Multiple-stage power amplifiers and devices with low-voltage driver stages

    公开(公告)号:US11128269B2

    公开(公告)日:2021-09-21

    申请号:US16718679

    申请日:2019-12-18

    Applicant: NXP USA, Inc.

    Abstract: An amplifier includes a driver stage amplifier transistor and a final stage amplifier transistor, which are integrated in a semiconductor die. The driver stage amplifier transistor has a driver stage input, a driver stage output, and an output impedance, and the driver stage amplifier transistor is configured to operate using a first bias voltage at the driver stage output. The final stage amplifier transistor has a final stage input, a final stage output, and an input impedance. The final stage input is electrically coupled to the driver stage output. The final stage amplifier transistor is configured to operate using a second bias voltage at the final stage output, and the second bias voltage is at least twice as large as the first bias voltage.

    Amplifier die bond pad design and amplifier die arrangement for compact Doherty amplifier modules

    公开(公告)号:US10903182B1

    公开(公告)日:2021-01-26

    申请号:US16563743

    申请日:2019-09-06

    Applicant: NXP USA, INC.

    Abstract: Embodiments of a method and device are disclosed. In an embodiment, a Doherty amplifier module includes a substrate including a mounting surface, and a carrier amplifier die, a first peaking amplifier die, and a second peaking amplifier die on the mounting surface. The carrier amplifier die includes a first output bond pad that has a first length and a first width. The first peaking amplifier die includes a second output bond pad including a first main pad portion having a second length and a second width and including a first side pad portion having a third length and a third width. At least one of the second width or the third width is greater than the first width. The second peaking amplifier includes a third output bond pad. A first wirebond array is coupled between the third output bond pad and at least the first side pad portion.

    Methods and assemblies for tuning electronic modules

    公开(公告)号:US11693029B2

    公开(公告)日:2023-07-04

    申请号:US17378349

    申请日:2021-07-16

    Applicant: NXP USA, Inc.

    CPC classification number: G01R1/07335 G01R31/2808 G01R1/06766

    Abstract: Evaluation board (EVB) assemblies or stacks utilized in tuning electronic modules are disclosed, as are methods for tuning such modules. In embodiments, the module testing assembly includes an EVB and an EVB baseplate. The EVB includes, in turn, an EVB through-port extending from a first EVB side to a second, opposing EVB side; and a module mount region on the first EVB side and extending about a periphery of the EVB through-port. The module mount region is shaped and sized to accommodate installation of a sample electronic module provided in a partially-completed, pre-encapsulated state fabricated in accordance with a separate thermal path electronic module design. A baseplate through-port combines with the EVB through-port to form a tuning access tunnel providing physical access to circuit components of the sample electronic module through the EVB baseplate from the second EVB side when the sample electronic module is installed on the module mount region.

    METHODS AND ASSEMBLIES FOR TUNING ELECTRONIC MODULES

    公开(公告)号:US20230014716A1

    公开(公告)日:2023-01-19

    申请号:US17378349

    申请日:2021-07-16

    Applicant: NXP USA, Inc.

    Abstract: Evaluation board (EVB) assemblies or stacks utilized in tuning electronic modules are disclosed, as are methods for tuning such modules. In embodiments, the module testing assembly includes an EVB and an EVB baseplate. The EVB includes, in turn, an EVB through-port extending from a first EVB side to a second, opposing EVB side; and a module mount region on the first EVB side and extending about a periphery of the EVB through-port. The module mount region is shaped and sized to accommodate installation of a sample electronic module provided in a partially-completed, pre-encapsulated state fabricated in accordance with a separate thermal path electronic module design. A baseplate through-port combines with the EVB through-port to form a tuning access tunnel providing physical access to circuit components of the sample electronic module through the EVB baseplate from the second EVB side when the sample electronic module is installed on the module mount region.

    Compact three-way Doherty amplifier module

    公开(公告)号:US11050388B2

    公开(公告)日:2021-06-29

    申请号:US16563728

    申请日:2019-09-06

    Applicant: NXP USA, INC.

    Abstract: Embodiments of a method and a device are disclosed. In an embodiment, a Doherty amplifier module includes a substrate including a mounting surface, and further includes a first amplifier die, a second amplifier die, and a third amplifier die on the mounting surface. The first amplifier die is configured to amplify a first radio frequency (RF) signal along a first signal path, the second amplifier die is configured to amplify a second RF signal along a second signal path, and the third amplifier die is configured to amplify a third RF signal along a third signal path. A side of the first amplifier die including a first output terminal faces a side of the second amplifier die including a second output terminal. The second signal path is parallel to the first signal path, and the third signal path is orthogonal to the first and second signal paths.

    Doherty power amplifiers and devices with low voltage driver stage in carrier-path and high voltage driver stage in peaking-path

    公开(公告)号:US11515842B2

    公开(公告)日:2022-11-29

    申请号:US17071991

    申请日:2020-10-15

    Applicant: NXP USA, Inc.

    Abstract: Doherty power amplifiers and devices are described with a low voltage driver stage in a carrier-path and a high voltage driver stage in a peaking-path. In an embodiment a Doherty power amplifier has a carrier-path driver stage transistor configured to operate using a first bias voltage at the driver stage output, and a final stage transistor configured to operate using a second bias voltage at the final stage output. A peaking-path driver stage transistor is configured to operate using a third bias voltage at the driver stage output, and a final stage transistor electrically coupled to the driver stage output of the peaking-path driver stage transistor is configured to operate using a fourth bias voltage at the final stage output, wherein the third bias voltage is at least twice as large as the first bias voltage.

    MULTIPLE-STAGE POWER AMPLIFIERS AND DEVICES WITH LOW-VOLTAGE DRIVER STAGES

    公开(公告)号:US20210194443A1

    公开(公告)日:2021-06-24

    申请号:US16718679

    申请日:2019-12-18

    Applicant: NXP USA, Inc.

    Abstract: An amplifier includes a driver stage amplifier transistor and a final stage amplifier transistor, which are integrated in a semiconductor die. The driver stage amplifier transistor has a driver stage input, a driver stage output, and an output impedance, and the driver stage amplifier transistor is configured to operate using a first bias voltage at the driver stage output. The final stage amplifier transistor has a final stage input, a final stage output, and an input impedance. The final stage input is electrically coupled to the driver stage output. The final stage amplifier transistor is configured to operate using a second bias voltage at the final stage output, and the second bias voltage is at least twice as large as the first bias voltage.

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