Optical positioner design in X-ray analyzer for coaxial micro-viewing and analysis
    1.
    发明授权
    Optical positioner design in X-ray analyzer for coaxial micro-viewing and analysis 有权
    X射线分析仪中的光学定位器设计用于同轴微观观察和分析

    公开(公告)号:US07972062B2

    公开(公告)日:2011-07-05

    申请号:US12503878

    申请日:2009-07-16

    IPC分类号: A61B6/08

    CPC分类号: G21K7/00

    摘要: An X-ray analyzer includes a sample stage for holding and positioning a sample and an optical positioner assembly configured above the sample stage. The optical positioner assembly includes a body member having an opening; an optical positioner located within the opening; and at least one X-ray optic and an optical viewing lens coupled to a first camera. The at least one X-ray optic and the optical viewing lens are secured to the optical positioner. The optical positioner is configured to align one of the at least one X-ray optic and the optic viewing lens normal to the sample on the sample stage such that the sample is irradiated with X-rays through the X-ray optic along a path which is normal to the sample and coaxial with the optic viewing lens receiving light reflected from the sample when the optic viewing lens is positioned normal to the sample.

    摘要翻译: X射线分析仪包括用于保持和定位样品的样品台和配置在样品台上方的光学定位器组件。 光学定位器组件包括具有开口的本体构件; 位于开口内的光学定位器; 以及耦合到第一相机​​的至少一个X射线光学器件和光学观察镜头。 至少一个X射线光学元件和光学观察透镜被固定到光学定位器。 所述光学定位器被配置为使所述至少一个X射线光学元件和所述光学视觉透镜中的一个垂直于所述样品台上的所述样品,使得所述样品通过所述X射线光学器件沿着X射线照射 与光学视觉透镜垂直于样品,并且当光学视觉透镜与样品垂直时,光学透镜接收从样品反射的光。

    Optical Positioner Design in X-Ray Analyzer for Coaxial Micro-Viewing and Analysis
    2.
    发明申请
    Optical Positioner Design in X-Ray Analyzer for Coaxial Micro-Viewing and Analysis 有权
    X射线分析仪中的光学定位器设计,用于同轴微观观察和分析

    公开(公告)号:US20110013744A1

    公开(公告)日:2011-01-20

    申请号:US12503878

    申请日:2009-07-16

    CPC分类号: G21K7/00

    摘要: An X-ray analyzer includes a sample stage for holding and positioning a sample and an optical positioner assembly configured above the sample stage. The optical positioner assembly includes a body member having an opening; an optical positioner located within the opening; and at least one X-ray optic and an optical viewing lens coupled to a first camera. The at least one X-ray optic and the optical viewing lens are secured to the optical positioner. The optical positioner is configured to align one of the at least one X-ray optic and the optic viewing lens normal to the sample on the sample stage such that the sample is irradiated with X-rays through the X-ray optic along a path which is normal to the sample and coaxial with the optic viewing lens receiving light reflected from the sample when the optic viewing lens is positioned normal to the sample.

    摘要翻译: X射线分析仪包括用于保持和定位样品的样品台和配置在样品台上方的光学定位器组件。 光学定位器组件包括具有开口的本体构件; 位于开口内的光学定位器; 以及耦合到第一相机​​的至少一个X射线光学器件和光学观察镜头。 至少一个X射线光学元件和光学观察透镜被固定到光学定位器。 所述光学定位器被配置为使所述至少一个X射线光学元件和所述光学视觉透镜中的一个垂直于所述样品台上的所述样品,使得所述样品通过所述X射线光学器件沿着X射线照射 与光学视觉透镜垂直于样品,并且当光学视觉透镜与样品垂直时,光学透镜接收从样品反射的光。

    Indirect Method and Apparatus for Cooling a Silicon Drift Detector
    3.
    发明申请
    Indirect Method and Apparatus for Cooling a Silicon Drift Detector 审中-公开
    用于冷却硅漂移检测器的间接方法和装置

    公开(公告)号:US20080156996A1

    公开(公告)日:2008-07-03

    申请号:US11678225

    申请日:2007-02-23

    IPC分类号: G01T1/24 F25B9/02

    摘要: An apparatus for the indirect cooling of a silicon drift detector (SDD) includes an enclosure with a vacuum maintained therein, at least one SDD module that generates substantially no heat positioned within the enclosure, a cooling engine positioned remote from the SDD module within the enclosure for cooling the SDD module, whereby heat is generated by the cooling engine, a thermal conduction device comprising a first end thermally coupled to the cooling engine and a second end thermally coupled to the SDD module and a heat removal device thermally coupled to the cooling engine. The cooling engine indirectly cools the SDD module by transferring thermal energy through the thermal conduction device from the SDD module and the heat removal device dissipates the heat generated by the cooling engine to the environment surrounding the enclosure. A method for indirectly cooling a radiation detector is also provided.

    摘要翻译: 用于间接冷却硅漂移检测器(SDD)的装置包括保持真空的外壳,至少一个SDD模块,其基本上不产生定位在外壳内的热量;冷却引擎,其远离SDD模块定位在外壳内 用于冷却所述SDD模块,由此由所述冷却引擎产生热量;热传导装置,其包括热耦合到所述冷却发动机的第一端和与所述SDD模块热耦合的第二端;以及热联接到所述冷却发动机的散热装置 。 冷却发动机通过从SDD模块传递热能通过热传导装置间接冷却SDD模块,并且散热装置将冷却发动机产生的热量散发到外壳周围的环境中。 还提供了间接冷却辐射探测器的方法。

    Scatter spectra method for x-ray fluorescent analysis with optical components
    4.
    发明授权
    Scatter spectra method for x-ray fluorescent analysis with optical components 有权
    用光学元件进行X射线荧光分析的散射光谱法

    公开(公告)号:US06845147B2

    公开(公告)日:2005-01-18

    申请号:US10464073

    申请日:2003-06-17

    摘要: A method of measuring the transfer function of an X-ray optical component over a wide range of X-ray energies, which includes the steps of: using an X-ray optical component between an X-ray source and a scattering target to obtain a first scatter spectrum; obtaining a second scatter spectrum from the same or a similar target without the X-ray optical component between the X-ray source and the scattering target; and calculating the transfer function by the ratio of the first scatter spectrum to the second scatter spectrum. The method can be used to improve the accuracy of X-ray quantitative methods in an apparatus where an X-ray optical component is used between the X-ray source and the specimen to be investigated by utilizing the method described above.

    摘要翻译: 一种在宽范围的X射线能量上测量X射线光学部件的传递函数的方法,包括以下步骤:在X射线源和散射靶之间使用X射线光学部件,以获得 第一散射光谱;从X射线源和散射目标之间的X射线光学分量获得来自相同或相似目标的第二散射光谱; 并且通过第一散射光谱与第二散射光谱的比率来计算传递函数。 该方法可以用于提高X射线定量方法的精度,其中X射线光学部件通过利用上述方法在X射线源和待研究样本之间使用。

    Protective film for x-ray detector
    7.
    发明授权
    Protective film for x-ray detector 失效
    x射线探伤仪保护膜

    公开(公告)号:US5225677A

    公开(公告)日:1993-07-06

    申请号:US898772

    申请日:1992-06-12

    IPC分类号: G01T1/24

    CPC分类号: G01T1/244

    摘要: An x-ray detector assembly is improved by covering the detector holder with a dielectric film to prevent contamination of the sides of the detector without covering the front of the detector. The film does not hermetically seal the detector holder.

    摘要翻译: 通过用电介质膜覆盖检测器支架来改善X射线检测器组件,以防止检测器的侧面被污染而不覆盖检测器的前部。 胶片不会密封检测器支架。