摘要翻译： 参考电位发生器由两条信号线21和22组成; 用于向信号线21和22提供电荷的充电提供电路; 连接充电电路23和两条信号线21和22的第一连接电路24a和24b，以向两条信号线提供电荷; 以及通过第二控制信号将两条信号线21和22连接在一起的第二连接电路25，在由所提供的电荷确定的两个信号线的电位和信号线的每个负载电容的平均值之后，两条信号线断开。 结合上述参考电位发生器产生精确参考电位的本发明的半导体存储器件能够放大并输出参考电位与位线中的数据读出电位之间的电位差，由此“1” 或读出数据的“0”。

公开(公告)号：US5751650A

公开(公告)日：1998-05-12

申请号：US724664

申请日：1996-10-01

申请人： Hiroshige Hirano ,  Tetsuji Nakakuma

发明人： Hiroshige Hirano ,  Tetsuji Nakakuma

IPC分类号： G11C5/06 ,  G11C11/22

CPC分类号： G11C11/22 ,  G11C5/063

摘要： In an electric signal supply circuit, a signal generating source and a plurality of circuit cells are connected to each other by a wire line through resistors. Signal wire lines from the signal generating source to the respective circuit cells are formed in the form of a pyramid, and therefore, delay time differences to the circuit cells are reduced. Since delay time differences in a signal to the circuit cells from the signal generating source which is disposed at ends of the plurality of circuit cells are smaller, a circuit operation is stable.

摘要翻译： 在电信号供给电路中，信号发生源和多个电路单元通过电阻线通过有线线连接。 从信号发生源到各个电路单元的信号线以金字塔的形式形成，因此减小了对电路单元的延迟时间差。 由于设置在多个电路单元的端部的来自信号发生源的电路单元的信号的延迟时间差较小，电路操作稳定。

公开(公告)号：US5546342A

公开(公告)日：1996-08-13

申请号：US322543

申请日：1994-10-13

申请人： George Nakane ,  Toshio Mukunoki ,  Nobuyuki Moriwaki ,  Tatsumi Sumi ,  Hiroshige Hirano ,  Tetsuji Nakakuma

发明人： George Nakane ,  Toshio Mukunoki ,  Nobuyuki Moriwaki ,  Tatsumi Sumi ,  Hiroshige Hirano ,  Tetsuji Nakakuma

IPC分类号： G11C14/00 ,  G11C7/10 ,  G11C11/22 ,  G11C7/00

CPC分类号： G11C7/1006

摘要： The life of a semiconductor memory device can be prolonged by using a plurality of memory cells and decreasing the stress applied to the dielectric film of the memory cells storing a data value "1." This is achieved in the present invention by decreasing the number of rewritings required to retain stored data. Specifically, the present invention utilizes a reverse and rewrite means to reverse and rewrite data back into memory cells after being read, memory means for memorizing a signal indicating whether the currently stored data is in a reversed state, and judging means for judging whether the data should be reversely output.

摘要翻译： 通过使用多个存储单元并减小施加到存储数据值“1”的存储单元的电介质膜的应力，可以延长半导体存储器件的寿命。 这通过减少保留存储数据所需的重写次数在本发明中实现。 具体地，本发明利用反向和重写装置在读取之后将数据反转并重写到存储器单元中，用于存储指示当前存储的数据是否处于反转状态的信号的存储装置，以及用于判断数据 应该反向输出。

公开(公告)号：US07184344B2

公开(公告)日：2007-02-27

申请号：US11062826

申请日：2005-02-23

申请人： Tetsuji Nakakuma ,  Hiroshige Hirano

发明人： Tetsuji Nakakuma ,  Hiroshige Hirano

IPC分类号： G11C7/00

CPC分类号： G11C7/12 ,  G11C7/065 ,  G11C11/419 ,  G11C2207/002 ,  H01L27/105 ,  H01L27/1052 ,  H01L27/10897

摘要： A semiconductor device includes a differential sense amplifier connected to a bit line, and a data transfer circuit including a column selection switch for turning ON/OFF the connection between a data line and the bit line. The semiconductor device incorporates one of the following features: the on-state resistance of the column selection switch being higher than that of a transistor array of the differential sense amplifier; separate provision of two column selection switches, one for read operation and the other for write operation; provision of a bit line additional capacitance and a connection control switch therefor; and provision of a data line dividing switch.

摘要翻译： 一种半导体器件包括连接到位线的差分读出放大器，以及数据传输电路，包括用于接通/断开数据线与位线之间的连接的列选择开关。 半导体器件包含以下特征之一：列选择开关的导通电阻高于差分读出放大器的晶体管阵列的导通电阻; 单独提供两个列选择开关，一个用于读操作，另一个用于写操作; 提供位线附加电容及其连接控制开关; 并提供数据线分割开关。

公开(公告)号：US20050265090A1

公开(公告)日：2005-12-01

申请号：US11121939

申请日：2005-05-05

申请人： Yasuo Murakuki ,  Hiroshige Hirano ,  Yasushi Gohou ,  Masahiko Sakagami ,  Kunisato Yamaoka ,  Shunichi Iwanari ,  Tetsuji Nakakuma ,  Takashi Miki

发明人： Yasuo Murakuki ,  Hiroshige Hirano ,  Yasushi Gohou ,  Masahiko Sakagami ,  Kunisato Yamaoka ,  Shunichi Iwanari ,  Tetsuji Nakakuma ,  Takashi Miki

IPC分类号： G11C11/22 ,  G11C7/00 ,  G11C29/00 ,  G11C29/12

CPC分类号： G11C29/816 ,  G11C11/22 ,  G11C29/789 ,  G11C2029/4402

摘要： To provide a semiconductor storage device which can adapt to assembly processes involving different treatment temperatures, can become unrewritable when rewriting of data by the user is prohibited, negates the necessity for developing different semiconductor storage devices, and lowers development cost. A semiconductor storage device is provided with, as areas for storing faulty address information indicating a faulty area and operation mode setting information about the semiconductor storage device, a first setting function storage area 103 formed from electrically-rewritable nonvolatile memory and a second setting function storage area 102 formed from once-rewritable nonvolatile memory. Transfer of faulty address information to a faulty address register 111 and transfer of operation mode setting information to an operation mode register 110 are selectively performed.

摘要翻译： 为了提供可以适应涉及不同处理温度的装配过程的半导体存储装置，当用户重写数据被禁止时，可以变得不可改变，否定了开发不同的半导体存储装置的必要性，并且降低了开发成本。 半导体存储装置设置有用于存储指示故障区域的有缺陷的地址信息和关于半导体存储装置的操作模式设置信息的区域，由可重写非易失性存储器和第二设置功能存储器形成的第一设置功能存储区域103 区域102由一次性可重写的非易失性存储器形成。 选择性地执行将故障地址信息传送到故障地址寄存器111和将操作模式设置信息传送到操作模式寄存器110。

公开(公告)号：US20050141307A1

公开(公告)日：2005-06-30

申请号：US11062826

申请日：2005-02-23

申请人： Tetsuji Nakakuma ,  Hiroshige Hirano

发明人： Tetsuji Nakakuma ,  Hiroshige Hirano

IPC分类号： H01L21/8242 ,  G11C7/06 ,  G11C11/407 ,  G11C11/409 ,  G11C11/419 ,  H01L21/8239 ,  H01L27/105 ,  H01L27/108 ,  G11C11/34

CPC分类号： G11C7/12 ,  G11C7/065 ,  G11C11/419 ,  G11C2207/002 ,  H01L27/105 ,  H01L27/1052 ,  H01L27/10897

摘要： A semiconductor device includes a differential sense amplifier connected to a bit line, and a data transfer circuit including a column selection switch for turning ON/OFF the connection between a data line and the bit line. The semiconductor device incorporates one of the following features: the on-state resistance of the column selection switch being higher than that of a transistor array of the differential sense amplifier; separate provision of two column selection switches, one for read operation and the other for write operation; provision of a bit line additional capacitance and a connection control switch therefor; and provision of a data line dividing switch.

公开(公告)号：US5523974A

公开(公告)日：1996-06-04

申请号：US344680

申请日：1994-11-21

申请人： Hiroshige Hirano ,  George Nakane ,  Tetsuji Nakakuma ,  Nobuyuki Moriwaki ,  Toshio Mukunoki ,  Tatsumi Sumi

发明人： Hiroshige Hirano ,  George Nakane ,  Tetsuji Nakakuma ,  Nobuyuki Moriwaki ,  Toshio Mukunoki ,  Tatsumi Sumi

IPC分类号： G11C11/401 ,  G11C11/22 ,  G11C29/00 ,  G11C29/04 ,  G11C7/00

CPC分类号： G11C29/789

摘要： A semiconductor memory device comprises a main memory cell, a redundant memory cell, a redundant address data cell comprising a non-volatile memory which electrically memorizes an address of a redundant memory cell which replaced a failed memory cell in the main memory cell, a control circuit 15 and a redundant memory cell selecting circuit 16. The redundant memory cell selecting circuit serves to hold first address data which has been read from the redundant address data cell, and to compare the first address data with second address data for a read or write operation which is input via the control circuit and thereby select the main memory cell or the redundant memory cell.

摘要翻译： 半导体存储器件包括主存储器单元，冗余存储器单元，冗余地址数据单元，其包括非易失性存储器，其电存储代替主存储单元中的故障存储器单元的冗余存储器单元的地址;控制器 电路15和冗余存储单元选择电路16.冗余存储单元选择电路用于保存从冗余地址数据单元读取的第一地址数据，并将第一地址数据与用于读或写的第二地址数据进行比较 通过控制电路输入的操作，从而选择主存储单元或冗余存储单元。

公开(公告)号：US07307866B2

公开(公告)日：2007-12-11

申请号：US11132196

申请日：2005-05-19

申请人： Kunisato Yamaoka ,  Hiroshige Hirano ,  Yasushi Gohou ,  Shunichi Iwanari ,  Yasuo Murakuki ,  Masahiko Sakagami ,  Tetsuji Nakakuma ,  Takashi Miki

发明人： Kunisato Yamaoka ,  Hiroshige Hirano ,  Yasushi Gohou ,  Shunichi Iwanari ,  Yasuo Murakuki ,  Masahiko Sakagami ,  Tetsuji Nakakuma ,  Takashi Miki

IPC分类号： G11C11/22 ,  G11C11/42 ,  G11C5/14 ,  G11C7/00 ,  G11C7/02

CPC分类号： G11C11/22

摘要： A ferroelectric memory of the present invention comprises: a plurality of normal cells, each of which includes a first ferroelectric capacitor for holding data and a first transistor connected to a first electrode of the first ferroelectric capacitor; a first bit line connected to the first transistor; a first bit line precharge circuit which is a switch circuit provided between the first bit line and a ground; and a word line connected to a gate of the first transistor. The word line is deactivated to disconnect the first ferroelectric capacitor from the first bit line before the first bit line precharge circuit is driven to discharge a potential of the first bit line.

摘要翻译： 本发明的铁电存储器包括：多个正常单元，每个单元包括用于保持数据的第一铁电电容器和连接到第一铁电电容器的第一电极的第一晶体管; 连接到第一晶体管的第一位线; 第一位线预充电电路，其是设置在第一位线和地之间的开关电路; 以及连接到第一晶体管的栅极的字线。 在驱动第一位线预充电电路以放电第一位线的电位之前，字线被去激活以将第一铁电电容器与第一位线断开。