Chemically amplified positive resist composition
    2.
    发明授权
    Chemically amplified positive resist composition 失效
    化学放大正光刻胶组合物

    公开(公告)号:US5629134A

    公开(公告)日:1997-05-13

    申请号:US539759

    申请日:1995-10-06

    CPC分类号: G03F7/0045 Y10S430/106

    摘要: In a chemically amplified positive resist composition comprising an organic solvent, an alkali soluble resin, an acid generator, and an optional dissolution inhibitor, a salt of a pyridine which may have an alkyl, alkoxy, amino or dialkylamino group with an alkylsulfonic acid, arylsulfonic acid or halogen atom is blended. Because of high sensitivity to deep UV and resolution and elimination of the PED problem causing T-top pattern configuration and the skirting phenomenon, the resist composition is improved in dimensional precision and lends itself to fine patterning.

    摘要翻译: 在包含有机溶剂,碱溶性树脂,酸产生剂和任选的溶解抑制剂的化学放大型正性抗蚀剂组合物中,可以具有烷基磺酸的烷基,烷氧基,氨基或二烷基氨基的吡啶盐,芳基磺酸 酸或卤素原子混合。 由于对深UV和分辨率的高灵敏度以及消除引起T顶部图案构型和裙边现象的PED问题,抗蚀剂组合物的尺寸精度提高,并且适合精细图案化。