Method of measuring measurement target
    1.
    发明授权
    Method of measuring measurement target 有权
    测量目标的测量方法

    公开(公告)号:US08644590B2

    公开(公告)日:2014-02-04

    申请号:US13619161

    申请日:2012-09-14

    IPC分类号: G06K9/00 G06T1/00 G01J3/50

    摘要: In order to measure a measurement target on a PCB, height information of the PCB is acquired by using a first image photographed by illuminating a grating pattern light onto the PCB. Then, a first area protruding on the PCB by greater than a reference height is determined as the measurement target by using the height information. Thereafter, color information of the PCB is acquired by using a second image photographed by illuminating light onto the PCB. Then, the first color information of the first area determined as the measurement target out of the color information of the PCB is set as reference color information. Thereafter, the reference color information is compared with color information of an area except for the first area to judge whether the measurement target is formed in the area except for the first area. Thus, the measurement target may be accurately measured.

    摘要翻译: 为了测量PCB上的测量目标,通过使用通过将光栅图案光照射到PCB上拍摄的第一图像来获取PCB的高度信息。 然后,通过使用高度信息,将在PCB上突出大于参考高度的第一区域确定为测量目标。 此后,通过使用通过将光照射到PCB上拍摄的第二图像来获取PCB的颜色信息。 然后,将作为PCB的颜色信息中的测量对象确定的第一区域的第一颜色信息设置为参考颜色信息。 此后,将参考颜色信息与除了第一区域之外的区域的颜色信息进行比较,以判断在除了第一区域之外的区域中是否形成测量对象。 因此,可以精确地测量测量对象。

    Method of measuring measurement target
    2.
    发明授权
    Method of measuring measurement target 有权
    测量目标的测量方法

    公开(公告)号:US09256912B2

    公开(公告)日:2016-02-09

    申请号:US12779599

    申请日:2010-05-13

    摘要: In order to measure a measurement target on a PCB, height information of the PCB is acquired by using a first image photographed by illuminating a grating pattern light onto the PCB. Then, a first area protruding on the PCB by greater than a reference height is determined as the measurement target by using the height information. Thereafter, color information of the PCB is acquired by using a second image photographed by illuminating light onto the PCB. Then, the first color information of the first area determined as the measurement target out of the color information of the PCB is set as reference color information. Thereafter, the reference color information is compared with color information of an area except for the first area to judge whether the measurement target is formed in the area except for the first area. Thus, the measurement target may be accurately measured.

    摘要翻译: 为了测量PCB上的测量目标,通过使用通过将光栅图案光照射到PCB上拍摄的第一图像来获取PCB的高度信息。 然后,通过使用高度信息,将在PCB上突出大于参考高度的第一区域确定为测量目标。 此后,通过使用通过将光照射到PCB上拍摄的第二图像来获取PCB的颜色信息。 然后,将作为PCB的颜色信息中的测量对象确定的第一区域的第一颜色信息设置为参考颜色信息。 此后,将参考颜色信息与除了第一区域之外的区域的颜色信息进行比较,以判断在除了第一区域之外的区域中是否形成测量对象。 因此,可以精确地测量测量对象。

    Shape measurement apparatus and method
    3.
    发明授权
    Shape measurement apparatus and method 有权
    形状测量装置及方法

    公开(公告)号:US09275292B2

    公开(公告)日:2016-03-01

    申请号:US12784707

    申请日:2010-05-21

    摘要: A shape measurement apparatus includes a work stage supporting a target substrate, a pattern-projecting section including a light source, a grating part partially transmitting and blocking light generated by the light source to generate a grating image and a projecting lens part making the grating image on a measurement target of the target substrate, an image-capturing section capturing the grating image reflected by the measurement target of the target substrate, and a control section controlling the work stage, the pattern-projecting section and the image-capturing section, calculating a reliability index of the grating image and phases of the grating image, which is corresponding to the measurement target, and inspecting the measurement target by using the reliability index and the phases. Thus, the accuracy of measurement may be enhanced.

    摘要翻译: 一种形状测量装置,包括支撑目标基板的工作台,包括光源的图案投影部分,部分地透射和遮挡由光源产生的光以产生光栅图像的光栅部分,以及使光栅图像产生的投影透镜部分 在目标基板的测量目标上,捕获由目标基板的测量目标反射的光栅图像的图像捕获部分,以及控制工作台,图案投影部分和图像捕获部分的控制部分,计算 光栅图像的可靠性指标和与测量对象对应的光栅图像的相位,并且通过使用可靠性指标和相位来检查测量对象。 因此,可以提高测量的精度。

    Method of generating height information in circuit board inspection apparatus
    4.
    发明授权
    Method of generating height information in circuit board inspection apparatus 有权
    在电路板检测装置中产生高度信息的方法

    公开(公告)号:US09115984B2

    公开(公告)日:2015-08-25

    申请号:US14347137

    申请日:2011-12-28

    摘要: A method of generating height information in a circuit board inspection apparatus, first, obtaining a first image corresponding to a first area and a second image corresponding to a second area with partially overlapped to the first area of a test board. Next, the first image and the second image are matched based on the overlapped area of the first and second area. Sequentially, a relative positional relationship of the first and second images is obtained from the result of matching. Sequentially, a combined grid image is generated by combining the first grid image and the second grid image based on the relative positioning relationship, wherein the first and second grid images are obtained by irradiating a grid patterned light toward a measurement object formed on the board inspection apparatus. Therefore, it is possible to generate an exact height information.

    摘要翻译: 一种在电路板检查装置中产生高度信息的方法,首先,获得与第一区域相对应的第一图像和对应于与测试板的第一区域部分重叠的第二区域的第二图像。 接下来,基于第一和第二区域的重叠区域来匹配第一图像和第二图像。 顺序地,从匹配的结果获得第一和第二图像的相对位置关系。 顺序地,通过基于相对定位关系组合第一栅格图像和第二栅格图像来生成组合栅格图像,其中第一和第二栅格图像通过将栅格图案化的光朝向形成在板检查上的测量对象 仪器。 因此,可以生成准确的高度信息。

    METHOD OF INSPECTING A SUBSTRATE
    5.
    发明申请
    METHOD OF INSPECTING A SUBSTRATE 有权
    检查基板的方法

    公开(公告)号:US20120127486A1

    公开(公告)日:2012-05-24

    申请号:US13300023

    申请日:2011-11-18

    IPC分类号: G01B11/06

    CPC分类号: G01B11/2531 G01B11/2527

    摘要: A method of inspecting a substrate is disclosed. The method of inspecting a substrate, comprises: obtaining phase data per projecting part with regard to a substrate, by projecting pattern beam onto the substrate having a target object formed thereon through a plurality of projecting parts in sequence; obtaining height data per projecting part with regard to the substrate by using the phase data per the projecting part; compensating tilt of the height data by using the height data per projecting part; modifying the tilt-compensated height data per projecting part; and obtaining integrated height data by using the modified height data.

    摘要翻译: 公开了一种检查基板的方法。 检查基板的方法包括:通过依次通过多个突出部分将图案光束投射到其上形成有目标物体的基板上,获得相对于基板的每个突出部分的相位数据; 通过使用每个突出部分的相位数据获得关于基板的每个突出部分的高度数据; 通过使用每个突出部分的高度数据来补偿高度数据的倾斜度; 修改每个突出部分的倾斜补偿高度数据; 并通过使用修改的高度数据获得集成的高度数据。

    Composition for the prevention or treatment of diseases associated with angiogenesis
    6.
    发明授权
    Composition for the prevention or treatment of diseases associated with angiogenesis 有权
    用于预防或治疗与血管发生相关的疾病的组合物

    公开(公告)号:US07482027B2

    公开(公告)日:2009-01-27

    申请号:US11118714

    申请日:2005-04-30

    IPC分类号: A01N65/00

    摘要: The present invention relates to a composition for the prevention or treatment of diseases associated with angiogenesis, and in detail, to a composition comprising the extract of Cnidium officinale Makino or the fraction thereof for the prevention or treatment of diseases associated with angiogenesis. The present invention also provides 3-butyl-7-hydroxyphthalide, vanillin, coniferyl ferulate, and falcarindiol as active compounds. The composition of the present invention inhibits angiogenesis, so that it can be applied to the prevention or treatment of diseases related to angiogenesis, such as arthritis, diabetic retinopathy, psoriasis, and cancer.

    摘要翻译: 本发明涉及用于预防或治疗与血管生成有关的疾病的组合物,详细地涉及包含用于预防或治疗与血管发生相关的疾病的Cnidium officinale Makino或其部分的提取物的组合物。 本发明还提供了作为活性化合物的3-丁基-7-羟基苯甲酸酯,香草醛,扑酸二烯丙酯和鲸蜡二醇。 本发明的组合物抑制血管发生,因此可以应用于预防或治疗与血管发生有关的疾病,例如关节炎,糖尿病性视网膜病,牛皮癣和癌症。

    3D image measuring apparatus and method thereof
    9.
    发明授权
    3D image measuring apparatus and method thereof 有权
    3D图像测量装置及其方法

    公开(公告)号:US08319977B2

    公开(公告)日:2012-11-27

    申请号:US12878866

    申请日:2010-09-09

    IPC分类号: G01B11/24

    CPC分类号: G01B11/25 G01S17/89

    摘要: A 3D measuring apparatus includes a stage, a projection portion, and an imaging portion. The projection portion includes first and second lights, first and second lattices, and first and second projection lenses. The imaging portion includes an imaging lens and a camera. The projection portion further includes a movement instrument which control the first and the second lattice simultaneously with predetermined n times.

    摘要翻译: 3D测量装置包括平台,突出部分和成像部分。 突起部分包括第一和第二光,第一和第二晶格,以及第一和第二投影透镜。 成像部分包括成像透镜和照相机。 突出部还包括运动器械,其以预定的n次同时控制第一和第二格子。

    INSPECTION METHOD
    10.
    发明申请
    INSPECTION METHOD 有权
    检查方法

    公开(公告)号:US20120130666A1

    公开(公告)日:2012-05-24

    申请号:US13302895

    申请日:2011-11-22

    IPC分类号: G06F19/00

    摘要: In order to inspect a board, a measurement area is set on a board, and reference data and measurement data of the measurement area are acquired. Then, a conversion condition is established for the measurement area, and a conversion relation is acquired according to a distortion degree between reference data and measurement data. Thereafter, validity of the conversion relation is verified by using at least one of verifying that a comparison feature object satisfies the conversion relation, verifying that a verification feature object selected from feature objects satisfies the conversion relation and verifying that a pad formed on the board satisfies the conversion relation. Then, the conversion condition is confirmed, and an inspection area for inspecting a measurement target is set according to the confirmed conversion condition. Thus, an inspection area may be correctly set so that distortion is compensated for.

    摘要翻译: 为了检查电路板,在电路板上设置测量区域,并且获取测量区域的参考数据和测量数据。 然后,对于测量区域建立转换条件,并且根据参考数据和测量数据之间的失真度获取转换关系。 此后,通过使用验证比较特征对象满足转换关系中的至少一个来验证转换关系的有效性,验证从特征对象中选择的验证特征对象是否满足转换关系,并且验证板上形成的垫满足 转换关系。 然后,确认转换条件,根据确认的转换条件设定检查对象的检查区域。 因此,可以正确地设置检查区域,从而补偿失真。