摘要:
In integrated circuits which include both ECL and CMOS circuits, there is an ECL to CMOS translator which converts ECL logic levels to CMOS logic levels. To convert from ECL to CMOS levels, the ECL logic high is coupled to the base of an NPN transistor which provides a CMOS logic low. The ECL logic low is prevented from being coupled to the base of the NPN transistor. The CMOS logic high is obtained by an analogous second circuit which is responsive to a complementary ECL signal the output of which is coupled to a P channel transistor. The P channel transistor either provides the CMOS logic high output or is non-conductive.
摘要:
A memory which contains a global data line pair and a plurality of loads for the global data line pair distributed thereon. The global data lines run the length of the memory, and are connected to a set of arrays distributed along the global data lines, of which each array provides a voltage on the global data lines when selected. The first load is located above the first array and the last is located below the last array. Other global data line loads are placed between consecutive arrays. In a read mode of operation a pair of loads associated with each array is enabled when a corresponding array is selected. Placement of the loads in this manner decreases an access time considerably.
摘要:
A synchronous integrated circuit memory (30) has read global data lines shared between data read from a memory array (32) and data read from a data-in register (40) during a read-after-write. A comparator/latch (50) compares a new address to a previous address and generates an address match signal that is used to select match sense amplifiers (52) and deselect regular sense amplifiers (54). Relatively fast address comparison and address match signal generation is accomplished using a comparator/latch (50) for each column address signal, and emitter summing each match signal to provide the address match signal. The use of emitter summing reduces a number of gate delays, thus allowing the address match signal to be generated before the regular sense amplifiers (54) can be selected, and allowing the read global data lines to be shared without increasing the access time of the integrated circuit memory (30).
摘要:
An output buffer for a device such as a memory comprises a voltage regulator, a current source portion, a switching portion, and an output portion. The voltage regulator provides a constant voltage independent of fluctuations between first and second power supply voltages. The current source portion provides first and second currents to first and second nodes to limit the rate at which transistors in the output portion become conductive. The switching portion provides voltage signals on the first and second nodes respectively in response to positive and negative voltage differences between first and second input voltages. The output portion provides an output signal at either a logic high or a logic low voltage respectively in resonse to the voltage signals at the first and second nodes. The current source portion allows the use of faster bipolar transistors to improve the speed of the output buffer while maintaining accepable di/dt.
摘要:
An input buffer for translating TTL level signals to ECL level signals has a level shifter having a first and a second inupt transistor. The first input transistor receives the input signal and the second transistor receives a reference voltage. First and second transistor loads are coupled to the first and second transistors, respectively. Both the first and second loads are biased to the same saturation current. The saturation current is derived from a current source. The reference voltage is set at a voltage which is between the maximum voltage of a logic low of the input signal and the minimum voltage of a high of the input signal. The deferential level shifter develops a voltage differential which is converted to ECL level signals by a differential amplifier.
摘要:
A testing system includes a tester probe and a plurality of integrated circuits. Tests are broadcast to the plurality of integrated circuits using carrierless ultra wideband (UWB) radio frequency (RF). All of the plurality of integrated circuits receive, at the same time, test input signals by way of carrierless UWB RF and all of the plurality of integrated circuits run tests and provide results based on the test input signals. Thus, the plurality of integrated circuits are tested simultaneously which significantly reduces test time. Also the tests are not inhibited by physical contact with the integrated circuits.
摘要:
A memory includes a bit cell array including a plurality of word lines and address decode circuitry having an output to provide a predecode value. The address decode circuitry includes a first plurality of transistors having a first gate oxide thickness. The memory further includes word line driver circuitry having an input coupled to the output of the address decode circuitry and a plurality of outputs, each output coupled to a corresponding word line of the plurality of word lines. The word line driver includes a second plurality of transistors having a second gate oxide thickness greater than the first gate oxide thickness. A method of operating the memory also is provided.
摘要:
A sense amplifier is coupled to a pair of bit lines for detecting and amplifying a voltage differential therebetween. The sense amplifier has a first differential amplifier coupled to the pair of bit lines enabled in response to a first signal. The sense amplifier also has a second differential amplifier coupled to the pair of bit lines which is enabled a predetermined time duration following the occurrence of the first signal.
摘要:
A system has a first plurality of cores in a first coherency group. Each core transfers data in packets. The cores are directly coupled serially to form a serial path. The data packets are transferred along the serial path. The serial path is coupled at one end to a packet switch. The packet switch is coupled to a memory. The first plurality of cores and the packet switch are on an integrated circuit. The memory may or may not be on the integrated circuit. In another aspect a second plurality of cores in a second coherency group is coupled to the packet switch. The cores of the first and second pluralities may be reconfigured to form or become part of coherency groups different from the first and second coherency groups.
摘要:
A system has a first plurality of cores in a first coherency group. Each core transfers data in packets. The cores are directly coupled serially to form a serial path. The data packets are transferred along the serial path. The serial path is coupled at one end to a packet switch. The packet switch is coupled to a memory. The first plurality of cores and the packet switch are on an integrated circuit. The memory may or may not be on the integrated circuit. In another aspect a second plurality of cores in a second coherency group is coupled to the packet switch. The cores of the first and second pluralities may be reconfigured to form or become part of coherency groups different from the first and second coherency groups.