Bonding interface quality by cold cleaning and hot bonding
    1.
    发明授权
    Bonding interface quality by cold cleaning and hot bonding 有权
    通过冷清和热粘合粘合界面质量

    公开(公告)号:US07645682B2

    公开(公告)日:2010-01-12

    申请号:US11873311

    申请日:2007-10-16

    CPC分类号: H01L21/2007 H01L21/02052

    摘要: The invention relates to improvements in a method for molecularly bonding first and second substrates together by placing them in surface to surface contact. The improvement includes, prior to placing the substrates in contact, cleaning the surface of one or both of the substrates in a manner to provide a cleaned surface that is slightly roughened compared to a conventionally polished surface, and heating at least one or both of the substrates prior to placing the substrates in contact while retaining the heating at least until the substrates are in surface to surface contact.

    摘要翻译: 本发明涉及通过将第一和第二基底与表面与表面接触放置而将第一和第二基底分子结合在一起的方法的改进。 改进之处在于,在将基板放置接触之前,以与常规研磨的表面相比较,以提供与粗糙表面稍微粗糙的清洁表面的方式清洁一个或两个基板的表面,并加热至少一个或两个 在将衬底置于接触状态之前,至少保持加热至基板处于表面与表面接触之前的基板。

    BONDING INTERFACE QUALITY BY COLD CLEANING AND HOT BONDING
    2.
    发明申请
    BONDING INTERFACE QUALITY BY COLD CLEANING AND HOT BONDING 有权
    通过冷清和热粘结来界定接口质量

    公开(公告)号:US20080200008A1

    公开(公告)日:2008-08-21

    申请号:US11873311

    申请日:2007-10-16

    IPC分类号: H01L21/46 B32B37/02 B32B38/16

    CPC分类号: H01L21/2007 H01L21/02052

    摘要: The invention relates to improvements in a method for molecularly bonding first and second substrates together by placing them in surface to surface contact. The improvement includes, prior to placing the substrates in contact, cleaning the surface of one or both of the substrates in a manner to provide a cleaned surface that is slightly roughened compared to a conventionally polished surface, and heating at least one or both of the substrates prior to placing the substrates in contact while retaining the heating at least until the substrates are in surface to surface contact.

    摘要翻译: 本发明涉及通过将第一和第二基底与表面与表面接触放置而将第一和第二基底分子结合在一起的方法的改进。 改进之处在于,在将基板放置接触之前,以与常规研磨的表面相比较,以提供与粗糙表面稍微粗糙的清洁表面的方式清洁一个或两个基板的表面,并加热至少一个或两个 在将衬底置于接触状态之前,至少保持加热至基板处于表面与表面接触之前的基板。

    Method of bonding two substrates
    3.
    发明授权
    Method of bonding two substrates 有权
    粘合两种基材的方法

    公开(公告)号:US08349703B2

    公开(公告)日:2013-01-08

    申请号:US12525493

    申请日:2007-11-23

    IPC分类号: H01L21/30 H01L21/46

    CPC分类号: H01L21/2007 H01L21/02052

    摘要: The invention relates to a method of forming a structure comprising a thin layer of semiconductor material transferred from a donor substrate onto a second substrate, wherein two different atomic species are co-implanted under certain conditions into the donor substrate so as to create a weakened zone delimiting the thin layer to be transferred. The two different atomic species are implanted so that their peaks have an offset of less than 200 Å in the donor substrate, and the substrates are bonded together after roughening at least one of the bonding surfaces.

    摘要翻译: 本发明涉及一种形成结构的方法,该结构包括从施主衬底转移到第二衬底上的半导体材料的薄层,其中两种不同的原子种类在一定条件下共注入到施主衬底中,以便产生弱化区 限定待传输的薄层。 植入两种不同的原子物质,使得它们的峰在施主衬底中具有小于200的偏移,并且在粗糙化至少一个结合表面之后将衬底粘合在一起。

    METHOD OF BONDING TWO SUBSTRATES
    4.
    发明申请
    METHOD OF BONDING TWO SUBSTRATES 有权
    结合两个基板的方法

    公开(公告)号:US20100093152A1

    公开(公告)日:2010-04-15

    申请号:US12525493

    申请日:2007-11-23

    IPC分类号: H01L21/30

    CPC分类号: H01L21/2007 H01L21/02052

    摘要: The invention relates to a method of forming a structure comprising a thin layer of semiconductor material transferred from a donor substrate onto a second substrate, wherein two different atomic species are co-implanted under certain conditions into the donor substrate so as to create a weakened zone delimiting the thin layer to be transferred. The two different atomic species are implanted so that their peaks have an offset of less than 200 Å in the donor substrate, and the substrates are bonded together after roughening at least one of the bonding surfaces.

    摘要翻译: 本发明涉及一种形成结构的方法,该结构包括从施主衬底转移到第二衬底上的半导体材料的薄层,其中两种不同的原子种类在一定条件下共注入到施主衬底中,以便产生弱化区 限定待传输的薄层。 植入两种不同的原子物质,使得它们的峰在施主衬底中具有小于200的偏移,并且在粗糙化至少一个结合表面之后将衬底粘合在一起。

    Method for fabricating a compound-material and method for choosing a wafer
    5.
    发明申请
    Method for fabricating a compound-material and method for choosing a wafer 有权
    复合材料的制造方法以及晶片的选择方法

    公开(公告)号:US20070231931A1

    公开(公告)日:2007-10-04

    申请号:US11472745

    申请日:2006-06-21

    IPC分类号: H01L21/66

    CPC分类号: H01L21/76254

    摘要: The present invention provides improved methods for fabricating compound-material wafers, in particular a silicon on insulator type wafer. The improved methods lead to reduced numbers of deflects arising on or near the periphery of the wafers. In a first method, wafers are selected in dependence on edge roll off values determined at about 0.5-2.5 mm away from the edge of the wafer, where edge roll off values are determined in dependence on the second derivative of the wafer height profiles. In a second method, wafers selected according to the first method are further processed by bonding, forming a splitting layer, and detaching the two wafers at the splitting layer.

    摘要翻译: 本发明提供了用于制造复合材料晶片,特别是绝缘体上硅晶片的改进方法。 改进的方法导致在晶片周边或附近出现的偏转数量减少。 在第一种方法中,根据在离晶片边缘约0.5-2.5mm处确定的边缘滚降值来选择晶片,其中根据晶片高度分布的二阶导数来确定边缘滚降值。 在第二种方法中,根据第一种方法选择的晶片通过结合进一步处理,形成分裂层,并在分离层处分离两个晶片。

    Method for fabricating a compound-material wafer
    6.
    发明授权
    Method for fabricating a compound-material wafer 有权
    复合材料晶圆的制造方法

    公开(公告)号:US07892861B2

    公开(公告)日:2011-02-22

    申请号:US11472745

    申请日:2006-06-21

    IPC分类号: H01L21/66

    CPC分类号: H01L21/76254

    摘要: The present invention provides improved methods for fabricating compound-material wafers, in particular a silicon on insulator type wafer. The improved methods lead to reduced numbers of deflects arising on or near the periphery of the wafers. In a first method, wafers are selected in dependence on edge roll off values determined at about 0.5-2.5 mm away from the edge of the wafer, where edge roll off values are determined in dependence on the second derivative of the wafer height profiles. In a second method, wafers selected according to the first method are further processed by bonding, forming a splitting layer, and detaching the two wafers at the splitting layer.

    摘要翻译: 本发明提供了用于制造复合材料晶片,特别是绝缘体上硅晶片的改进方法。 改进的方法导致在晶片周边或附近出现的偏转数量减少。 在第一种方法中,根据在离晶片边缘约0.5-2.5mm处确定的边缘滚降值来选择晶片,其中根据晶片高度分布的二阶导数来确定边缘滚降值。 在第二种方法中,根据第一种方法选择的晶片通过结合进一步处理,形成分裂层,并在分离层处分离两个晶片。

    Glucose measuring device
    8.
    发明授权
    Glucose measuring device 失效
    葡萄糖测量装置

    公开(公告)号:US5695623A

    公开(公告)日:1997-12-09

    申请号:US656135

    申请日:1994-01-25

    摘要: The device for measuring and displaying the concentration of glucose in the blood comprises a display device (2) into which disposable sensors (1) comprising a biomembrane (9) can be inserted. The display device (2) comprises a built-in computer (3) in whose memory (7) a glucose concentration diagram (5) is stored and which can evaluate the measurement results of the sensors (1). The computer (3) comprises a time measuring device (4) whose zero setting can be correlated in an irreversible manner with the date of manufacture of the disposable sensors (1). Before the device is supplied to the patient, the glucose concentration diagram, which corresponds to the characteristics of the biomembrane (9) of the disposable sensors (1) at the time of manufacture, is irreversibly calibrated. The glucose concentration diagram is automatically and irreversibly corrected, taking into account the time-dependent characteristics of the biomembrane (9) of the disposable sensors (1), by means of the time measuring device (4).

    摘要翻译: PCT No.PCT / CH90 / 00146 Sec。 371日期:1994年1月25日 102(e)日期1994年1月25日PCT Filed 1990年6月14日PCT公布。 公开号WO91 / 00998 日期1991年1月24日用于测量和显示血液中葡萄糖浓度的装置包括显示装置(2),可插入包括生物膜(9)的一次性传感器(1)。 显示装置(2)包括其存储器(7)的内置计算机(3),葡萄糖浓度图(5)被存储并且可以评估传感器(1)的测量结果。 计算机(3)包括时间测量装置(4),其零点设置可以以不可逆的方式与一次性传感器(1)的制造日期相关联。 在向患者提供装置之前,对应于制造时一次性传感器(1)的生物膜(9)的特性的葡萄糖浓度图是不可逆地校准的。 通过时间测量装置(4),考虑到一次性传感器(1)的生物膜(9)的时间依赖特性,葡萄糖浓度图被自动和不可逆地校正。

    Needle system fastening mechanism
    9.
    发明授权
    Needle system fastening mechanism 失效
    针系统紧固机构

    公开(公告)号:US5611786A

    公开(公告)日:1997-03-18

    申请号:US387870

    申请日:1995-02-27

    IPC分类号: A61M5/34 A61M5/00 A61M5/31

    CPC分类号: A61M5/348

    摘要: A fastening mechanism for a needle system with the liquid system being a cartridge ampoule (4) and with a needle holder (3). The needle holder (3) is snapped onto the cartridge ampoule (4) or a cartridge ampoule holder containing the cartridge ampoule (4) by means of a snap-in closure means. The fastening mechanism of the invention allows sanitary application of injected medicines.

    摘要翻译: PCT No.PCT / CH94 / 00146 Sec。 371日期:1995年2月27日 102(e)1995年2月27日PCT PCT 1994年7月8日PCT公布。 出版物WO95 / 01812 日期1995年1月19日用于具有液体系统的针系统的紧固机构是药筒安瓿(4)和针保持器(3)。 针夹持器(3)通过卡入式闭合装置卡扣在墨盒安瓿(4)上或者包含墨盒安瓿(4)的墨盒安瓿座上。 本发明的紧固机构允许注射药物的卫生应用。