THROUGH SUBSTRATE VIAS
    1.
    发明申请
    THROUGH SUBSTRATE VIAS 有权
    通过基板VIAS

    公开(公告)号:US20120217651A1

    公开(公告)日:2012-08-30

    申请号:US13468609

    申请日:2012-05-10

    IPC分类号: H01L23/48 H01L21/768

    摘要: Methods and apparatus for forming through-vias are presented, for example, a method for forming a via in a portion of a semiconductor wafer comprising a substrate. The method comprises forming a trench surrounding a first part of the substrate such that the first part is separated from a second part of the substrate, forming a hole through the substrate within the first part, and forming a first metal within the hole. The trench extends through the substrate. The first metal extends from a front surface of the substrate to a back surface of the substrate. The via comprises the hole and the first metal.

    摘要翻译: 提出了用于形成通孔的方法和装置,例如,在包括衬底的半导体晶片的一部分中形成通孔的方法。 该方法包括形成围绕基板的第一部分的沟槽,使得第一部分与基板的第二部分分离,在第一部分内形成穿过基板的孔,并在孔内形成第一金属。 沟槽延伸穿过衬底。 第一金属从基板的前表面延伸到基板的后表面。 通孔包括孔和第一金属。

    Through substrate vias
    2.
    发明授权
    Through substrate vias 有权
    通过衬底通孔

    公开(公告)号:US08263492B2

    公开(公告)日:2012-09-11

    申请号:US12432243

    申请日:2009-04-29

    IPC分类号: H01L21/768 H01L23/48

    摘要: Methods and apparatus for forming through-vias are presented, for example, a method for forming a via in a portion of a semiconductor wafer comprising a substrate. The method comprises forming a trench surrounding a first part of the substrate such that the first part is separated from a second part of the substrate, forming a hole through the substrate within the first part, and forming a first metal within the hole. The trench extends through the substrate. The first metal extends from a front surface of the substrate to a back surface of the substrate. The via comprises the hole and the first metal.

    摘要翻译: 提出了用于形成通孔的方法和装置,例如,在包括衬底的半导体晶片的一部分中形成通孔的方法。 该方法包括形成围绕基板的第一部分的沟槽,使得第一部分与基板的第二部分分离,在第一部分内形成穿过基板的孔,并在孔内形成第一金属。 沟槽延伸穿过衬底。 第一金属从基板的前表面延伸到基板的后表面。 通孔包括孔和第一金属。

    Through Substrate Vias
    3.
    发明申请
    Through Substrate Vias 有权
    通过基板通风

    公开(公告)号:US20100276786A1

    公开(公告)日:2010-11-04

    申请号:US12432243

    申请日:2009-04-29

    IPC分类号: H01L23/48 H01L21/768

    摘要: Methods and apparatus for forming through-vias are presented, for example, a method for forming a via in a portion of a semiconductor wafer comprising a substrate. The method comprises forming a trench surrounding a first part of the substrate such that the first part is separated from a second part of the substrate, forming a hole through the substrate within the first part, and forming a first metal within the hole. The trench extends through the substrate. The first metal extends from a front surface of the substrate to a back surface of the substrate. The via comprises the hole and the first metal.

    摘要翻译: 提出了用于形成通孔的方法和装置,例如,在包括衬底的半导体晶片的一部分中形成通孔的方法。 该方法包括形成围绕基板的第一部分的沟槽,使得第一部分与基板的第二部分分离,在第一部分内形成穿过基板的孔,并在孔内形成第一金属。 沟槽延伸穿过衬底。 第一金属从基板的前表面延伸到基板的后表面。 通孔包括孔和第一金属。

    Through substrate vias
    4.
    发明授权
    Through substrate vias 有权
    通过衬底通孔

    公开(公告)号:US08796138B2

    公开(公告)日:2014-08-05

    申请号:US13468609

    申请日:2012-05-10

    IPC分类号: H01L21/768 H01L23/48

    摘要: Methods and apparatus for forming through-vias are presented, for example, a method for forming a via in a portion of a semiconductor wafer comprising a substrate. The method comprises forming a trench surrounding a first part of the substrate such that the first part is separated from a second part of the substrate, forming a hole through the substrate within the first part, and forming a first metal within the hole. The trench extends through the substrate. The first metal extends from a front surface of the substrate to a back surface of the substrate. The via comprises the hole and the first metal.

    摘要翻译: 提出了用于形成通孔的方法和装置,例如,在包括衬底的半导体晶片的一部分中形成通孔的方法。 该方法包括形成围绕基板的第一部分的沟槽,使得第一部分与基板的第二部分分离,在第一部分内形成穿过基板的孔,并在孔内形成第一金属。 沟槽延伸穿过衬底。 第一金属从基板的前表面延伸到基板的后表面。 通孔包括孔和第一金属。

    Method of obtaining release-standing micro structures and devices by selective etch removal of protective and sacrificial layer using the same
    7.
    发明授权
    Method of obtaining release-standing micro structures and devices by selective etch removal of protective and sacrificial layer using the same 失效
    通过使用其去除保护层和牺牲层的方法来获得释放稳定的微结构和器件

    公开(公告)号:US07192868B2

    公开(公告)日:2007-03-20

    申请号:US11053610

    申请日:2005-02-08

    IPC分类号: H01L21/302 H01L21/461

    摘要: A method of patterning and releasing chemically sensitive low k films without the complication of a permanent hardmask stack, yielding an unaltered free-standing structure is provided. The method includes providing a structure including a Si-containing substrate having in-laid etch stop layers located therein; forming a chemically sensitive low k film and a protective hardmask having a pattern atop the structure; transferring the pattern to the chemically sensitive low k film to provide an opening that exposes a portion of the Si-containing substrate; and etching the exposed portion of the Si-containing substrate through the opening to provide a cavity in the Si-containing substrate in which a free-standing low k film structure is formed, while removing the hardmask. In accordance with the present invention, the etching comprises a XeF2 etch gas.

    摘要翻译: 提供了图案化和释放化学敏感性低k膜的方法,而不需要永久性硬掩模堆叠的复杂性,产生未改变的独立结构。 该方法包括提供包括其中位于其中的内置蚀刻停止层的含Si衬底的结构; 形成化学敏感的低k膜和在结构顶部具有图案的保护性硬掩模; 将图案转移到化学敏感的低k膜上以提供暴露一部分含Si衬底的开口; 并且通过所述开口蚀刻含Si衬底的暴露部分,以在去除硬掩模的同时在其中形成独立的低k膜结构的含Si衬底中提供空腔。 根据本发明,蚀刻包括XeF 2 N 2蚀刻气体。