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公开(公告)号:US12274061B2
公开(公告)日:2025-04-08
申请号:US17410895
申请日:2021-08-24
Applicant: KIOXIA CORPORATION
Inventor: Masaya Toda , Kota Takahashi , Kazuhiro Matsuo , Yuta Kamiya , Shinji Mori , Kenichiro Toratani
Abstract: A semiconductor device includes a stacked film of electrode layers and insulating layers. A charge storage layer is in a hole in the stacked film on a first insulating film. A channel layer is on the charge storage layer via a second insulating film. An adsorption promoting layer is on surfaces of a third insulating layer covering the insulating layers and the first insulating film facing the electrode layers. The third insulating film includes a first metal element and a first element, and the adsorption promoting layer includes a second element and a third element. The difference in electronegativity between the second element and the third element is larger than a difference in electronegativity between the first metal element and the first element.
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公开(公告)号:US11785774B2
公开(公告)日:2023-10-10
申请号:US17659881
申请日:2022-04-20
Applicant: KIOXIA CORPORATION
Inventor: Keiichi Sawa , Kazuhiro Matsuo , Kazuhisa Matsuda , Hiroyuki Yamashita , Yuta Saito , Shinji Mori , Masayuki Tanaka , Kenichiro Toratani , Atsushi Takahashi , Shouji Honda
IPC: H10B43/27 , H10B41/10 , H01L29/792 , H10B43/20 , H10B43/35
CPC classification number: H10B43/27 , H10B41/10 , H10B43/20 , H01L29/7926 , H10B43/35
Abstract: In one embodiment, a semiconductor device includes a substrate, insulating films and first films alternately stacked on the substrate, at least one of the first films including an electrode layer and a charge storage layer provided on a face of the electrode layer via a first insulator, and a semiconductor layer provided on a face of the charge storage layer via a second insulator. The device further includes at least one of a first portion including nitrogen and provided between the first insulator and the charge storage layer with an air gap provided in the first insulator, a second portion including nitrogen, provided between the charge storage layer and the second insulator, and including a portion protruding toward the charge storage layer, and a third portion including nitrogen and provided between the second insulator and the semiconductor layer with an air gap provided in the first insulator.
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公开(公告)号:US11974432B2
公开(公告)日:2024-04-30
申请号:US17412743
申请日:2021-08-26
Applicant: KIOXIA CORPORATION
Inventor: Hiroyuki Yamashita , Yuta Saito , Keiichi Sawa , Kazuhiro Matsuo , Yuta Kamiya , Shinji Mori , Kota Takahashi , Junichi Kaneyama , Tomoki Ishimaru , Kenichiro Toratani , Ha Hoang , Shouji Honda , Takafumi Ochiai
IPC: H10B43/27 , H01L21/28 , H01L29/423 , H10B41/27
CPC classification number: H10B43/27 , H01L29/40114 , H01L29/40117 , H01L29/42324 , H01L29/4234 , H10B41/27
Abstract: According to one embodiment, a semiconductor storage device includes a plurality of electrode films on a substrate, spaced from one another in a first direction. A charge storage film is provided on a side face the electrode films via a first insulating film. A semiconductor film is provided on a side face of the charge storage film via a second insulating film. The charge storage film includes a plurality of insulator regions contacting the first insulating film, a plurality of semiconductor or conductor regions provided between the insulator regions and another insulator region.
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公开(公告)号:US12101928B2
公开(公告)日:2024-09-24
申请号:US17460967
申请日:2021-08-30
Applicant: Kioxia Corporation
Inventor: Natsuki Fukuda , Ryota Narasaki , Takashi Kurusu , Yuta Kamiya , Kazuhiro Matsuo , Shinji Mori , Shoji Honda , Takafumi Ochiai , Hiroyuki Yamashita , Junichi Kaneyama , Ha Hoang , Yuta Saito , Kota Takahashi , Tomoki Ishimaru , Kenichiro Toratani
Abstract: A semiconductor storage device includes a first conductive layer that extends in a first direction; a second conductive layer that extends in the first direction and is arranged with the first conductive layer in a second direction; a first insulating layer that is provided between the first conductive layer and the second conductive layer; a semiconductor layer that extends in the second direction and faces the first conductive layer, the second conductive layer, and the first insulating layer in a third direction; a first charge storage layer that is provided between the first conductive layer and the semiconductor layer; a second charge storage layer that is provided between the second conductive layer and the semiconductor layer; a first high dielectric constant layer that is provided between the first conductive layer and the first charge storage layer; and a second high dielectric constant layer provided between the second conductive layer and the second charge storage layer. At least a portion of the first charge storage layer faces the second charge storage layer without the second high dielectric constant layer being interposed between the portion of the first charge storage layer and the second charge storage layer in the second direction.
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公开(公告)号:US20220302162A1
公开(公告)日:2022-09-22
申请号:US17412743
申请日:2021-08-26
Applicant: Kioxia Corporation
Inventor: Hiroyuki Yamashita , Yuta Saito , Keiichi Sawa , Kazuhiro Matsuo , Yuta Kamiya , Shinji Mori , Kota Takahashi , Junichi Kaneyama , Tomoki Ishimaru , Kenichiro Toratani , Ha Hoang , Shouji Honda , Takafumi Ochiai
IPC: H01L27/11582 , H01L27/11556 , H01L29/423 , H01L21/28
Abstract: According to one embodiment, a semiconductor storage device includes a plurality of electrode films on a substrate, spaced from one another in a first direction. A charge storage film is provided on a side face the electrode films via a first insulating film. A semiconductor film is provided on a side face of the charge storage film via a second insulating film. The charge storage film includes a plurality of insulator regions contacting the first insulating film, a plurality of semiconductor or conductor regions provided between the insulator regions and another insulator region.
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公开(公告)号:US11335699B2
公开(公告)日:2022-05-17
申请号:US17136621
申请日:2020-12-29
Applicant: KIOXIA CORPORATION
Inventor: Keiichi Sawa , Kazuhiro Matsuo , Kazuhisa Matsuda , Hiroyuki Yamashita , Yuta Saito , Shinji Mori , Masayuki Tanaka , Kenichiro Toratani , Atsushi Takahashi , Shouji Honda
IPC: H01L27/11582 , H01L29/792 , H01L27/11578 , H01L27/11519 , H01L27/1157
Abstract: In one embodiment, a semiconductor device includes a substrate, insulating films and first films alternately stacked on the substrate, at least one of the first films including an electrode layer and a charge storage layer provided on a face of the electrode layer via a first insulator, and a semiconductor layer provided on a face of the charge storage layer via a second insulator. The device further includes at least one of a first portion including nitrogen and provided between the first insulator and the charge storage layer with an air gap provided in the first insulator, a second portion including nitrogen, provided between the charge storage layer and the second insulator, and including a portion protruding toward the charge storage layer, and a third portion including nitrogen and provided between the second insulator and the semiconductor layer with an air gap provided in the first insulator.
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