Semiconductor integrated circuit device and process for manufacturing the same
    2.
    发明授权
    Semiconductor integrated circuit device and process for manufacturing the same 失效
    半导体集成电路器件及其制造方法

    公开(公告)号:US06423593B1

    公开(公告)日:2002-07-23

    申请号:US09943516

    申请日:2001-08-31

    IPC分类号: H01L218242

    摘要: There is provided a technique for forming an Ru film on the bottom of a deep hole with a considerable film thickness for the lower electrode of an information storage capacity element in order to improve the yield of manufacturing DRAMs. The Ru film is formed on the side wall and the bottom of a deep hole as material for preparing the lower electrode of an information storage capacity element to be produced there under the condition of a gasification flow rate ratio of the raw materials ((Ru(C2H5C5H4)2/O2) is not less than 10%. Then, the ratio of the film thickness of the Ru film on the bottom “b” of the hole to the largest film thickness “a” of the Ru film in the hole is not less than 50%.

    摘要翻译: 为了提高DRAM的制造成本,提供了用于在信息存储电容元件的下部电极的深孔底部形成Ru膜的技术。 Ru膜形成在深孔的侧壁和底部作为用于制备在原料的气化流量比((Ru( C2H5C5H4)2 / O2)不小于10%,然后孔中底部的Ru膜厚度与孔中的Ru膜的最大膜厚“a”的比率为 不低于50%。

    Process for manufacturing a semiconductor memory device including a memory cell selecting transistor and a capacitor with metal electrodes
    3.
    发明授权
    Process for manufacturing a semiconductor memory device including a memory cell selecting transistor and a capacitor with metal electrodes 有权
    用于制造包括存储单元选择晶体管和具有金属电极的电容器的半导体存储器件的工艺

    公开(公告)号:US06649465B2

    公开(公告)日:2003-11-18

    申请号:US09943506

    申请日:2001-08-31

    IPC分类号: H01L218242

    摘要: A technique is provided which is capable of forming a Ru film constituting a lower electrode of an information storing capacitive element in an aperture with high precision. After a Ru film is deposited, heat treatment is performed in a reducing atmosphere on a side wall and a bottom portion of a deep aperture in which the information storing capacitive element is formed. The deposition and heating of Ru films can be repeated to form a laminated structure of Ru films. As a result, it is possible to effectively remove impurities included in the Ru film, and to achieve fineness of the Ru film.

    摘要翻译: 提供了能够以高精度形成构成孔的信息存储电容元件的下电极的Ru膜的技术。 在沉积Ru膜之后,在形成有信息存储电容元件的深孔的侧壁和底部的还原气氛中进行热处理。 可以重复Ru膜的沉积和加热以形成Ru膜的层压结构。 结果,可以有效地除去Ru膜中所含的杂质,并且实现Ru膜的细度。

    Method of forming a ruthenium film by CVD
    5.
    发明授权
    Method of forming a ruthenium film by CVD 失效
    通过CVD形成钌膜的方法

    公开(公告)号:US06544835B2

    公开(公告)日:2003-04-08

    申请号:US10173159

    申请日:2002-06-18

    IPC分类号: H01L218242

    摘要: There is provided a technique for forming an Ru film on the bottom of a deep hole with a considerable film thickness for the lower electrode of an information storage capacity element in order to improve the yield of manufacturing DRAMs. The Ru film is formed on the side wall and the bottom of a deep hole as material for preparing the lower electrode of an information storage capacity element to be produced there under the condition of a gasification flow rate ratio of the raw materials ((Ru(C2H5C5H4)2/O2) is not less than 10% Then, the ratio of the film thickness of the Ru film on the bottom “b” of the hole to the largest film thickness “a” of the Ru film in the hole is not less than 50%.

    摘要翻译: 为了提高DRAM的制造成本,提供了用于在信息存储电容元件的下部电极的深孔底部形成Ru膜的技术。 Ru膜形成在深孔的侧壁和底部作为用于制备在原料的气化流量比((Ru( C2H5C5H4)2 / O2)不小于10%然后,孔中底部“b”上的Ru膜的膜厚与孔中的Ru膜的最大膜厚“a”的比率不是 小于50%。

    Fuel filler structure for fuel tank

    公开(公告)号:US11167637B2

    公开(公告)日:2021-11-09

    申请号:US14390693

    申请日:2012-04-12

    IPC分类号: B60K15/04

    摘要: To obtain a fuel filler structure for a fuel tank wherein when causing an opening and closing valve to close, it can be ensured that the opening and closing valve does not rapidly rotate to a closed position in which it closes a fuel fill inlet, and when causing the opening and closing valve to open, the opening and closing valve can be opened with a small force. A fuel filler structure is equipped with a damper on the near side of a flapper valve in the insertion direction of a fuel nozzle. When the flapper valve rotates to an open position, the damper does not act on the flapper valve, and when the flapper valve rotates to a closed position, the damper acts on the flapper valve.

    Resist composition and method for producing resist pattern
    10.
    发明授权
    Resist composition and method for producing resist pattern 有权
    抗蚀剂组合物和抗蚀剂图案的制造方法

    公开(公告)号:US09291893B2

    公开(公告)日:2016-03-22

    申请号:US13281145

    申请日:2011-10-25

    IPC分类号: G03F7/004 G03F7/039 G03F7/20

    摘要: A resist composition contains; a resin having a structural unit represented by the formula (aa) and a structural unit represented by the formula (ab); and an acid generator, wherein Raa1 represents a hydrogen atom and a methyl group; Aaa1 represents an optionally substituted C1 to C6 alkanediyl group etc.; Raa2 represents an optionally substituted C1 to C18 aliphatic hydrocarbon group; Rab1 represents a hydrogen atom and a methyl group; Aab1 represents a single bond, an optionally substituted C1 to C6 alkanediyl group etc.; W1 represents an optionally substituted C4 to C24 alicyclic hydrocarbon group; n represents 1 or 2; Aab2 in each occurrence independently represents an optionally substituted C1 to C6 aliphatic hydrocarbon group; Rab2 in each occurrence independently represents a C1 to C12 fluorinated alkyl group.

    摘要翻译: 抗蚀剂组合物含有 具有由式(aa)表示的结构单元的树脂和由式(ab)表示的结构单元; 和酸产生剂,其中Raa1表示氢原子和甲基; Aaa1表示可以具有取代基的C1〜C6烷二基等。 Raa2表示任选取代的C1至C18脂族烃基; Rab1表示氢原子和甲基; Aab1表示单键,任选取代的C 1至C 6烷二基等; W1表示任选取代的C4至C24脂环族烃基; n表示1或2; Aab2各自独立地表示任选取代的C 1至C 6脂族烃基; Rab2各自独立地表示C1〜C12氟化烷基。