ZQ calibration method of memory device with shared ZQ pin and memory device performing the ZQ calibration method

    公开(公告)号:US10276220B2

    公开(公告)日:2019-04-30

    申请号:US15674250

    申请日:2017-08-10

    IPC分类号: G11C7/10 H01L25/065 G11C29/02

    摘要: A memory device configured to perform a ZQ calibration method may include a first die and a second die that share a resistor connected to a ZQ pin. The first die may be configured to perform a first calibration operation using the resistor in response to a ZQ calibration command applied from outside of the memory device. The first die may be configured to generate a ZQ flag signal after the first calibration operation ends and perform a second calibration operation. The second die may be configured to perform the first calibration operation in response to the ZQ flag signal and perform a second calibration after the first calibration operation of the second die ends.

    ELECTRONIC CIRCUITS FOR OUTPUTTING POST EMPHASIS SIGNALS

    公开(公告)号:US20190140628A1

    公开(公告)日:2019-05-09

    申请号:US16026145

    申请日:2018-07-03

    IPC分类号: H03K5/13

    摘要: An electronic circuit may include a driver, a delay circuit, a strength control circuit, and an adder circuit. The driver may generate a second signal based on a first signal. The delay circuit may delay the first signal by as much as a reference time, to generate a third signal. The strength control circuit may adjust an amplitude of the third signal to generate a fourth signal. The adder circuit may add the second signal and the fourth signal to generate a fifth signal. In a first time interval determined based on the reference time, an amplitude of the fifth signal may be greater than an amplitude of the second signal. In a second time interval except for the first time interval, the amplitude of the fifth signal may be smaller than the amplitude of the second signal. In the second time interval, the amplitude of the fifth signal may be smaller than an amplitude of the first signal.