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公开(公告)号：US20170167985A1
公开(公告)日：2017-06-15
申请号：US15374859
申请日：2016-12-09
Applicant: Samsung Electronics Co., Ltd
Inventor： Beom Seok Lee , Sung Ha Park , Kyung-Mi Song , Sang Hyun Lee , Chung Ung Kim
IPC: G01N21/80 , G01N33/487 , G01N33/84
CPC classification number: G01N21/80 , G01N31/221 , G01N33/48785 , G01N33/84 , G01N2021/7793 , G01N2201/1241
Abstract: Disclosed herein are specimen analysis apparatus and method of analyzing specimen using the same. The specimen analysis apparatus includes a cartridge configured to accommodate at least three pH indicators having different properties and an analyzer configured to determine whether a specimen is acidic or basic using one of the pH indicators. The analyzer determines a pH measurement value using another pH indicator selected based on whether the specimen is acidic or basic.
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公开(公告)号：US10802574B2
公开(公告)日：2020-10-13
申请号：US16741087
申请日：2020-01-13
Applicant: Samsung Electronics Co., Ltd.
Inventor： Je Kook Kim , Sung Ha Park
Abstract: A semiconductor device is provided. The semiconductor device includes a receptacle which comprises a plurality of pins according to a universal serial bus (USB) type-C receptacle interface and a power delivery integrated circuit (PD IC) which transmits a toggle voltage signal that toggles between a first voltage level and a second voltage level to a first pin among the pins and detects a voltage level of a signal output from the first pin.
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Patent Agency Ranking
公开(公告)号：US10539999B2
公开(公告)日：2020-01-21
申请号：US15680535
申请日：2017-08-18
Applicant: Samsung Electronics Co., Ltd.
Inventor： Je Kook Kim , Sung Ha Park
IPC: G06F13/14 , G06F1/3296 , G06F13/42 , G06F13/38 , G06F1/324
Abstract: A semiconductor device is provided. The semiconductor device includes a receptacle which comprises a plurality of pins according to a universal serial bus (USB) type-C receptacle interface and a power delivery integrated circuit (PD IC) which transmits a toggle voltage signal that toggles between a first voltage level and a second voltage level to a first pin among the pins and detects a voltage level of a signal output from the first pin.
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公开(公告)号：US10106694B2
公开(公告)日：2018-10-23
申请号：US14753378
申请日：2015-06-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Euy Hyun Cho , Ji Yun Kang , Ji Won Kim , Sung Ha Park , Beom Seok Lee
Abstract: Disclosed herein are a structure for optical analysis that is capable of optically analyzing a small amount of a sample and an ink composition for manufacturing the same. A structure for optical analysis includes a support and an ink structure coupled to the support and configured to form a chamber on one surface of the support. The ink structure includes a first ink structural component configured to form a body of the ink structure and a second ink structural component formed at a lower portion of a side surface of the first ink, such that the first ink structural component and the second ink structural component have different slopes with respect to a direction of a center of the chamber.
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公开(公告)号：US10126232B2
公开(公告)日：2018-11-13
申请号：US15891632
申请日：2018-02-08
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sung Ha Park , Sang Bum Park , Beom Seok Lee , Kui Hyun Kim , Joo Hee Park , Kyung Mi Song , Euy Hyun Cho , Ha Na Kim
Abstract: A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
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公开(公告)号：US10556232B2
公开(公告)日：2020-02-11
申请号：US15613504
申请日：2017-06-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Hong-Geun Kim , Seung Hyun Kim , Sung Ha Park , Ji Young Park , Kyung-Mi Song , Dae Sun Lee , Jong Gun Lee , Jong Yup Choi , Yu Kyung Tak
Abstract: A fluid analysis cartridge with improved test reliability and an associated fluid analysis cartridge assembly are disclosed herein. A fluid analysis cartridge assembly includes a sample collecting member having a sample collecting chamber and a fluid analysis cartridge configured to be connected to the sample collecting member. The fluid analysis cartridge includes a sample receiving chamber configured to receive a sample collected by the sample collecting member and at least one hole arranged on one side of the sample receiving chamber and opened by connection of the sample collecting member to the fluid analysis cartridge to the at least one hole. The sample receiving chamber stores a buffer solution to be mixed with the sample.
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公开(公告)号：US09927351B2
公开(公告)日：2018-03-27
申请号：US14824180
申请日：2015-08-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sung Ha Park , Sang Bum Park , Beom Seok Lee , Kui Hyun Kim , Joo Hee Park , Kyung Mi Song , Euy Hyun Cho , Ha Na Kim
CPC classification number: G01N21/31 , B01L3/5023 , B01L3/502715 , B01L3/50273 , B01L2200/025 , B01L2200/04 , B01L2200/148 , B01L2200/16 , B01L2300/024 , B01L2300/0806 , B01L2300/0864 , B01L2300/0887 , B01L2300/161 , B01L2400/0409 , G01N21/05 , G01N21/274 , G01N21/314 , G01N33/492 , G01N2021/3129 , G01N2333/9108 , Y10T436/146666
Abstract: A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
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