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公开(公告)号：US20230168293A1
公开(公告)日：2023-06-01
申请号：US17457166
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Bernhard Gstoettenbauer , Georg Georgakos , Dirk Hammerschmidt , Veit Kleeberger , Ludwig Rossmeier , Rafael Zalman , Thomas Zettler
CPC classification number: G01R31/2642 , G01R31/2815
Abstract: In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the circuit function under the aggravated conditions, and outputting a predictive alert based on predicting the potential future problem.
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公开(公告)号：US11821935B2
公开(公告)日：2023-11-21
申请号：US17457207
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Dirk Hammerschmidt , Bernhard Gstoettenbauer , Rafael Zalman , Thomas Zettler , Georg Georgakos , Ludwig Rossmeier , Veit Kleeberger
CPC classification number: G01R31/2642 , G01R31/2815
Abstract: In some examples, this disclosure describes a method of operating a circuit. The method may comprise performing a circuit function under normal operating conditions, wherein performing the circuit function under the normal operating conditions includes performing at least a portion of the circuit functions via a characteristic circuit, performing at least the portion of the circuit function under enhanced stress conditions via a characteristic circuit replica, and predicting a potential future problem with the circuit function under the normal conditions based on an evaluation of operation of the characteristic circuit relative to operation of the characteristic circuit replica.
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公开(公告)号：US11301328B2
公开(公告)日：2022-04-12
申请号：US16667140
申请日：2019-10-29
Applicant: Infineon Technologies AG
Inventor： Veit Kleeberger , Rafael Zalman
IPC: G06F11/14
Abstract: A method for operating a microcontroller, which includes a processor and a peripheral circuit on a common chip, the method including initiating a process in the peripheral circuit, in the peripheral circuit generating recovery data, executing the process, checking whether the process has been executed successfully and, in the event that the check reveals that the process has not been executed successfully, generating recovered data from the recovery data, and executing the process again.
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公开(公告)号：US20180260280A1
公开(公告)日：2018-09-13
申请号：US15456870
申请日：2017-03-13
Applicant: Infineon Technologies AG
Inventor： Boyko Traykov , Veit Kleeberger , Rafael Zalman
IPC: G06F11/14
CPC classification number: G06F11/1441 , G06F11/1438 , G06F11/2221 , G06F11/2284
Abstract: A microcontroller system includes a processing unit, a first peripheral having a first set of registers, and an assurance module. The first peripheral is configured to receive a first reset signal that resets the first set of registers to a first actual reset value, which is expected to be a first expected value. The assurance module is configured to calculate a first signature value, which is based on the first actual reset value, in response to the first reset signal. The processing unit is configured to perform a first comparison between the calculated first signature value and a pre-determined first signature value to determine whether the microcontroller system is in a trusted safety state. The first comparison is performed in response to the first reset signal, and the pre-determined first signature value is based on the first expected value.
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公开(公告)号：US12254254B2
公开(公告)日：2025-03-18
申请号：US17457216
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Veit Kleeberger , Rafael Zalman , Georg Georgakos , Dirk Hammerschmidt , Bernhard Gstoettenbauer , Ludwig Rossmeier , Thomas Zettler
IPC: G06F30/3308 , G01R31/26 , G01R31/27 , G06F11/00 , G06F30/33 , G06F30/333 , G06F30/367 , G06F119/02 , G06F119/18
Abstract: In some examples, a method of operating a circuit is described. The method may include performing a circuit function and estimating a probability of failure of the circuit based on one or more stress origination metrics, one or more stress victim events, and one or more initial state conditions.
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Patent Agency Ranking
公开(公告)号：US11829227B2
公开(公告)日：2023-11-28
申请号：US16985509
申请日：2020-08-05
Applicant: Infineon Technologies AG
Inventor： Veit Kleeberger , Rafael Zalman
IPC: G11C29/38 , G06F11/07 , H03K3/0233 , H03K19/1776 , H03K19/17756 , H03K19/096 , G06F13/16
CPC classification number: G06F11/0772 , G06F11/076 , G06F11/0757 , G06F13/1605 , G11C29/38 , H03K3/0233 , H03K19/096 , H03K19/1776 , H03K19/17756
Abstract: A method for configuring a storage circuit, including: writing data via an input line into the storage circuit by a software write access; writing a bit-wise inverted form of the data via the input line into the storage circuit by a subsequent software write access; and generating an error signal if a comparison based on the written data and the written bit-wise inverted form of the data indicates a storage circuit configuration error, wherein the storage circuit permits hardware read access and lacks software read access.
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公开(公告)号：US11609265B1
公开(公告)日：2023-03-21
申请号：US17457198
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Ludwig Rossmeier , Georg Georgakos , Bernhard Gstoettenbauer , Dirk Hammerschmidt , Veit Kleeberger , Rafael Zalman , Thomas Zettler
IPC: G01R31/28
Abstract: In some examples, a circuit may be configured to perform a method that includes performing a circuit function via a circuit function unit of a circuit, receiving sensor data from one or more sensors associated with the circuit function unit, and estimating a remaining life of the circuit based on an accelerated reliability model and the sensor data, wherein the sensor data comprises input to the accelerated reliability model. The circuit itself may include a dedicated circuit unit that estimates the remaining life of the circuit based on an accelerated reliability model and the sensor data, and the circuit may output one or more predictive alerts or predictive faults when the remaining life is below a threshold, which may prompt the system for predictive maintenance on the circuit.
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公开(公告)号：US11733288B2
公开(公告)日：2023-08-22
申请号：US17457166
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Bernhard Gstoettenbauer , Georg Georgakos , Dirk Hammerschmidt , Veit Kleeberger , Ludwig Rossmeier , Rafael Zalman , Thomas Zettler
CPC classification number: G01R31/2642 , G01R27/02 , G01R27/08 , G01R27/14 , G01R31/2815 , G01L1/20 , G01L1/205 , G01L1/2262
Abstract: In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the circuit function under the aggravated conditions, and outputting a predictive alert based on predicting the potential future problem.
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公开(公告)号：US20230169249A1
公开(公告)日：2023-06-01
申请号：US17457183
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Thomas Zettler , Rafael Zalman , Georg Georgakos , Dirk Hammerschmidt , Ludwig Rossmeier , Bernhard Gstoettenbauer , Veit Kleeberger
IPC: G06F30/3308
CPC classification number: G06F30/3308
Abstract: In some examples, a method comprises performing a circuit function via a circuit; and estimating a remaining life of the circuit. Moreover, estimating the remaining life of the circuit may include measuring one or more circuit parameters over a period of time during operation of the circuit, and estimating the remaining life of the circuit based on the one or more measured circuit parameters over the period of time during operation of the circuit.
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10.发明公开公开(公告)号：US20230168294A1
公开(公告)日：2023-06-01
申请号：US17457207
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Dirk Hammerschmidt , Bernhard Gstoettenbauer , Rafael Zalman , Thomas Zettler , Georg Georgakos , Ludwig Rossmeier , Veit Kleeberger
CPC classification number: G01R31/2642 , G01R31/2815
Abstract: In some examples, this disclosure describes a method of operating a circuit. The method may comprise performing a circuit function under normal operating conditions, wherein performing the circuit function under the normal operating conditions includes performing at least a portion of the circuit functions via a characteristic circuit, performing at least the portion of the circuit function under enhanced stress conditions via a characteristic circuit replica, and predicting a potential future problem with the circuit function under the normal conditions based on an evaluation of operation of the characteristic circuit relative to operation of the characteristic circuit replica.
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