Eyedrops containing particulate agar
    2.
    发明申请
    Eyedrops containing particulate agar 审中-公开
    含有颗粒状琼脂的滴眼液

    公开(公告)号:US20080199524A1

    公开(公告)日:2008-08-21

    申请号:US11810524

    申请日:2007-06-06

    IPC分类号: A61K9/14

    CPC分类号: A61K9/0048 A61K9/08

    摘要: It is intended to prepare a composition which contains polysaccharide at a high concentration and yet remains in the state of a liquid having low viscosity to thereby provide drugs, eyedrops, foods, cosmetics, toiletry products having a novel texture or function. The composition in the state of a liquid having low viscosity is obtained by heating polysaccharide at a high concentration in a water-containing liquid and then cooling under applying a shear force, which enables the provision of the above-described drugs. The composition is usable as an aqueous drug vehicle which is free from gelling due to temperature changes during storage and easily applied without pouring and/or streaming down. Eyedrops containing agar have an effect of enhancing ocular drug penetration. Eyedrops containing particulate agar maintain a low viscosity and, achieve easy instillation and impart a favorable feel in instillation.

    摘要翻译: 本发明的目的在于制备含有高浓度多糖但仍具有低粘度的液体状态的组合物,从而提供具有新颖的质地或功能的药物,滴眼剂,食品,化妆品,化妆品等。 通过在含水液体中以高浓度加热多糖,然后在施加剪切力的条件下冷却,得到具有低粘度的液体状态的组合物,从而能够提供上述药物。 该组合物可用作水性药物载体,其由于储存期间的温度变化而没有胶凝,并且容易施用而没有倾倒和/或流下。 含有琼脂的滴眼液具有增强眼药物渗透的作用。 含有颗粒状琼脂的喷雾剂保持低粘度,并且实现容易滴注并赋予滴注有利的感觉。

    Method and apparatus for reducing OPC model errors
    4.
    发明授权
    Method and apparatus for reducing OPC model errors 失效
    减少OPC模型误差的方法和装置

    公开(公告)号:US07325225B2

    公开(公告)日:2008-01-29

    申请号:US11243933

    申请日:2005-10-05

    IPC分类号: G06F17/50

    CPC分类号: G03F1/36 G03F1/68

    摘要: It is important to assess and reduce errors that arise in mask correction techniques such as optical proximity correction. A preliminary mask is obtained using an OPC model. An etched wafer is created from the preliminary mask using lithography, and first and second critical dimensions (CD) are measured on the wafer and. An edge placement error (EPE) is determined that corresponds to a difference between a measured value and a desired value of the second CD. These steps are repeated for a plurality of different values of the first CD, and of for each of the values of, the measured value of the second CD is correlated with its corresponding value on the mask as predicted by the OPC model. Δ difference ΔCD is obtained between the difference of the mask CDs calculated by interpolation of wafer CD measurements and by OPC model predictions and is transformed into an OPC model error.

    摘要翻译: 重要的是评估和减少在诸如光学邻近校正的掩模校正技术中出现的错误。 使用OPC模型获得初步掩模。 使用光刻从初步掩模创建蚀刻的晶片,并且在晶片上测量第一和第二临界尺寸(CD)。 确定对应于测量值和第二CD的期望值之间的差的边缘放置误差(EPE)。 对于第一CD的多个不同值重复这些步骤,并且对于每个值,第二CD的测量值与由OPC模型预测的掩模上的对应值相关。 在通过晶片CD测量的插值和OPC模型预测计算出的掩模CD的差异之间获得差值DeltaCD,并将其转换为OPC模型误差。

    Semiconductor device and method of fabricating the same
    5.
    发明授权
    Semiconductor device and method of fabricating the same 有权
    半导体装置及其制造方法

    公开(公告)号:US08252692B2

    公开(公告)日:2012-08-28

    申请号:US13169140

    申请日:2011-06-27

    申请人: Masahiro Inohara

    发明人: Masahiro Inohara

    IPC分类号: H01L29/72

    摘要: A semiconductor device according to one embodiment includes: a substrate having an element region where a semiconductor element is formed; a via hole formed in a portion of the substrate adjacent to the element region; a conducting portion provided in the via hole via an insulating layer; and a buffer layer provided between the substrate and the insulating layer, wherein the buffer layer is made of a material in which a difference in thermal expansion coefficient between the substrate and the buffer layer is smaller than that between the substrate and the insulating layer.

    摘要翻译: 根据一个实施例的半导体器件包括:具有形成半导体元件的元件区域的衬底; 形成在所述基板的与所述元件区域相邻的部分中的通孔; 导电部,其经由绝缘层设置在所述通孔中; 以及设置在所述基板和所述绝缘层之间的缓冲层,其中所述缓冲层由所述基板和所述缓冲层之间的热膨胀系数的差小于所述基板和所述绝缘层之间的热膨胀系数的差异的材料制成。

    Manufacturing method of semiconductor device using chemical mechanical
polishing
    7.
    发明授权
    Manufacturing method of semiconductor device using chemical mechanical polishing 失效
    使用化学机械抛光的半导体器件的制造方法

    公开(公告)号:US5948698A

    公开(公告)日:1999-09-07

    申请号:US951164

    申请日:1997-10-15

    摘要: A method for fabricating a semiconductor device at low cost is provided in which a mask layer having a very large polishing selection ratio is used as a polishing stop film by forming the polishing stop film in self-alignment. An object layer to be flattened is formed on a substrate. The object layer contains an irregularity. A polishing stop film which is polished at a slower rate and a mask layer which is polished at about the same rate as the object layer are deposited on the object layer. Then, the mask layer on a high level portion of the object layer is removed by chemical-mechanical polishing. The polishing stop film is etched other than under the mask layer, so that the polishing stop film at the high level portion and side wall of the step is removed. Because the polishing stop film at the convex portions (high level portion) is removed by etching utilizing a chemical reaction without using chemical-mechanical polishing, it is possible to select a material for the polishing stop film which is polished at a very slow rate. After that, the mask layer and the object layer at the convex portion are removed by CMP to level off the object layer with the concave portion.

    摘要翻译: 提供了一种以低成本制造半导体器件的方法,其中通过以自对准形成抛光停止膜,将具有非常大的抛光选择比的掩模层用作抛光停止膜。 待平坦化的物体层形成在基板上。 对象层包含不规则。 以较慢的速度抛光的抛光停止膜和以与物体层大致相同的速率抛光的掩模层沉积在物体层上。 然后,通过化学机械抛光去除目标层高层部分上的掩模层。 除了在掩模层下面蚀刻抛光停止膜,从而去除在台阶的高级部分和侧壁处的抛光停止膜。 由于在不使用化学机械抛光的情况下通过化学反应的蚀刻来除去凸部(高级部)的抛光停止膜,因此可以选择以非常慢的速度抛光的抛光停止膜的材料。 之后,通过CMP去除掩模层和凸部处的物体层,使其与凹部平坦化。

    PROCESS FOR PRODUCTION OF POLYPHENYLENE SULFIDE RESIN
    8.
    发明申请
    PROCESS FOR PRODUCTION OF POLYPHENYLENE SULFIDE RESIN 审中-公开
    生产聚苯乙烯树脂的方法

    公开(公告)号:US20100249342A1

    公开(公告)日:2010-09-30

    申请号:US12741652

    申请日:2007-11-08

    IPC分类号: C08G75/14

    CPC分类号: C08G75/0259 C08G75/0213

    摘要: A process for producing a polyphenylene sulfide resin with properties of (1) 0.3 wt % or less in the amount of the volatile gas generated when heated and melted at 320° C. in vacuum for 2 hours, (2) 0.3 wt % or less in the ash content achieved when incinerated at 550° C., (3) 4.0 wt % or less in the residue amount achieved when a solution with 1 part by weight of the polyphenylene sulfide resin dissolved in 20 parts by weight of 1-chloronaphthalene is pressure-filtered by a PTFE membrane filter with a pore size of 1 μm at 250° C. for 5 minutes, and (4) higher than 500 g/10 min in melt flow rate (according to ASTM D-1238-70: measured at a temperature of 315.5° C. and at a load of 5000 g), by acid-treating a polyphenylene sulfide resin in an acid treatment step and subsequently treating it for thermal oxidation in a thermal oxidation step.

    摘要翻译: 一种聚苯硫醚树脂的制造方法,其特征在于,在320℃,真空中加热熔融2小时时产生的挥发性气体的量为0.3重量%以下,(2)0.3重量%以下 当在550℃下焚烧时实现的灰分含量为(3)当溶解在20重量份1-氯萘中的1重量份聚苯硫醚树脂的溶液中时,残留量为4.0重量%以下为 通过孔径为1μm的PTFE膜过滤器在250℃下进行5分钟压力过滤,和(4)高于500g / 10min的熔体流动速率(根据ASTM D-1238-70:测量 在315.5℃的温度和5000g的负荷下),在酸处理步骤中对聚苯硫醚树脂进行酸处理,随后在热氧化步骤中进行热氧化处理。

    Method and apparatus for reducing OPC model errors
    9.
    发明申请
    Method and apparatus for reducing OPC model errors 失效
    减少OPC模型误差的方法和装置

    公开(公告)号:US20070079278A1

    公开(公告)日:2007-04-05

    申请号:US11243933

    申请日:2005-10-05

    IPC分类号: G06F17/50

    CPC分类号: G03F1/36 G03F1/68

    摘要: A method is provided of accessing model error in an optical proximity correction (OPC) model. The method begins by obtaining a preliminary mask using an OPC model, creating an etched wafer from the preliminary mask using lithography, and measuring a specified critical dimension (CD) on the wafer and a second CD on the wafer. An edge placement error (EPE) is determined that corresponds to a difference between a measured value of the second CD on the wafer and a desired value of the second CD on the wafer. The aforementioned steps are repeated for a plurality of different values of the specified CD to obtain an EPE for each of the different values of the specified CD. For each of the plurality of values of the specified CD, a measured value of a second CD on the wafer is correlated with a corresponding value of the second CD on the mask. For each of the plurality of values of the specified CD, the measured value of the second CD on the wafer is correlated with its corresponding value of the second CD on the mask as predicted by the OPC model. For each of the immediately preceding correlations that are obtained, and at a selected measured value of the second CD on the wafer, a difference Δ is obtained between the difference of the mask CDs calculated by interpolation of wafer CD measurements and by OPC model predictions. Each value of Δ is transformed into an OPC model error that each correspond to a particular value of the specified CD.

    摘要翻译: 提供了一种访问光学邻近校正(OPC)模型中的模型误差的方法。 该方法开始于使用OPC模型获得初步掩模,使用光刻从初步掩模创建蚀刻晶片,并测量晶片上的指定临界尺寸(CD)和晶片上的第二CD。 确定对应于晶片上的第二CD的测量值与晶片上的第二CD的期望值之间的差异的边缘放置误差(EPE)。 针对指定CD的多个不同值重复上述步骤,以获得指定CD的每个不同值的EPE。 对于指定CD的多个值中的每一个,晶片上的第二CD的测量值与掩模上的第二CD的相应值相关。 对于指定CD的多个值中的每一个,晶片上的第二CD的测量值与由OPC模型预测的掩模上的第二CD的对应值相关。 对于所获得的每个先前相关性,并且在晶片上的第二CD的选定测量值处,通过硅片CD测量的插值和通过OPC模型预测计算出的掩模CD的差异获得差值Delta。 Delta的每个值被转换成OPC模型错误,每个对应于指定CD的特定值。

    Method for producing aromatic compounds having alkyl group with at least three carbon atoms
    10.
    发明授权
    Method for producing aromatic compounds having alkyl group with at least three carbon atoms 失效
    制备具有至少3个碳原子的烷基的芳族化合物的方法

    公开(公告)号:US06462248B1

    公开(公告)日:2002-10-08

    申请号:US09385270

    申请日:1999-08-30

    IPC分类号: C07C2508

    摘要: Aromatic compounds having an alkyl group with at least 3 carbon atoms are produced in a process comprising at least one of the following steps: (1) a step of contacting a starting material that contains an aromatic compound having a branched alkyl group with at least 3 carbon atoms, with a zeolite-containing catalyst in a liquid phase in the presence of hydrogen therein, thereby changing the position of the carbon atoms of the alkyl group bonding to the aromatic ring of the compound; (2) a step of contacting a starting material that contains an aromatic compound having a branched alkyl group with at least 3 carbon atoms, with a catalyst containing zeolite and containing rhenium and/or silver, in a liquid phase, thereby changing the position of the carbon atoms of, the alkyl group bonding to the aromatic ring of the compound; (3) a step of contacting a halogenated aromatic compound having an alkyl group with at least 3 carbon atoms, with an acid-type catalyst, thereby isomerizing the compound; (4) a step of treating a mixture of isomers of an aromatic compound having an alkyl group with at least 3 carbon atoms, with a zeolite adsorbent that contains at least one exchangable cation selected from alkali metals, alkaline earth metals, lead, thallium and silver, thereby separating a specific isomer from the isomer mixture through adsorption.

    摘要翻译: 具有至少3个碳原子的烷基的芳香族化合物是以至少一个以下步骤的方法生产的:(1)使包含具有支链烷基的芳族化合物的原料与至少3个 碳原子与含有沸石的催化剂在氢气存在下在液相中,从而改变与化合物的芳环键合的烷基的碳原子的位置;(2)使起始 含有具有至少3个碳原子的支链烷基的芳族化合物的物质,含有沸石的催化剂,含有铼和/或银的液相,从而改变了烷基键合的碳原子的位置 化合物的芳香环;(3)使具有至少3个碳原子的烷基的卤代芳族化合物与酸型催化剂接触的步骤,从而使组合物异构化 (4)将具有至少3个碳原子的具有烷基的芳族化合物的异构体的混合物与沸石吸附剂一起处理的步骤,所述沸石吸附剂含有至少一种选自碱金属,碱土金属,铅, 铊和银,从而通过吸附从异构体混合物中分离出特定异构体。