摘要:
Techniques are described that can extend the transmission rate over cable. Multiple cables can be used to increase the transmission rate. The transmission standard applied for each cable can be an Ethernet backplane standard such as IEEE 802.3ap (2007). Data can be assigned to virtual lanes prior to transmission over a cable. Forward error correction may be applied to each virtual lane prior to transmission over cable. Forward error correction may be negotiated over a single virtual lane and then applied to all virtual lanes.
摘要:
Techniques are described that can extend the transmission rate over cable. Multiple cables can be used to increase the transmission rate. The transmission standard applied for each cable can be an Ethernet backplane standard such as IEEE 802.3ap (2007). Data can be assigned to virtual lanes prior to transmission over a cable. Forward error correction may be applied to each virtual lane prior to transmission over cable. Forward error correction may be negotiated over a single virtual lane and then applied to all virtual lanes.
摘要:
A hand-held test probe is employed which uses a capacitance measuring circuit to measure capacitance as the probe is scanned along a pattern of conductors (pads or pins) at a steady rate. The capacitance measurement is stored in a memory during the scan, then maximums are detected in the stored data, corresponding to the conductor pattern. If a particular conductor has a short or a break in continuity, its capacitance will be more or less than it should be. The detected maximums are compared with recorded values for a known-good printed wiring board for this scan pattern. If the comparison shows a difference greater than a selected threshold, an error is indicated for this pin location. The known-good is scanned in a "learn" mode, in which the capacitance values are stored for each scan, identified by scan number.
摘要:
Methods and apparatus for Ethernet auto-negotiation (AN) with parallel detect for 10G DAC or other non-auto-negotiated modes. AN base pages are transmitted from an Ethernet apparatus to advertise the ability to support at least one Institute of Electrical and Electronics Engineers (IEEE) 802.3 Ethernet specification supporting AN. A receiver and associated processing circuitry is configured to perform two detection modes in parallel, including a first detection mode that looks for a valid signal transmitted from an Ethernet link peer that does not support AN and a second detection mode looking for AN pages from an IEEE 802.3 Ethernet link peer that supports AN. If the link peer does not support AN, an Ethernet link is set up to use signaling in accordance with the Ethernet specification that does not support AN. If the link peer supports AN, an Ethernet link is set up using a corresponding IEEE 802.3 Ethernet link supporting AN. Supported non-AN Ethernet links include 10G DAC links.
摘要:
Technologies for capabilities exchange include a network port logic having a communication link coupled to a remote link partner. The port logic transmits local host loss information to the link partner and receives remote host loss information from the link partner. The port logic may communicate the host loss information via an autonegotiation base page, an autonegotiation next page, or a PMD control frame. The port logic determines total channel loss based on the local host loss, the remote host loss, and cable loss. The port logic may bring the communication link up without forward error correction (FEC) if the total channel loss is less than a FEC limit, may bring the link up with FEC if the total loss is less than a specification limit, or may not bring the link up if the total channel loss is above the specification limit. Other embodiments are described and claimed.
摘要:
Electrical test method and apparatus for performing the method. The method operates to determine an electrical characteristic of a node (2) disposed upon a surface of a substrate (3), such as a printed wiring board (PWB). The method includes a first step of providing relative motion between a probe (1) and the surface of the PWB. A second step measures the electrical characteristic during a time that there is relative motion between the probe and the surface of the PWB. In one embodiment of the invention the step of measuring measures capacitance while in another embodiment of the invention the step of measuring measures charge capacity. The step of providing relative motion, in one embodiment of the invention, includes the steps of maintaining the PWB stationary while linearly translating the probe over the surface. In another embodiment of the invention the step of providing relative motion includes the steps of maintaining the probe stationary while moving the PWB.
摘要:
A transmission line for a clock input for a digital device. In the prior art, a clock signal was fed to a digital device on a transmission line. It was found that, when the clock frequency was doubled, the clock pulses received by the device became unacceptable. The invention lengthened the transmission line, rather than shortening it, and thereby removed the unacceptable features of the clock pulses.
摘要:
Method for determining the characteristic impedance of a transmission line on a printed wiring board using time domain reflectometry. The method involves selecting a driving point in time, selecting an undisturbed interval, measuring voltage at predetermined time intervals across the undisturbed interval, determining from the measured voltages a curve representative of such voltages, and determining the voltage on the representative curve at the driving point. The characteristic impedance of the transmission line under test, denoted by Z.sub.0, is obtained by using the "driving point" of the transmission line as the reference plane for the impedance measurements.
摘要:
A method and apparatus for converting skew in a received signal to a low frequency voltage. A signal is received at a destination node from an original signal from a source node. A unity time-voltage sawtooth ramp signal is created at the destination node. The amplitude of the unity time-voltage sawtooth ramp signal is a value in voltage proportional to a pulse width value of the original signal. The unity time-voltage sawtooth ramp signal starts just before the start of the received signal. A skew time is measured from the start of the unity time-voltage sawtooth ramp signal to a threshold level on an edge of the received signal. The measured skew time is correlated to a voltage level on the unity time-voltage sawtooth ramp. The measured skew time for each edge is converted into a pulse where the voltage level of each pulse being proportional to the measured skew.
摘要:
A computer baseboard providing localized support for high pin count, high density components. The baseboard includes a first circuit board capable of supporting low pin count electrical components. The first circuit board has a surface onto which the low pin count electrical components are mounted, and an area to which a second, smaller, circuit board is connected in a parallel arrangement with the first circuit board. The second circuit board has a first surface onto which high pin count electrical components are mounted, and a second surface physically and electrically connected to the area on said first substrate. The first and second circuit boards together provide support for electrical components having higher pin counts and densities than the first circuit board can support individually, such as high performance microprocessors and chipsets. The first circuit board may be a low circuit density substrate while the second circuit board is a high circuit density substrate or multiple substrate layer board. Additionally, the second circuit board can be constructed of materials with better electrical characteristics, such as Cyanate Ester or other material having a low relative permeability, providing an advantage in meeting the tight timing characteristics of new, high performance microprocessors and chipsets.