Configurable reliability for memory devices

    公开(公告)号:US10031801B2

    公开(公告)日:2018-07-24

    申请号:US14956335

    申请日:2015-12-01

    Abstract: Technology relating to configurable reliability schemes for memory devices is disclosed. The technology includes a memory controller that selectively controls at least a type or an extent of a reliability scheme for at least a portion of a memory device. The technology also includes a computing device that can dynamically select and employ reliability schemes from a collection of different reliability schemes. A reliability scheme may be selected on a per-process, per-allocation request, per-page, per-cache-line, or other basis. The reliability schemes may include use of parity, use of data mirroring, use of an error correction code (ECC), storage of data without redundancy, etc.

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