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公开(公告)号：US20110125423A1
公开(公告)日：2011-05-26
申请号：US12731405
申请日：2010-03-25
申请人： Jason Randolph Allen , Jared Michael Crosby , Christopher Joseph Uhl , Michael Orlando Cimini , Bianca Mary McCartt , James Walter Caddell , Jared Reece Reynolds , Robert William Tait , Andrew Frank Ferro
发明人： Jason Randolph Allen , Jared Michael Crosby , Christopher Joseph Uhl , Michael Orlando Cimini , Bianca Mary McCartt , James Walter Caddell , Jared Reece Reynolds , Robert William Tait , Andrew Frank Ferro
CPC分类号： G01N25/72
摘要： A thermal inspection system includes a fluid source configured to supply a warm flow and a cool flow, indirectly or directly, to internal passage(s) of a component. The system includes an imager configured to capture a time series of images corresponding to a transient thermal response of the component to the warm and cool flows. The system further includes at least one flow meter configured to measure the warm and cool flows supplied to the component and a processor operably connected to the imager. The processor determines the transient thermal response of the component around a transition time. The flow supplied to the component switches from the warm flow to the cool flow at the transition time. The processor compares the transient thermal response around the transition time with one or more baseline values or with an acceptable range of values to determine if the component meets a desired specification.
摘要翻译： 热检查系统包括流体源，其构造成间接地或直接地向部件的内部通道供应热流和冷流。 该系统包括成像器，该成像器被配置为捕获对应于该组件的瞬态热响应到温暖和冷流的时间序列图像。 该系统进一步包括至少一个流量计，该流量计被配置为测量供应到该组件的温和冷流，以及可操作地连接到该成像器的处理器。 处理器确定组件围绕过渡时间的瞬态热响应。 提供给组件的流量在过渡时间从暖流切换到冷流。 处理器将过渡时间周围的瞬态热响应与一个或多个基准值或可接受的值范围进行比较，以确定组件是否满足所需规格。
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公开(公告)号：US08244488B2
公开(公告)日：2012-08-14
申请号：US12731405
申请日：2010-03-25
申请人： Jason Randolph Allen , Jared Michael Crosby , Christopher Joseph Uhl , Michael Orlando Cimini , Bianca Mary McCartt , James Walter Caddell , Jared Reece Reynolds , Robert William Tait , Andrew Frank Ferro
发明人： Jason Randolph Allen , Jared Michael Crosby , Christopher Joseph Uhl , Michael Orlando Cimini , Bianca Mary McCartt , James Walter Caddell , Jared Reece Reynolds , Robert William Tait , Andrew Frank Ferro
CPC分类号： G01N25/72
摘要： A thermal inspection system includes a fluid source configured to supply a warm flow and a cool flow, indirectly or directly, to internal passage(s) of a component. The system includes an imager configured to capture a time series of images corresponding to a transient thermal response of the component to the warm and cool flows. The system further includes at least one flow meter configured to measure the warm and cool flows supplied to the component and a processor operably connected to the imager. The processor determines the transient thermal response of the component around a transition time. The flow supplied to the component switches from the warm flow to the cool flow at the transition time. The processor compares the transient thermal response around the transition time with one or more baseline values or with an acceptable range of values to determine if the component meets a desired specification.
摘要翻译： 热检查系统包括流体源，其构造成间接地或直接地向部件的内部通道供应热流和冷流。 该系统包括成像器，该成像器被配置为捕获对应于该组件的瞬态热响应到温暖和冷流的时间序列图像。 该系统进一步包括至少一个流量计，该流量计被配置为测量供应到该组件的温和冷流，以及可操作地连接到该成像器的处理器。 处理器确定组件围绕过渡时间的瞬态热响应。 提供给组件的流量在过渡时间从暖流切换到冷流。 处理器将过渡时间周围的瞬态热响应与一个或多个基准值或可接受的值范围进行比较，以确定组件是否满足所需规格。
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公开(公告)号：US20120149281A1
公开(公告)日：2012-06-14
申请号：US13312595
申请日：2011-12-06
申请人： Xinjun WAN , Guju Song , Kevin George Harding , Shukuan Xu , Steven Robert Hayashi , Robert William Tait , James Joseph Hoffman , Charles Walter Muchmore , Matthew Michael Gluesenkamp
发明人： Xinjun WAN , Guju Song , Kevin George Harding , Shukuan Xu , Steven Robert Hayashi , Robert William Tait , James Joseph Hoffman , Charles Walter Muchmore , Matthew Michael Gluesenkamp
CPC分类号： G01B11/026
摘要： A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented.
摘要翻译： 距离测量系统包括被配置为产生光束的光学距离传感器，第一光学模块和处理器。 第一光学模块被配置为接收光束，并且生成并选择性地透射具有不同光通道的多个光束，用于投射到物体的一个或多个点上，以产生从相应的一个或多个散射的一个或多个反射光束 并且将一个或多个反射光束捕获并传输到光学距离传感器中以将多个距离数据提取到对象的相应一个或多个点。 处理器被配置为处理距离数据以确定对象的相应一个或多个点的位置信息。 还提出了一种距离测量方法。
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公开(公告)号：US07492450B2
公开(公告)日：2009-02-17
申请号：US11257182
申请日：2005-10-24
IPC分类号： G01N21/00
CPC分类号： G01B11/2513
摘要： A method for inspecting an object using a light measurement system that includes a light source and an imaging sensor. The method includes emitting light from the light source, dispersing light emitted from the light source into one of a diffraction pattern and an interference pattern, and imaging the patterned light onto the object using a lens.
摘要翻译： 一种使用包括光源和成像传感器的光测量系统来检查物体的方法。 该方法包括从光源发射光，将从光源发射的光分散成衍射图案和干涉图案之一，并使用透镜将图案化光成像到物体上。
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5.发明申请APPARATUS AND METHOD FOR IDENTIFYING A DEFECT AND/OR OPERATING CHARACTERISTIC OF A SYSTEM 有权识别系统的缺陷和/或操作特性的装置和方法公开(公告)号：US20080306705A1
公开(公告)日：2008-12-11
申请号：US11758996
申请日：2007-06-06
申请人： Huageng Luo , Michael Richard Durling , Andrew Lawrence Ruggiero , Zongqi Sun , Harry Kirk Mathews, JR. , Robert William Tait , Benjamin Paul Church , Thomas Anthony Tougas
发明人： Huageng Luo , Michael Richard Durling , Andrew Lawrence Ruggiero , Zongqi Sun , Harry Kirk Mathews, JR. , Robert William Tait , Benjamin Paul Church , Thomas Anthony Tougas
CPC分类号： B61K9/04 , B61L25/021 , B61L25/026 , G01K13/08 , G01K15/00
摘要： An apparatus and methods for identifying a defect and/or an operating characteristic of a system being monitored (and/or one or more of the system's components) are described. In an embodiment, orthogonally related data monitored by two or more detectors may be fused to determine whether a component of a system is defective and/or malfunctioning. Additionally or alternatively, data from a first detector may be determined to be accurate using non-orthogonally related data outputted by a second detector. Both types of determinations may be made with minimal or no false indications, which lowers the cost of operating the system being monitored. Embodiments of the invention may also be configured to forecast and/or prevent accidents and/or damage to the system being monitored by predicting whether a defect and/or a malfunction will occur
摘要翻译： 描述了用于识别被监视的系统（和/或系统的一个或多个部件）的缺陷和/或操作特性的装置和方法。 在一个实施例中，可以融合由两个或更多个检测器监视的正交相关数据，以确定系统的部件是否有缺陷和/或故障。 附加地或替代地，可以使用由第二检测器输出的非正交相关数据来确定来自第一检测器的数据是准确的。 两种类型的确定可以用最小的或没有虚假的指示进行，这降低了操作被监视的系统的成本。 本发明的实施例还可以被配置为通过预测是否将发生缺陷和/或故障来预测和/或防止对所监视的系统的事故和/或损坏
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公开(公告)号：US20100140236A1
公开(公告)日：2010-06-10
申请号：US12328349
申请日：2008-12-04
申请人： Guoshang Cai , Kevin George Harding , Magdi Naim Azer , Yong Liu , Sudhir Kumar Tewari , Robert William Tait , Xiaobin Chen , Yanmin Li , Huan Qi , David Henry Abbott
发明人： Guoshang Cai , Kevin George Harding , Magdi Naim Azer , Yong Liu , Sudhir Kumar Tewari , Robert William Tait , Xiaobin Chen , Yanmin Li , Huan Qi , David Henry Abbott
IPC分类号： B23K26/00
摘要： A laser machining system comprises a laser configured to generate a laser output for forming a molten pool on a substrate, a nozzle configured to supply a growth material to the molten pool for depositing the material on the substrate, and an optical unit configured to capture a plurality of grayscale images comprising temperature data during the laser deposition process, wherein the grayscale images correspond to respective ones of a plurality of radiation beams with different desired wavelengths. Further, the laser machining system comprises an image-processing unit configured to process the grayscale images to retrieve the temperature data according to linear relationships between temperatures in the laser deposition process and the corresponding grayscales of the respective images. A laser machining method is also presented.
摘要翻译： 激光加工系统包括被配置为产生用于在基底上形成熔池的激光输出的激光器，被配置为向所述熔池供应生长材料以将所述材料沉积在所述基板上的喷嘴以及被配置为捕获 多个灰度图像，包括在激光沉积过程期间的温度数据，其中灰度图像对应于具有不同期望波长的多个辐射束中的相应的一个。 此外，激光加工系统包括图像处理单元，其被配置为处理灰阶图像，以根据激光沉积工艺中的温度与相应图像的相应灰度之间的线性关系来检索温度数据。 还提出了激光加工方法。
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公开(公告)号：US09007689B2
公开(公告)日：2015-04-14
申请号：US13066000
申请日：2011-04-04
申请人： Gil Abramovich , Kevin George Harding , Robert William Tait , Mark Marshall Meyers , Qingying Hu
发明人： Gil Abramovich , Kevin George Harding , Robert William Tait , Mark Marshall Meyers , Qingying Hu
CPC分类号： G02B27/0075 , G02B27/123
摘要： Disclosed are method and apparatus for forming multiple images of an object comprising a plurality of depth segments. An optical system comprises an infinity optical subsystem and a multi-image optical subsystem. The infinity optical subsystem is configured to receive light from the object and form a first image focussed at infinity. A multi-image optical subsystem is configured to receive the first image and form multiple images via multiple focussing lenses. Each multiple image can correspond to a different depth segment. A portion of the light from the first image can also be filtered before entering a focussing lens. Multiple images under different filtering conditions, corresponding to different depth segments or to the same depth segment, can be formed.
摘要翻译： 公开了用于形成包括多个深度段的对象的多个图像的方法和装置。 光学系统包括无穷远光学子系统和多图像光学子系统。 无穷远光学子系统被配置为从对象接收光并形成聚焦在无限远的第一图像。 多图像光学子系统被配置为接收第一图像并通过多个聚焦透镜形成多个图像。 每个多个图像可以对应于不同的深度段。 来自第一图像的光的一部分也可以在进入聚焦透镜之前被滤波。 可以形成在不同滤波条件下对应于不同深度段或相同深度段的多个图像。
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公开(公告)号：US08063385B2
公开(公告)日：2011-11-22
申请号：US12474306
申请日：2009-05-29
IPC分类号： G01N21/64
CPC分类号： G01N21/6452 , G01N21/6458 , G01N21/6486 , G02B21/16 , G02B2207/113
摘要： The invention provides method for locating one or more substantially circular-shaped tissue sample positioned on a solid support. The method involves the steps of transmitting light of a preselected wavelength onto a tissue sample, wherein the light induces the tissue sample to autofluoresce, identifying the center location of the tissue sample using the autofluoresced light, correlating the coordinates of the center location of the tissue sample on the solid support using an x, y-coordinate system, and mapping the coordinates of the tissue sample on the solid support to differentiate tissue sample containing regions from blank regions on the solid support. In a second aspect, the invention provides an apparatus for locating one or more substantially circular-shaped tissue sample positioned on a solid support.
摘要翻译： 本发明提供了一种用于定位位于固体支持体上的一个或多个基本圆形的组织样本的方法。 该方法包括以下步骤：将预选波长的光透射到组织样本上，其中光诱导组织样本自发荧光，使用自发荧光识别组织样本的中心位置，将组织的中心位置的坐标相关联 使用x，y坐标系统在固体支持物上进行样品测绘，并将组织样本的坐标映射到固体支持物上，以将含有区域的组织样本与固体支持物上的空白区域区分开。 在第二方面，本发明提供了一种用于定位位于固体支撑体上的一个或多个基本圆形的组织样本的装置。
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9.发明授权Apparatus and method for identifying a defect and/or operating characteristic of a system 有权用于识别系统的缺陷和/或操作特性的装置和方法公开(公告)号：US07693673B2
公开(公告)日：2010-04-06
申请号：US11758996
申请日：2007-06-06
申请人： Huageng Luo , Michael Richard Durling , Andrew Lawrence Ruggiero , Zongqi Sun , Harry Kirk Mathews, Jr. , Robert William Tait , Benjamin Paul Church , Thomas Anthony Tougas
发明人： Huageng Luo , Michael Richard Durling , Andrew Lawrence Ruggiero , Zongqi Sun , Harry Kirk Mathews, Jr. , Robert William Tait , Benjamin Paul Church , Thomas Anthony Tougas
CPC分类号： B61K9/04 , B61L25/021 , B61L25/026 , G01K13/08 , G01K15/00
摘要： An apparatus and methods for identifying a defect and/or an operating characteristic of a system being monitored (and/or one or more of the system's components) are described. In an embodiment, orthogonally related data monitored by two or more detectors may be fused to determine whether a component of a system is defective and/or malfunctioning. Additionally or alternatively, data from a first detector may be determined to be accurate using non-orthogonally related data outputted by a second detector. Both types of determinations may be made with minimal or no false indications, which lowers the cost of operating the system being monitored. Embodiments of the invention may also be configured to forecast and/or prevent accidents and/or damage to the system being monitored by predicting whether a defect and/or a malfunction will occur.
摘要翻译： 描述了用于识别被监视的系统（和/或系统的一个或多个部件）的缺陷和/或操作特性的装置和方法。 在一个实施例中，可以融合由两个或更多个检测器监视的正交相关数据，以确定系统的部件是否有缺陷和/或故障。 附加地或替代地，可以使用由第二检测器输出的非正交相关数据来确定来自第一检测器的数据是准确的。 两种类型的确定可以用最小的或没有虚假的指示进行，这降低了操作被监视的系统的成本。 本发明的实施例还可以被配置为通过预测是否将发生缺陷和/或故障来预测和/或防止对所监视的系统的事故和/或损坏。
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公开(公告)号：US20090245594A1
公开(公告)日：2009-10-01
申请号：US12058969
申请日：2008-03-31
申请人： Gil Abramovich , Ambalangoda Gurunnanselage Amitha Perera , Robert William Tait , Frederick Wilson Wheeler
发明人： Gil Abramovich , Ambalangoda Gurunnanselage Amitha Perera , Robert William Tait , Frederick Wilson Wheeler
IPC分类号： G06K9/00
CPC分类号： G06K9/2018 , G06K9/00604
摘要： An iris of an individual is imaged while illuminated with electromagnetic radiation having an illumination spectrum that is selected based on a color of the iris. The illumination spectrum/spectra is/are selected so that the resulting image will have a sufficient amount of detail of the iris as required for the application, such as identification of the individual. Alternatively, the iris can be imaged multiple times while illuminated by electromagnetic radiation of one of multiple different illumination spectra, and the best image or a combination of the images can be used for the application.
摘要翻译： 个体的虹膜在用具有基于虹膜的颜色选择的照明光谱的电磁辐射照射时成像。 选择照明光谱/光谱，使得所得到的图像将具有针对应用所需的足够量的虹膜细节，例如个体的识别。 或者，当通过多个不同照明光谱之一的电磁辐射照明时，虹膜可以成像多次，并且可以将最佳图像或图像的组合用于应用。
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