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18 条记录 (耗时 0.02 秒)

    On-chip voltage regulator using feedback on process/product parameters
    1.
    发明授权
    On-chip voltage regulator using feedback on process/product parameters 有权
    片上电压调节器，使用过程/产品参数反馈

    公开(公告)号：US07170308B1

    公开(公告)日：2007-01-30

    申请号：US10628711

    申请日：2003-07-28

    申请人： Irfan Rahim ,  Peter McElheny ,  John Costello

    发明人： Irfan Rahim ,  Peter McElheny ,  John Costello

    IPC分类号： G01R31/00 ,  G01R31/28 ,  G05F1/00

    CPC分类号： G11C5/147 ,  H03K19/177

    摘要： The present invention optimizes the performance of integrated circuits by adjusting the circuit operating voltage using feedback on process/product parameters. To determine a desired value for the operating voltage of an integrated circuit, a preferred embodiment provides for on-wafer probing of one or more reference circuit structures to measure at least one electrical or operational parameter of the one or more reference circuit structures; determining an adjusted value for the operating voltage based on the measured parameter; and establishing the adjusted value as the desired value for the operating voltage. The reference circuit structures may comprise process control monitor structures or structures in other integrated circuits fabricated in the same production run. In an alternative embodiment, the one or more parameters are directly measured from the integrated circuit whose operating voltage is being adjusted.

    摘要翻译： 本发明通过使用对过程/产品参数的反馈来调节电路工作电压来优化集成电路的性能。 为了确定集成电路的工作电压的期望值，优选实施例提供一个或多个参考电路结构的片上探测，以测量一个或多个参考电路结构的至少一个电或操作参数; 基于所测量的参数确定所述工作电压的调整值; 并将调整后的值建立为工作电压的期望值。 参考电路结构可以包括在相同生产运行中制造的其它集成电路中的过程控制监视器结构或结构。 在替代实施例中，一个或多个参数是直接从其工作电压正被调整的集成电路测量的。

    On-chip voltage regulator using feedback on process/product parameters
    2.
    发明授权
    On-chip voltage regulator using feedback on process/product parameters 失效
    片上电压调节器，使用过程/产品参数反馈

    公开(公告)号：US07639033B2

    公开(公告)日：2009-12-29

    申请号：US11638846

    申请日：2006-12-13

    申请人： Irfan Rahim ,  Peter McElheny ,  John Costello

    发明人： Irfan Rahim ,  Peter McElheny ,  John Costello

    IPC分类号： G01R31/00 ,  G01R31/28

    CPC分类号： G11C5/147 ,  H03K19/177

    摘要： The present invention optimizes the performance of integrated circuits by adjusting the circuit operating voltage using feedback on process/product parameters. To determine a desired value for the operating voltage of an integrated circuit, a preferred embodiment provides for on-wafer probing of one or more reference circuit structures to measure at least one electrical or operational parameter of the one or more reference circuit structures; determining an adjusted value for the operating voltage based on the measured parameter; and establishing the adjusted value as the desired value for the operating voltage. The reference circuit structures may comprise process control monitor structures or structures in other integrated circuits fabricated in the same production run. In an alternative embodiment, the one or more parameters are directly measured from the integrated circuit whose operating voltage is being adjusted.

    摘要翻译： 本发明通过使用对过程/产品参数的反馈来调节电路工作电压来优化集成电路的性能。 为了确定集成电路的工作电压的期望值，优选实施例提供一个或多个参考电路结构的片上探测，以测量一个或多个参考电路结构的至少一个电或操作参数; 基于所测量的参数确定所述工作电压的调整值; 并将调整后的值建立为工作电压的期望值。 参考电路结构可以包括在相同生产运行中制造的其它集成电路中的过程控制监视器结构或结构。 在替代实施例中，一个或多个参数是直接从其工作电压正被调整的集成电路测量的。

    On-chip voltage regulator using feedback on process/product parameters
    3.
    发明申请
    On-chip voltage regulator using feedback on process/product parameters 失效
    片上电压调节器，使用过程/产品参数反馈

    公开(公告)号：US20070085558A1

    公开(公告)日：2007-04-19

    申请号：US11638846

    申请日：2006-12-13

    申请人： Irfan Rahim ,  Peter McElheny ,  John Costello

    发明人： Irfan Rahim ,  Peter McElheny ,  John Costello

    IPC分类号： G01R31/26

    CPC分类号： G11C5/147 ,  H03K19/177

    摘要： The present invention optimizes the performance of integrated circuits by adjusting the circuit operating voltage using feedback on process/product parameters. To determine a desired value for the operating voltage of an integrated circuit, a preferred embodiment provides for on-wafer probing of one or more reference circuit structures to measure at least one electrical or operational parameter of the one or more reference circuit structures; determining an adjusted value for the operating voltage based on the measured parameter; and establishing the adjusted value as the desired value for the operating voltage. The reference circuit structures may comprise process control monitor structures or structures in other integrated circuits fabricated in the same production run. In an alternative embodiment, the one or more parameters are directly measured from the integrated circuit whose operating voltage is being adjusted

    摘要翻译： 本发明通过使用对过程/产品参数的反馈来调节电路工作电压来优化集成电路的性能。 为了确定集成电路的工作电压的期望值，优选实施例提供一个或多个参考电路结构的片上探测，以测量一个或多个参考电路结构的至少一个电或操作参数; 基于所测量的参数确定所述工作电压的调整值; 并将调整后的值建立为工作电压的期望值。 参考电路结构可以包括在相同生产运行中制造的其它集成电路中的过程控制监视器结构或结构。 在替代实施例中，一个或多个参数是直接从其工作电压正被调整的集成电路测量的

    Apparatus and methods for adjusting performance of programmable logic devices
    4.
    发明授权
    Apparatus and methods for adjusting performance of programmable logic devices 有权
    用于调节可编程逻辑器件性能的装置和方法

    公开(公告)号：US07348827B2

    公开(公告)日：2008-03-25

    申请号：US10848953

    申请日：2004-05-19

    申请人： Irfan Rahim ,  Peter McElheny ,  Yow-Juang W. Liu ,  Bruce Pedersen

    发明人： Irfan Rahim ,  Peter McElheny ,  Yow-Juang W. Liu ,  Bruce Pedersen

    IPC分类号： G05F3/02

    CPC分类号： H03K19/1731 ,  G06F17/5054 ,  H03K19/00369 ,  H03K2217/0018

    摘要： A programmable logic device (PLD) includes mechanisms for adjusting or setting the body bias of one or more transistors. The PLD includes a body-bias generator. The body-bias generator is configured to set a body bias of one or more transistors within the programmable logic device. More specifically, the body-bias generator sets the body bias of the transistor(s) so as to trade off performance and power consumption of the transistor(s).

    摘要翻译： 可编程逻辑器件（PLD）包括用于调整或设置一个或多个晶体管的体偏置的机构。 PLD包括体偏置发生器。 体偏置发生器被配置为设置可编程逻辑器件内的一个或多个晶体管的体偏置。 更具体地，体偏置发生器设置晶体管的体偏置，以便折衷晶体管的性能和功耗。