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公开(公告)号:US20230086920A1
公开(公告)日:2023-03-23
申请号:US17481245
申请日:2021-09-21
申请人: Intel Corporation
发明人: Liang HE , Jisu JIANG , Jung Kyu HAN , Gang DUAN , Yosuke KANAOKA , Jason M. GAMBA , Bai NIE , Robert Alan MAY , Kimberly A. DEVINE , Mitchell ARMSTRONG , Yue DENG
摘要: Embodiments described herein may be related to apparatuses, processes, and techniques for a dam structure on a substrate that is proximate to a die coupled with the substrate, where the dam decreases the risk of die shift during encapsulation material flow over the die during the manufacturing process. The dam structure may fully encircle the die. During encapsulation material flow, the dam structure creates a cavity that moderates the different flow rates of material that otherwise would exert different pressures the sides of the die and cause to die to shift its position on the substrate. Other embodiments may be described and/or claimed.
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2.
公开(公告)号:US20240213164A1
公开(公告)日:2024-06-27
申请号:US18089483
申请日:2022-12-27
申请人: Intel Corporation
发明人: Minglu LIU , Gang DUAN , Liang HE , Ziyin LIN , Elizabeth NOFEN , Yiqun BAI , Jonathan ATKINS , Jesus S. NIETO PESCADOR , Srinivas V. PIETAMBARAM , Kristof DARMAWIKARTA
IPC分类号: H01L23/538 , H01L23/00 , H01L23/522 , H01L23/528
CPC分类号: H01L23/5381 , H01L23/5226 , H01L23/5283 , H01L24/14 , H01L2224/16104
摘要: Embodiments disclosed herein include an electronic package. In an embodiment, the electronic package comprises a package substrate, and an opening in the package substrate. In an embodiment, a plurality of first pads are provided at a bottom of the opening, and a bridge die is in the opening. In an embodiment, the bridge die comprises a plurality of second pads that are coupled to the first pads by solder. In an embodiment, a non-conductive film (NCF) is around the solder between the first pads and the second pads.
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公开(公告)号:US20240186263A1
公开(公告)日:2024-06-06
申请号:US18060574
申请日:2022-12-01
申请人: Intel Corporation
发明人: Hong Seung YEON , Liang HE , Whitney BRYKS , Jung Kyu HAN , Gang DUAN
IPC分类号: H01L23/00
CPC分类号: H01L23/562 , H01L24/13 , H01L2224/32225 , H01L2924/3511
摘要: The present disclosure is directed to a semiconductor carrier platform having a support panel with a top surface and a bottom surface, with the top surface providing a working surface for assembling IC packages using panel-level packaging technology. In an aspect, a backside molding layer may be positioned on the bottom surface of the support panel to prevent or correct any panel warpage. In another aspect, a removable film may be positioned between the bottom surface of the support panel and the backside molding layer to allow the support panel to be readily cleaned and reused.
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公开(公告)号:US20230197660A1
公开(公告)日:2023-06-22
申请号:US17558297
申请日:2021-12-21
申请人: Intel Corporation
发明人: Yue DENG , Jung Kyu HAN , Liang HE , Gang DUAN , Rahul N. MANEPALLI
IPC分类号: H01L23/00 , H01L23/498
CPC分类号: H01L24/16 , H01L24/13 , H01L23/49811 , H01L2224/16225 , H01L2224/13111 , H01L2224/13109 , H01L2924/014
摘要: A computer apparatus includes a hierarchy of solder joints in a multi-chip package, with solder joints at different levels of the packaging having different melting temperatures. Interconnections, such as pads or pins, on integrated circuit (IC) die can be electrically coupled to ends of contact pillars with solder joints having a higher melting temperature. The other ends of the contact pillars can electrically couple to another substrate or another device with solder joints having a lower melting temperature. The contact pillars can be, for example, a contact array or through-hole via in a substrate.
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5.
公开(公告)号:US20230091379A1
公开(公告)日:2023-03-23
申请号:US17482275
申请日:2021-09-22
申请人: Intel Corporation
发明人: Liang HE , Yeasir ARAFAT , Jung Kyu HAN , Ali LEHAF , Gang DUAN , Steve S. CHO , Yue DENG
IPC分类号: H01L23/00 , H01L23/498 , H01L23/532 , H01L23/528
摘要: Embodiments disclosed herein include electronic packages with first level interconnects that comprise a first layer. In an embodiment, the electronic package comprises a package substrate and a pad on the package substrate. In an embodiment, the pad comprises copper. In an embodiment, a first layer is over the pad. In an embodiment, the first layer comprises iron. In an embodiment, a solder is over the first layer, and a die is coupled to the package substrate by the solder.
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