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1.发明授权Low noise connector with cables having a center, middle and outer conductors 有权低噪声连接器，电缆具有中心，中间和外部导体公开(公告)号：US08167648B2
公开(公告)日：2012-05-01
申请号：US13030961
申请日：2011-02-18
IPC分类号： H01R9/05
CPC分类号： G01R31/2889 , H01R13/6597 , H01R24/562 , H01R2201/20
摘要： An adapter conductively interconnects a chuck of a probe station and an instrument. The adapter includes a signal conductor conductively connected to the chuck and selectively connectable to a respective one of a ground potential, a bayonet connector output and a signal connection for the instrument. A guard potential conductor conductively connected to the chuck and selectively connectable to a one of a ground potential and a guard connection for the instrument; and a shield conductor connected to a ground potential.
摘要翻译： 适配器导电地互连探针台的卡盘和仪器。 适配器包括导体连接到卡盘并且可选地可连接到地面电位，卡口连接器输出和仪器的信号连接中的相应一个的信号导体。 导电连接到卡盘并且可选择地连接到仪器的接地电位和保护连接中的一个的保护电位导体; 以及连接到地电位的屏蔽导体。
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公开(公告)号：US20110207370A1
公开(公告)日：2011-08-25
申请号：US13030961
申请日：2011-02-18
IPC分类号： H01R9/05
CPC分类号： G01R31/2889 , H01R13/6597 , H01R24/562 , H01R2201/20
摘要： An adapter conductively interconnects a chuck of a probe station and an instrument. The adapter includes a signal conductor conductively connected to the chuck and selectively connectable to a respective one of a ground potential, a bayonet connector output and a signal connection for the instrument. A guard potential conductor conductively connected to the chuck and selectively connectable to a one of a ground potential and a guard connection for the instrument; and a shield conductor connected to a ground potential.
摘要翻译： 适配器导电地互连探针台的卡盘和仪器。 适配器包括导体连接到卡盘并且可选地可连接到地面电位，卡口连接器输出和仪器的信号连接中的相应一个的信号导体。 导电连接到卡盘并且可选择地连接到仪器的接地电位和保护连接中的一个的保护电位导体; 以及连接到地电位的屏蔽导体。
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公开(公告)号：US20130075982A1
公开(公告)日：2013-03-28
申请号：US13702054
申请日：2011-04-11
申请人： Michael E. Simmons , Kazuki Negishi , Roy Jensen , Ryan Garrison , Philip Wolf
发明人： Michael E. Simmons , Kazuki Negishi , Roy Jensen , Ryan Garrison , Philip Wolf
IPC分类号： G01R31/26 , H01L21/683
CPC分类号： H01L21/6838 , G01R31/2601 , G01R31/2865 , G01R31/2874 , Y10T279/11 , Y10T279/34
摘要： A chuck for testing an integrated circuit includes an upper conductive layer having a lower surface and an upper surface suitable to support a device under test. An upper insulating layer has an upper surface at least in partial face-to-face contact with the lower surface of the upper conductive layer, and a lower surface. A middle conductive layer has an upper surface at least in partial face-to-face contact with the lower surface of the upper insulating layer, and a lower surface.
摘要翻译： 用于测试集成电路的卡盘包括具有适于支撑被测器件的下表面和上表面的上导电层。 上绝缘层具有与上导电层的下表面至少部分地面对面接触的上表面和下表面。 中间导电层具有至少与上绝缘层的下表面部分地面对面接触的上表面和下表面。
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4.发明申请公开(公告)号：US20120098559A1
公开(公告)日：2012-04-26
申请号：US13275107
申请日：2011-10-17
申请人： Bryan Bolt , Eric W. Strid , Kazuki Negishi , Steve Harris
发明人： Bryan Bolt , Eric W. Strid , Kazuki Negishi , Steve Harris
IPC分类号： G01R31/20
CPC分类号： G01J1/32 , G01J1/0242 , G01J1/0425 , G01J2001/0481 , G01J2001/4247 , G01R31/2635
摘要： Systems and methods for simultaneous optical testing of a plurality of devices under test. These systems and methods may include the use of an optical probe assembly that includes a power supply structure that is configured to provide an electric current to a plurality of devices under test (DUTs) and an optical collection structure that is configured to simultaneously collect electromagnetic radiation that may be produced by the plurality of DUTs and to provide the collected electromagnetic radiation to one or more optical detection devices. The systems and methods also may include the use of the optical probe assembly in an optical probe system to evaluate one or more performance parameters of each of the plurality of DUTs.
摘要翻译： 用于同时光学测试多个待测设备的系统和方法。 这些系统和方法可以包括使用光学探针组件，该光学探针组件包括电源结构，该电源结构被配置为向被测试的多个被测设备（DUT）提供电流，以及配置成同时收集电磁辐射的光学收集结构 其可以由多个DUT产生并且将收集的电磁辐射提供给一个或多个光学检测装置。 所述系统和方法还可以包括在光学探针系统中使用光学探针组件来评估多个DUT中的每一个的一个或多个性能参数。
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公开(公告)号：US09506973B2
公开(公告)日：2016-11-29
申请号：US13702054
申请日：2011-04-11
申请人： Michael E. Simmons , Kazuki Negishi , Roy Jensen , Ryan Garrison , Philip Wolf
发明人： Michael E. Simmons , Kazuki Negishi , Roy Jensen , Ryan Garrison , Philip Wolf
IPC分类号： G01R31/26 , H01L21/683 , G01R31/28
CPC分类号： H01L21/6838 , G01R31/2601 , G01R31/2865 , G01R31/2874 , Y10T279/11 , Y10T279/34
摘要： A chuck for testing an integrated circuit includes an upper conductive layer having a lower surface and an upper surface suitable to support a device under test. An upper insulating layer has an upper surface at least in partial face-to-face contact with the lower surface of the upper conductive layer, and a lower surface. A middle conductive layer has an upper surface at least in partial face-to-face contact with the lower surface of the upper insulating layer, and a lower surface.
摘要翻译： 用于测试集成电路的卡盘包括具有适于支撑被测器件的下表面和上表面的上导电层。 上绝缘层具有与上导电层的下表面至少部分地面对面接触的上表面和下表面。 中间导电层具有至少与上绝缘层的下表面部分地面对面接触的上表面和下表面。
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公开(公告)号：US20100127714A1
公开(公告)日：2010-05-27
申请号：US12590955
申请日：2009-11-16
申请人： Kazuki Negishi , Mark Hansen
发明人： Kazuki Negishi , Mark Hansen
IPC分类号： G01R29/26
摘要： A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.
摘要翻译： 闪烁噪声测试系统包括有保护的信号路径和可选择性地连接到被测设备的相应终端的无保护信号路径。 所选择的信号路径可连接终端，而不断开电缆或更换探头。
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7.发明授权Systems and methods for simultaneous optical testing of a plurality of devices under test 有权用于同时光学测试多个待测设备的系统和方法公开(公告)号：US08823406B2
公开(公告)日：2014-09-02
申请号：US13275107
申请日：2011-10-17
申请人： Bryan Bolt , Eric W. Strid , Kazuki Negishi , Steve Harris
发明人： Bryan Bolt , Eric W. Strid , Kazuki Negishi , Steve Harris
CPC分类号： G01J1/32 , G01J1/0242 , G01J1/0425 , G01J2001/0481 , G01J2001/4247 , G01R31/2635
摘要： Systems and methods for simultaneous optical testing of a plurality of devices under test. These systems and methods may include the use of an optical probe assembly that includes a power supply structure that is configured to provide an electric current to a plurality of devices under test (DUTs) and an optical collection structure that is configured to simultaneously collect electromagnetic radiation that may be produced by the plurality of DUTs and to provide the collected electromagnetic radiation to one or more optical detection devices. The systems and methods also may include the use of the optical probe assembly in an optical probe system to evaluate one or more performance parameters of each of the plurality of DUTs.
摘要翻译： 用于同时光学测试多个待测设备的系统和方法。 这些系统和方法可以包括使用光学探针组件，该光学探针组件包括电源结构，该电源结构被配置为向被测试的多个被测设备（DUT）提供电流，以及配置成同时收集电磁辐射的光学收集结构 其可以由多个DUT产生并且将收集的电磁辐射提供给一个或多个光学检测装置。 所述系统和方法还可以包括在光学探针系统中使用光学探针组件来评估多个DUT中的每一个的一个或多个性能参数。
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公开(公告)号：US08319503B2
公开(公告)日：2012-11-27
申请号：US12590955
申请日：2009-11-16
申请人： Kazuki Negishi , Mark Hansen
发明人： Kazuki Negishi , Mark Hansen
摘要： A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.
摘要翻译： 闪烁噪声测试系统包括有保护的信号路径和可选择性地连接到被测设备的相应终端的无保护信号路径。 所选择的信号路径可连接终端，而不断开电缆或更换探头。
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