摘要:
A method for additively de-marking a packaged integrated circuit die bearing engraved marking indicia on an exterior surface thereof. The marked surface is covered with an overlayer of material to fill the engraved markings and provide a surface suitable for re-marking. The covering material may be applied in a flowable state by applicator contact or by non-contact dispensing, or may be applied as a preformed segment. The exterior surface to be covered may be pre-treated to enhance bonding of the covering material. The covering material may be bonded to the marked surface in a post-application curing operation. De-marked integrated circuit packages are also disclosed.
摘要:
A laser marking apparatus and method for marking the surface of a singulated article such as a semiconductor chip are described herein. Semiconductor chips are fed along inclined, parallel tracks to a laser marking field where they are subsequently marked by a laser beam. As the laser beam is marking chips associated with one track, chips associated with other tracks that have already been marked are replaced by unmarked chips. In this manner, the laser is continually being used to mark semiconductor chips without having to wait for unmarked chips to move to the marking location.
摘要:
A laser marking apparatus and method for marking the surface of a singulated article such as a semiconductor chip are described herein. Semiconductor chips are fed along inclined, parallel tracks to a laser marking field where they are subsequently marked by a laser beam. As the laser beam is marking chips associated with one track, chips associated with other tracks that have already been marked are replaced by unmarked chips. In this manner, the laser is continually being used to mark semiconductor chips without having to wait for unmarked chips to move to the marking location.
摘要:
An apparatus for positioning a workpiece comprises a plurality of pedestals each comprising a first portion having a first width, a second portion having a second width greater than the first width, and a chamfered portion interposed between the first and second portions. The inventive apparatus further comprises a support having a plurality of holes therein for receiving the plurality of pedestals, the support further having a plurality of chamfered portions with one the chamfered portion about a periphery of each the hole. A base urges the chamfered portions of the pedestal away from the chamfered portions of the support.
摘要:
An integrated circuit testing apparatus and method of testing. In a first embodiment an amplifier amplifies the difference in a reference integrated circuit (RIC) response and a device under test integrated circuit (DUTIC) response to an electrical stimulus. The electrical stimulus is provided at an input of the DUTIC and the RIC by a stimulus circuit. A analog comparator determines when the amplified differences exceeds an adjustable threshold value. The sensitivity of the comparator is adjustable and the desired threshold value is adjusted before testing begins. If the amplified difference exceeds the threshold value of the comparator an error signal is generated. The apparatus of the invention includes a presetable counter which generates a device fail signal if a predetermined number of error signals are generated by the comparator. An initialization circuit loads a selectable value into the counter to provide a variable number of allowable errors before a DUTIC fails the test. In a second embodiment a precision voltage reference potential is adjusted to select a desired minimum potential for a high logic signal and a desired maximum potential for a low logic signal. The integrated circuit testing apparatus of the second embodiment also utilizes a RIC. The DUTIC and the RIC respond to the same electrical stimulus. The responses of the DUTIC and the RIC to the electrical stimulus are compared. If the responses have different logic levels the DUTIC automatically fails the test. If the responses have the same logic levels, the test circuit then compares the value of the DUTIC response to the minimum and maximum potentials of the precision voltage reference potential. If the DUTIC response does not lie either above or below the desired minimum and maximum potentials, respectively, the DUTIC fails the test since its potential falls within a failure window lying between the desired minimum and maximum values. Conversely if the DUTIC response falls above or below either of the desired minimum or maximum values, respectively, and has the same logic state as the RIC the DUTIC passes the test.
摘要:
A personal light including a battery power source connected in series with a light-emitting diode (LED) light source and a switching mechanism configured for non-contact actuation are disposed within an environmentally sealed chamber. A reflector is employed to maximize reflection of light emanating from the LED and a lens having an anti-reflective coating thereon associated with the LED opposite the reflector to enhance the light output and magnify the narrow beam of the LED. The switch employs an actuation mechanism exterior to the chamber to activate and deactivate the light.
摘要:
A personal light including a battery power source connected in series with a light-emitting diode (LED) light source and a switching mechanism configured for non-contact actuation are disposed within an environmentally sealed chamber. A reflector is employed to maximize reflection of light emanating from the LED and a lens having an anti-reflective coating thereon associated with the LED opposite the reflector to enhance the light output and magnify the narrow beam of the LED. The switch employs an actuation mechanism exterior to the chamber to activate and deactivate the light.
摘要:
A spring contact for establishing electrical contact between a lead element of an IC device and a substrate. The spring contact generally comprises a contact portion and a base portion. The contact portion, which generally comprises a coil-type compression spring, is configured to engage and resiliently bias against a lead element of the IC device. The spring contact is disposed in a mating aperture formed in the substrate. The base portion of the spring contact is configured to secure the spring contact within the mating aperture and to establish electrical contact with the substrate. A plurality of such spring contacts and mating apertures may be arranged on the substrate in an array corresponding to the pin-out of the IC device. A clamping element secures the IC device to the substrate and biases the IC device against the spring contacts.
摘要:
A lift mechanism for controlled lifting and lowering, especially suitable for lifting and lowering a tray of ICs. The lift mechanism includes a horizontally movable drive wedge element having an upper inclined surface and a slave wedge element having a lower inclined surface slidingly supported on the drive wedge element upper inclined surface. Horizontal movement of the slave wedge element is constrained while vertical movement is permitted, so that horizontal movement of the drive wedge element raises or lowers the slave wedge element. A lift structure extending upwardly from the slave wedge element may be employed to engage a tray as, for example, when loading or unloading trays from a transport at a shuttle assembly. A dual-action drive mechanism may move the drive wedge element horizontally, while a dual-action stop mechanism may be employed to limit travel of the drive wedge element at a position short of full vertical extension.
摘要:
A method for dispensing, receiving, storing, testing or binning packaged integrated circuit devices using at least one vertically-oriented, removable, tubular magazine disposed above a controllably-driven, rod-like indexing element extending from a drive below the magazine. A magazine, with an associated indexing element and drive, is configurable as an individual magazine module. The indexing element, under power of the drive, raises or lowers a vertical stack of devices to a desired level adjacent the top of the magazine to dispense or receive an individual device from a feed mechanism, such as a pick-and-place mechanism. A number of magazine modules may be assembled in a multi-module array, which is particularly suitable for binning tested devices, with a sort category being directed to each magazine.