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公开(公告)号：US10217524B2
公开(公告)日：2019-02-26
申请号：US15412148
申请日：2017-01-23
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Francesco Falanga , Victor Tsai
Abstract: Methods of managing systems comprising a processor and a memory device external to the processor, including exposing the memory device to temperature levels associated with soldering, starting up the memory device and testing pre-programmed data using control circuitry of the memory device. When results of the testing indicate repair of the pre-programmed data should be performed, issuing a command from the processor to the memory device indicative of a desire for the memory device to repair the pre-programmed data, and in response to the memory device receiving the command, repairing the pre-programmed data using the control circuitry of the memory device.
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公开(公告)号：US20150082104A1
公开(公告)日：2015-03-19
申请号：US14552863
申请日：2014-11-25
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Francesco Falanga , Victor Tsai
CPC classification number: G11C29/38 , G11C16/0483 , G11C16/3418 , G11C29/36 , G11C29/4401 , G11C29/52 , G11C2029/0407 , G11C2029/0409
Abstract: Memory devices storing particular data, systems containing such memory devices and methods of testing such memory devices. The memory devices include an array of memory cells containing particular data, and control circuitry configured to control operations of the array of memory cells. The control circuitry is further configured to perform a test of the particular data in response to a command received from an external device and perform a repair of the particular data when results of the test indicate that repair of the particular data is needed
Abstract translation: 存储特定数据的存储器件，包含这种存储器件的系统以及测试这样的存储器件的方法。 存储器件包括包含特定数据的存储器单元的阵列，以及被配置为控制存储器单元阵列的操作的控制电路。 控制电路还被配置为响应于从外部设备接收的命令来执行特定数据的测试，并且当测试结果指示需要修复特定数据时执行特定数据的修复
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公开(公告)号：US10664411B2
公开(公告)日：2020-05-26
申请号：US15470590
申请日：2017-03-27
Applicant: Micron Technology, Inc.
Inventor： Victor Tsai , William Henry Radke , Bob Leibowitz
Abstract: Memory devices and methods are described and shown that are capable of being configured in a chain. In one configuration, a single data input port and a single data output port are utilized at a host to communicate with the chain of memory devices. Methods for assigning identifiers to memory devices in the chain are described that include detection of a presence or absence of downstream memory devices. In selected examples, identifiers are assigned sequentially to memory devices in the chain until no additional downstream memory devices are detected.
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公开(公告)号：US09552895B2
公开(公告)日：2017-01-24
申请号：US14552863
申请日：2014-11-25
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Francesco Falanga , Victor Tsai
CPC classification number: G11C29/38 , G11C16/0483 , G11C16/3418 , G11C29/36 , G11C29/4401 , G11C29/52 , G11C2029/0407 , G11C2029/0409
Abstract: Memory devices storing particular data, systems containing such memory devices and methods of testing such memory devices. The memory devices include an array of memory cells containing particular data, and control circuitry configured to control operations of the array of memory cells. The control circuitry is further configured to perform a test of the particular data in response to a command received from an external device and perform a repair of the particular data when results of the test indicate that repair of the particular data is needed
Abstract translation: 存储特定数据的存储器件，包含这种存储器件的系统以及测试这样的存储器件的方法。 存储器件包括包含特定数据的存储器单元的阵列，以及被配置为控制存储器单元阵列的操作的控制电路。 控制电路还被配置为响应于从外部设备接收的命令来执行特定数据的测试，并且当测试结果指示需要修复特定数据时执行特定数据的修复
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公开(公告)号：US20140040507A1
公开(公告)日：2014-02-06
申请号：US14053255
申请日：2013-10-14
Applicant: Micron Technology, Inc.
Inventor： Victor Tsai , William Henry Radke , Bob Leibowitz
IPC: G06F11/30
CPC classification number: G06F12/1081 , G06F3/007 , G06F11/3034 , G06F13/16 , G06F13/28 , G06F13/4063 , G06F13/4208 , G06F13/4234
Abstract: Memory devices and methods are described and shown that are capable of being configured in a chain. In one configuration, a single data input port and a single data output port are utilized at a host to communicate with the chain of memory devices. Methods for assigning identifiers to memory devices in the chain are described that include detection of a presence or absence of downstream memory devices. In selected examples, identifiers are assigned sequentially to memory devices in the chain until no additional downstream memory devices are detected.
Abstract translation: 描述和示出了能够在链中配置的存储器件和方法。 在一个配置中，主机使用单个数据输入端口和单个数据输出端口与存储器设备链路进行通信。 描述了将标识符分配给链中的存储器件的方法，其包括检测下游存储器件的存在或不存在。 在所选择的示例中，标识符被顺序地分配给链中的存储设备，直到没有检测到附加的下游存储器设备。
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Patent Agency Ranking
公开(公告)号：US20170133105A1
公开(公告)日：2017-05-11
申请号：US15412148
申请日：2017-01-23
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Francesco Falanga , Victor Tsai
CPC classification number: G11C29/38 , G11C16/0483 , G11C16/3418 , G11C29/36 , G11C29/4401 , G11C29/52 , G11C2029/0407 , G11C2029/0409
Abstract: Methods of managing systems comprising a processor and a memory device external to the processor, including exposing the memory device to temperature levels associated with soldering, starting up the memory device and testing pre-programmed data using control circuitry of the memory device. When results of the testing indicate repair of the pre-programmed data should be performed, issuing a command from the processor to the memory device indicative of a desire for the memory device to repair the pre-programmed data, and in response to the memory device receiving the command, repairing the pre-programmed data using the control circuitry of the memory device.
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公开(公告)号：US09606885B2
公开(公告)日：2017-03-28
申请号：US14053255
申请日：2013-10-14
Applicant: Micron Technology, Inc.
Inventor： Victor Tsai , William Henry Radke , Bob Leibowitz
CPC classification number: G06F12/1081 , G06F3/007 , G06F11/3034 , G06F13/16 , G06F13/28 , G06F13/4063 , G06F13/4208 , G06F13/4234
Abstract: Memory devices and methods are described and shown that are capable of being configured in a chain. In one configuration, a single data input port and a single data output port are utilized at a host to communicate with the chain of memory devices. Methods for assigning identifiers to memory devices in the chain are described that include detection of a presence or absence of downstream memory devices. In selected examples, identifiers are assigned sequentially to memory devices in the chain until no additional downstream memory devices are detected.
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公开(公告)号：US20140229777A1
公开(公告)日：2014-08-14
申请号：US13767389
申请日：2013-02-14
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Francesco Falanga , Victor Tsai
IPC: G11C29/44
CPC classification number: G11C29/38 , G11C16/0483 , G11C16/3418 , G11C29/36 , G11C29/4401 , G11C29/52 , G11C2029/0407 , G11C2029/0409
Abstract: Testing methods in a pre-programmed memory device after it has been assembled into a final customer platform include issuing a self-test command to the memory device, the memory device reporting results of a self-test of pre-programmed data executed responsive to receiving the self-test command, and issuing a self-repair command responsive to the results indicating repair of the pre-programmed data is needed.
Abstract translation: 预先编程的存储器件中的测试方法已经被组装到最终的客户平台中之后，包括向存储器件发出自检命令，该存储器件报告响应于接收执行的预编程数据的自检的结果 自检命令，并且响应于指示预编程数据的修复的结果发出自修复命令。
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公开(公告)号：US20170199828A1
公开(公告)日：2017-07-13
申请号：US15470590
申请日：2017-03-27
Applicant: Micron Technology, Inc
Inventor： Victor Tsai , William Henry Radke , Bob Leibowitz
CPC classification number: G06F12/1081 , G06F3/007 , G06F11/3034 , G06F13/16 , G06F13/28 , G06F13/4063 , G06F13/4208 , G06F13/4234
Abstract: Memory devices and methods are described and shown that are capable of being configured in a chain. In one configuration, a single data input port and a single data output port are utilized at a host to communicate with the chain of memory devices. Methods for assigning identifiers to memory devices in the chain are described that include detection of a presence or absence of downstream memory devices. In selected examples, identifiers are assigned sequentially to memory devices in the chain until no additional downstream memory devices are detected.
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公开(公告)号：US08904250B2
公开(公告)日：2014-12-02
申请号：US13767389
申请日：2013-02-14
Applicant: Micron Technology, Inc.
Inventor： Francesco Falanga , Victor Tsai
CPC classification number: G11C29/38 , G11C16/0483 , G11C16/3418 , G11C29/36 , G11C29/4401 , G11C29/52 , G11C2029/0407 , G11C2029/0409
Abstract: Testing methods in a pre-programmed memory device after it has been assembled into a final customer platform include issuing a self-test command to the memory device, the memory device reporting results of a self-test of pre-programmed data executed responsive to receiving the self-test command, and issuing a self-repair command responsive to the results indicating repair of the pre-programmed data is needed.
Abstract translation: 预先编程的存储器件中的测试方法已经被组装到最终的客户平台中之后，包括向存储器件发出自检命令，该存储器件报告响应于接收执行的预编程数据的自检的结果 自检命令，并且响应于指示预编程数据的修复的结果发出自修复命令。
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