摘要:
The well regions of pumping units of charge pump circuits are maintained electrically floating. By maintaining the wells electrically floating, reduced impact from the body effect may be obtained. More specifically, integrated circuit charge pump circuits boost a first voltage from a voltage source to a second voltage at an output terminal. The charge pump circuits include a plurality of pumping units in an integrated circuit substrate of first conductivity type, that are serially connected between the voltage source and the output terminal. Each of the pumping units includes a well region of second conductivity type in the integrated circuit substrate of first conductivity type. The well region of second conductivity type is electrically floating. Each pumping unit also includes a transistor of the first conductivity type in the floating well region of second conductivity type, and a capacitor that is electrically connected to the transistor of the first conductivity type in the floating well region of second conductivity type.
摘要:
A memory device in accordance with embodiments of the present invention includes a reference cell array and a plurality of banks. Each of the banks includes memory cells. A plurality of current copier circuits corresponds to the banks, respectively. Each of the current copier circuits copies a reference current flowing through a reference cell array to generate a reference voltage. A plurality of sense blocks correspond to the banks, respectively. Each of the sense blocks includes a plurality of sense amplifiers for sensing data from a corresponding bank in response to the reference voltage from the corresponding current copier circuit. Memory cell lay-out area is reduced, and sense speed is increased.
摘要:
The NOR flash memory device according to the present invention is operated by a high voltage supplied from bitline selection transistors and includes a bitline bias circuit for supplying a bias voltage of a constant level to the bitline bias transistor. In accordance with the present invention, it is possible to stably supply a desired voltage closing to a power voltage to the bitline bias transistor.
摘要:
In the non-volatile semiconductor memory device having a sense amplifier for sensing data stored in a selected memory cell by comparing cell current differences from a reference cell, a current sink unit coupled in parallel with a reference line and a data line are provided. The reference line connects between the reference cell and the sense amplifier, and the data line connects between the selected memory cell and the sense amplifier, where the current sink unit together increases currents of the reference line and the data line. Also, the device includes a sink current control unit having a configuration of a current mirror with the current sink unit, the sink current control unit consisting of a switching unit and being for controlling a sink current of the current sink unit. The device improves data sensing speed and controls sensing current in conformity with the characteristics of a memory cell.
摘要:
A circuit includes an input for receiving an input signal, a delay chain connected to the input for delaying the input signal, and a circuit configuration connected to the delay chain downstream of the input, the circuit configuration for supplying a voltage to the delay chain in response to the input signal.
摘要:
Disclosed is a charge pump circuit that operates responsive to a test or general operation mode. The charge pump circuit includes at least one charge pump part. A voltage level sensing block generates a level sensing signal by sensing an output voltage. An oscillator generates complementary pulse signals responsive to the level sensing signal. And a selecting circuit block generates a selected voltage that is one of a high voltage and a supply voltage to the at least one charge pump part, the high voltage having a level higher than the supply voltage.
摘要:
A word line voltage generating circuit has a high voltage generator for generating a high voltage is response to an activation signal. In addition it has a regulator circuit that includes two successive regulators. The first regulator receives the high voltage and outputs an intermediate voltage in response to a reference voltage and the activation signal. The first regulator receives the reference voltage, and adjusts the high voltage to deliver a word line voltage. The second stage includes has a depletion-type NMOS transistor, which can clamp the high voltage to a voltage of a required level.
摘要:
A driving circuit having an output terminal includes an input terminal coupled to a first control signal; a first transistor having a current path connected between a pumping voltage and the output terminal and having a control electrode coupled to the first control signal; a second transistor having a current path connected to the output terminal and having a control electrode coupled to the first control signal; and a node connected to the output terminal through the current path of the second transistor and being responsive to a second control signal.
摘要:
Methods of verifying a program state may be provided for a non-volatile memory device including a multi-bit memory cell transistor providing more than two different program states. More particularly, the multi-bit memory cell transistor may be programmed from a first program state to a second program state, and a reference memory cell corresponding to the second program state may be selected. After programming the multi-bit memory cell transistor to the second program state and after selecting the reference memory cell corresponding to the second program state, a current flowing through the multi-bit memory cell transistor programmed to the second memory state and a current flowing through the reference memory cell may be compared. Programming the multi-bit memory cell transistor to the second program state may then be verified responsive to comparing the currents flowing through the multi-bit memory cell and the reference memory cell.
摘要:
A memory device includes a sense amplifier circuit, a tri-state buffer, a data latch circuit and a data line. The sense amplifier circuit senses and amplifies a current of a memory cell. The tri-state buffer receives an output of the sense amplifier circuit. The data latch circuit latches an output of the tri-state buffer. The data line connects the tri-state buffer and the data latch circuit. The memory device removes charge on the data line using a latch enable signal, which is applied to the tri-state buffer before a read operation.