摘要:
A method for making magnetic random access memories (MRAM) isolates each and every memory cell in an MRAM array during operation until selected. Some embodiments use series connected diodes for such electrical isolation. Only a selected one of the memory cells will then conduct current between respective ones of the bit and word lines. A better, more uniform distribution of read and data-write data access currents results to all the memory cells. In another embodiment, this improvement is used to increase the number of rows and columns to support a larger data array. In a further embodiment, such improvement is used to increase operating margins and reduce necessary data-write voltages and currents.
摘要:
A data storage device that includes an array of resistive memory cells. The resistive memory cells may include a magnetic tunnel junction (MTJ) and a thin-film diode. The device may include a circuit that is electrically connected to the array and that is also capable of monitoring a signal current flowing through a selected memory cell. Once the signal current has been monitored, the circuit is capable of comparing the signal current to an average reference current in order to determine which of a first resistance state and a second resistance state the selected memory cell is in. Also, a method for operating the data storage device.
摘要:
A data storage device that includes an array of resistive memory cells. The resistive memory cells may include a magnetic tunnel junction (MTJ) and a thin-film diode. The device may include a circuit that is electrically connected to the array and that is also capable of monitoring a signal current flowing through a selected memory cell. Once the signal current has been monitored, the circuit is capable of comparing the signal current to an average reference current in order to determine which of a first resistance state and a second resistance state the selected memory cell is in. Also, a method for operating the data storage device.
摘要:
An operational amplifier includes transistors for providing a controlled current path. At least one of the transistors is in an isolated well in a substrate. Offset of the operational amplifier is corrected by applying a back gate bias voltage to at least one isolated well and changing impedance of the transistors. The proper back gate bias voltage and transistor impedance are determined by incrementally adjusting the back gate bias voltage and then incrementally adjusting the transistor impedance. Calibration values are stored in register memory. Such calibration may be performed by an auto offset calibration process.
摘要:
Resistance of a selected memory cell in a Magnetic Random Access Memory (“MRAM”) device is sensed by a read circuit including a direct injection charge amplifier, an integrator capacitor and a digital sense amplifier. The direct injection charge amplifier supplies current to the integrator capacitor while maintaining an equipotential voltage on non-selected memory cells in the MRAM device. As the direct injection charge amplifier applies a fixed voltage to the selected memory cell, the sense amplifier measures integration time of a signal on the integrator. The signal integration time indicates whether the memory cell MRAM resistance is at a first state (R) or a second state (R+&Dgr;R).
摘要:
A memory structure has an antifuse material that is unpatterned and sandwiched between each of a plurality of antifuse electrode pairs. The antifuse material is continuous between the antifuse electrode pairs. Furthermore the present invention includes a memory structure comprising a plurality of antifuse electrode pairs forming a plurality of row conductors and a plurality of middle conductors in electrical communication with a plurality of control elements.
摘要:
A memory device and method of reading the memory device is disclosed. The memory device includes a first string of MRAM cells and a second string of MRAM cells. The first string of MRAM cells include a plurality of MRAM cells connected in series and the second string of MRAM cells include another plurality of MRAM cells connected in series. A common connection is controllably connectable to one end of the first string of MRAM cells, and to one end of the second string of MRAM cells.
摘要:
A Magnetic Random Access Memory (“MRAM”) device includes an array of memory cells. The device generates reference signals that can be used to determine the resistance states of each memory cell in the array, despite variations in resistance due to manufacturing tolerances and other factors such as temperature gradients across the array, electromagnetic interference and aging.
摘要:
A magnetic random access memory (MRAM) includes an array of magnetic memory cells arranged on a cross-point grid. Spurious voltages that build up on the stray wiring capacitance of unselected bit and word select lines are limited and discharged by diodes. The control of such spurious voltages improves device operating margins and allows the construction of larger arrays.
摘要:
Some forms of memory data I/O requires a parallel interface with the memory array and a serial interface with external data ports to the memory. A hybrid decoder/scan register data I/O scheme is described that offers a high speed data access to selected points along a set of scan registers that connect to the columns (bit lines) of a memory array. The interface to the memory array is a long register which comprises a chain of scan register blocks. Data to and from the memory array is transferred in a parallel manner. Data I/O to a specific memory address or memory data block is routed from a serial data I/O line, through a set of switches controlled by a decoder circuit to the input (or output) port of one of the scan register blocks. This hybrid data I/O circuit offers a high speed access to selected points within the column circuits of a memory array while maintaining an efficient and high speed serial output offered by a scan chain data register.