公开(公告)号：US20060097162A1

公开(公告)日：2006-05-11

申请号：US11251795

申请日：2005-10-18

申请人： Shigenobu Maruyama ,  Mineo Nomoto ,  Toru Kurenuma ,  Yuichi Kunitomo ,  Yukio Kembo

发明人： Shigenobu Maruyama ,  Mineo Nomoto ,  Toru Kurenuma ,  Yuichi Kunitomo ,  Yukio Kembo

IPC分类号： G21K7/00

CPC分类号： G01Q10/04

摘要： A scanning probe microscope for measuring a surface profile of a sample by bringing a probe into close proximity to or contact with the surface of the sample and scanning the sample surface includes: a sample stage movable in at least one axis direction; the probe which is brought into close proximity to or contact with the surface of the sample mounted on the sample stage and scans the sample surface; a probe-driving unit for moving the probe three-dimensionally; a probe deflection detector for detecting a deflection of the probe; and an observation optical system which has an objective lens and observes the probe disposed on substantially the optical axis of the objective lens, and the sample. The probe-driving unit is disposed with three sets of paired drive sources arranged essentially with symmetry with respect to the optical axis of the objective lens.

摘要翻译： 一种扫描探针显微镜，用于通过使探针靠近或接触样品的表面并扫描样品表面来测量样品的表面轮廓，包括：可在至少一个轴向移动的样品台; 该探头与安装在样品台上的样品的表面紧密接触或接触并扫描样品表面; 用于三维移动探头的探针驱动单元; 用于检测探针偏转的探针偏转检测器; 以及观察光学系统，其具有物镜并观察设置在物镜的基本光轴上的探针和样品。 探针驱动单元设置有三组成对的驱动源，其基本上相对于物镜的光轴对称布置。

公开(公告)号：US07498589B2

公开(公告)日：2009-03-03

申请号：US11251795

申请日：2005-10-18

申请人： Shigenobu Maruyama ,  Mineo Nomoto ,  Toru Kurenuma ,  Yuichi Kunitomo ,  Yukio Kembo

发明人： Shigenobu Maruyama ,  Mineo Nomoto ,  Toru Kurenuma ,  Yuichi Kunitomo ,  Yukio Kembo

IPC分类号： G21K7/00

CPC分类号： G01Q10/04

摘要： A scanning probe microscope for measuring a surface profile of a sample by bringing a probe into close proximity to or contact with the surface of the sample and scanning the sample surface includes: a sample stage movable in at least one axis direction; the probe which is brought into close proximity to or contact with the surface of the sample mounted on the sample stage and scans the sample surface; a probe-driving unit for moving the probe three-dimensionally; a probe deflection detector for detecting a deflection of the probe; and an observation optical system which has an objective lens and observes the probe disposed on substantially the optical axis of the objective lens, and the sample. The probe-driving unit is disposed with three sets of paired drive sources arranged essentially with symmetry with respect to the optical axis of the objective lens.

摘要翻译： 一种扫描探针显微镜，用于通过使探针靠近或接触样品的表面并扫描样品表面来测量样品的表面轮廓，包括：可在至少一个轴向移动的样品台; 该探头与安装在样品台上的样品的表面紧密接触或接触并扫描样品表面; 用于三维移动探头的探针驱动单元; 探针偏转检测器，用于检测探针的偏转; 以及观察光学系统，其具有物镜并观察设置在物镜的基本光轴上的探针和样品。 探针驱动单元设置有三组成对的驱动源，其基本上相对于物镜的光轴对称布置。

公开(公告)号：US20080087820A1

公开(公告)日：2008-04-17

申请号：US11867476

申请日：2007-10-04

申请人： Toru KURENUMA ,  Hiroaki Yanagimoto ,  Yukio Kembo ,  Yuichi Kunitomo ,  Takafumi Morimoto ,  Satoshi Sekino

发明人： Toru KURENUMA ,  Hiroaki Yanagimoto ,  Yukio Kembo ,  Yuichi Kunitomo ,  Takafumi Morimoto ,  Satoshi Sekino

IPC分类号： G01N23/00

CPC分类号： G01Q10/06 ,  G01Q30/06

摘要： This probe control method is applied to the scanning probe microscope having a probe section with a probe pointed at a sample, a detection section for detecting physical quantity between the sample and the probe, a measurement section for measuring the surface of the sample to obtain the surface information on the basis of the physical quantity when scanning the sample surface by the probe, and a movement mechanism with at least two degree of freedom. The probe control method has steps of moving the probe in a scanning direction different from the contact direction while making the probe come into contact with the sample surface, detecting the torsional state of the probe during the movement of the probe, and adjusting either or both of the rate in the scanning direction and the force in the contact direction on the basis of the detected value obtained by the detection step.

摘要翻译： 将该探针控制方法应用于具有探针指向样品的探针部的扫描探针显微镜，用于检测样品与探针之间的物理量的检测部，测定样品表面的测定部， 基于通过探针扫描样品表面时的物理量的表面信息，以及具有至少两个自由度的移动机构。 探针控制方法具有使探针沿着与接触方向不同的扫描方向移动的步骤，同时使探针与样品表面接触，检测探针移动期间探针的扭转状态，并且调节任一或两者 基于通过检测步骤获得的检测值，扫描方向上的速率和接触方向上的力。

公开(公告)号：US07631548B2

公开(公告)日：2009-12-15

申请号：US11737779

申请日：2007-04-20

申请人： Shuichi Baba ,  Masahiro Watanabe ,  Toshihiko Nakata ,  Toru Kurenuma ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Yukio Kembo ,  Manabu Edamura

发明人： Shuichi Baba ,  Masahiro Watanabe ,  Toshihiko Nakata ,  Toru Kurenuma ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Yukio Kembo ,  Manabu Edamura

IPC分类号： G01B5/28

CPC分类号： G01Q60/28 ,  G01Q10/06 ,  G01Q30/04

摘要： With a scanning probe microscope, if a plurality of sample properties are measured using a scanning scheme of allowing a probe to approach and withdraw from a sample, the sample properties need to be accurately and reliably detected in the minimum required measurement time. Further, the acting force between the probe and the sample varies depending on the type of the probe and the wear condition of a probe tip. Thus, disadvantageously, property values acquired using different probes cannot be compared with one another unless the artifactual effect of the measuring probes are eliminated. In accordance with the present invention, with a scanning probe microscope, the probe is brought into intermittent contact with the sample, while driving means repeatedly allows the probe to approach and withdraw from the sample with a variable amplitude. The sample property is thus acquired at a high speed. Further, a calibration sample is used in a given environment (given temperature and humidity) to acquire a force curve for at least one point. Information obtained from the force curve is used to correct measurements to display the distribution of the sample property.

摘要翻译： 使用扫描探针显微镜，如果使用允许探针进入和退出样本的扫描方案测量多个样品特性，则需要在最小所需测量时间内精确可靠地检测样品性质。 此外，探针和样品之间的作用力根据探针的类型和探针尖端的磨损情况而变化。 因此，不利的是，使用不同探针获得的特性值不能相互比较，除非消除了测量探针的人为影响。 根据本发明，利用扫描探针显微镜，使探针与样品间歇接触，同时驱动装置反复允许探针以可变的幅度从样品接近和退出。 因此，以高速度获取样品特性。 此外，在给定的环境（给定的温度和湿度）中使用校准样品以获得至少一个点的力曲线。 从力曲线获得的信息用于校正测量值以显示样品属性的分布。

公开(公告)号：US20070266780A1

公开(公告)日：2007-11-22

申请号：US11737779

申请日：2007-04-20

申请人： SHUICHI BABA ,  Masahiro Watanabe ,  Toshihiko Nakata ,  Toru Kurenuma ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Yukio Kembo ,  Manabu Edamura

发明人： SHUICHI BABA ,  Masahiro Watanabe ,  Toshihiko Nakata ,  Toru Kurenuma ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Yukio Kembo ,  Manabu Edamura

IPC分类号： G01N13/10

CPC分类号： G01Q60/28 ,  G01Q10/06 ,  G01Q30/04

摘要： With a scanning probe microscope, if a plurality of sample properties are measured using a scanning scheme of allowing a probe to approach and withdraw from a sample, the sample properties need to be accurately and reliably detected in the minimum required measurement time. Further, the acting force between the probe and the sample varies depending on the type of the probe and the wear condition of a probe tip. Thus, disadvantageously, property values acquired using different probes cannot be compared with one another unless the artifactual effect of the measuring probes are eliminated. In accordance with the present invention, with a scanning probe microscope, the probe is brought into intermittent contact with the sample, while driving means repeatedly allows the probe to approach and withdraw from the sample with a variable amplitude. The sample property is thus acquired at a high speed. Further, a calibration sample is used in a given environment (given temperature and humidity) to acquire a force curve for at least one point. Information obtained from the force curve is used to correct measurements to display the distribution of the sample property.

摘要翻译： 使用扫描探针显微镜，如果使用允许探针进入和退出样本的扫描方案测量多个样品特性，则需要在最小所需测量时间内精确可靠地检测样品性质。 此外，探针和样品之间的作用力根据探针的类型和探针尖端的磨损情况而变化。 因此，不利的是，使用不同探针获得的特性值不能相互比较，除非消除了测量探针的人为影响。 根据本发明，利用扫描探针显微镜，使探针与样品间歇接触，同时驱动装置反复允许探针以可变的幅度从样品接近和退出。 因此，以高速度获取样品特性。 此外，在给定的环境（给定的温度和湿度）中使用校准样品以获得至少一个点的力曲线。 从力曲线获得的信息用于校正测量值以显示样品属性的分布。

公开(公告)号：US4391511A

公开(公告)日：1983-07-05

申请号：US245193

申请日：1981-03-18

申请人： Nobuyuki Akiyama ,  Yukio Kembo ,  Yasuo Nakagawa ,  Susumu Aiuchi ,  Mineo Nomoto

发明人： Nobuyuki Akiyama ,  Yukio Kembo ,  Yasuo Nakagawa ,  Susumu Aiuchi ,  Mineo Nomoto

IPC分类号： G03F7/20 ,  G03F7/24 ,  G03F9/02 ,  H01L21/683 ,  G03B27/52

CPC分类号： G03F7/707 ,  G03F7/24 ,  H01L21/6838 ,  H01L21/68735 ,  H01L21/6875 ,  Y10T279/11

摘要： A light exposure device and method for exposing and printing a predetermined pattern on an exposure surface of a substrate comprises measuring means for measuring curvature of the exposure surface of the substrate, a chuck including suck and hold means for sucking and holding a back surface of the substrate opposite to the exposure surface and deforming means for imparting a force to the back surface of the substrate to deform the substrate, and control means for controlling the deforming means of the chuck in accordance with the curvature of the exposure surface of the substrate measured by the measuring means such that the exposure surface of the substrate conforms to an image surface of the pattern over an entire exposure area within a predetermined allowable error.

摘要翻译： 一种用于在基板的曝光表面上曝光和印刷预定图案的曝光装置和方法，包括：用于测量基板的曝光表面的曲率的测量装置，包括用于吸附和保持基板的背面的吸持和保持装置的卡盘 与曝光面相反的基板和用于赋予基板背面使其变形的变形机构，以及控制装置，用于根据基板的曝光面的曲率来控制卡盘的变形装置，该曲率由 所述测量装置使得所述基板的曝光表面在预定的允许误差范围内在整个曝光区域上符合所述图案的图像表面。

公开(公告)号：US08011230B2

公开(公告)日：2011-09-06

申请号：US12023158

申请日：2008-01-31

申请人： Masahiro Watanabe ,  Toru Kurenuma ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Shuichi Baba ,  Toshihiko Nakata ,  Manabu Edamura ,  Yukio Kembo

发明人： Masahiro Watanabe ,  Toru Kurenuma ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Shuichi Baba ,  Toshihiko Nakata ,  Manabu Edamura ,  Yukio Kembo

IPC分类号： G01B5/28

CPC分类号： G01Q70/04 ,  G01Q10/06

摘要： A scanning probe microscope, capable of performing shape measurement not affected by electrostatic charge distribution of a sample, which: monitors an electrostatic charge state by detecting a change in a flexure or vibrating state of a cantilever due to electrostatic charges in synchronization with scanning during measurement with relative scanning between the probe and the sample, and makes potential adjustment so as to cancel an influence of electrostatic charge distribution, thus preventing damage of the probe or the sample due to discharge and achieving reduction in measurement errors due to electrostatic charge distribution.

摘要翻译： 扫描探针显微镜，其能够执行不受样品静电荷分布影响的形状测量，其通过检测与测量同步的静电荷引起的静电荷的悬臂的挠曲或振动状态的变化来监测静电荷状态 通过探针和样品之间的相对扫描，进行电位调整，以消除静电电荷分布的影响，从而防止由于放电而引起的探针或样品的损伤，并实现由静电电荷分布引起的测量误差的降低。

公开(公告)号：US20080245139A1

公开(公告)日：2008-10-09

申请号：US12061308

申请日：2008-04-02

申请人： Takafumi Morimoto ,  Toru Kurenuma ,  Manabu Edamura ,  Hiroshi Kuroda ,  Yukio Kembo ,  Masahiro Watanabe ,  Shuichi Baba

发明人： Takafumi Morimoto ,  Toru Kurenuma ,  Manabu Edamura ,  Hiroshi Kuroda ,  Yukio Kembo ,  Masahiro Watanabe ,  Shuichi Baba

IPC分类号： G01B5/28

CPC分类号： G01Q10/06 ,  G01Q10/04

摘要： A measurement method of a scanning probe microscope including a first approach operation adjusting an operation position of a fine positioning unit to near a maximum extension amount and ending the approach by coarse positioning, a first measurement operation making the probe scan the surface for measurement in a close probe state based on the first approach operation to obtain relief information of the sample surface, a positioning operation positioning the probe at a recessed part based on the relief information obtained by the first measurement operation, a second approach operation making the probe again approach the surface at a position determined by the positioning operation, adjusting an operation position of the Z-axis fine positioning device to close to a maximum extension amount, and ending the repeated approach, and a second measurement operation making the probe scan the surface for measurement in a close probe state based on the second approach operation to obtain relief information of the sample surface.

摘要翻译： 一种扫描探针显微镜的测量方法，包括：将精细定位单元的操作位置调整到最大延伸量附近的第一接近操作，并且通过粗略定位来结束接近;第一测量操作，使得探测器扫描表面以进行测量 基于第一接近操作关闭探针状态以获得样品表面的浮雕信息，基于通过第一测量操作获得的浮雕信息将探针定位在凹陷部分的定位操作，使探针再次接近的第二接近操作 在由定位操作确定的位置处的表面，将Z轴精细定位装置的操作位置调整为接近最大延伸量，并且结束重复进近，以及使探针扫描表面以进行测量的第二测量操作 基于第二种方法操作获得缓解的近距离探测状态 样品表面的信息。

公开(公告)号：US20080223122A1

公开(公告)日：2008-09-18

申请号：US12023158

申请日：2008-01-31

申请人： Masahiro Watanabe ,  Toru KURENUMA ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Shuichi Baba ,  Toshihiko Nakata ,  Manabu Edamura ,  Yukio Kembo

发明人： Masahiro Watanabe ,  Toru KURENUMA ,  Hiroshi Kuroda ,  Takafumi Morimoto ,  Shuichi Baba ,  Toshihiko Nakata ,  Manabu Edamura ,  Yukio Kembo

IPC分类号： G01B5/28

CPC分类号： G01Q70/04 ,  G01Q10/06

摘要： A scanning probe microscope, capable of performing shape measurement not affected by electrostatic charge distribution of a sample, which: monitors an electrostatic charge state by detecting a change in a flexure or vibrating state of a cantilever due to electrostatic charges in synchronization with scanning during measurement with relative scanning between the probe and the sample, and makes potential adjustment so as to cancel an influence of electrostatic charge distribution, thus preventing damage of the probe or the sample due to discharge and achieving reduction in measurement errors due to electrostatic charge distribution.

摘要翻译： 扫描探针显微镜，其能够执行不受样品静电荷分布影响的形状测量，其通过检测与测量同步的静电荷引起的静电荷的悬臂的挠曲或振动状态的变化来监测静电荷状态 通过探针和样品之间的相对扫描，进行电位调整，以消除静电电荷分布的影响，从而防止由于放电而引起的探针或样品的损伤，并实现由静电电荷分布引起的测量误差的降低。

公开(公告)号：US08844061B2

公开(公告)日：2014-09-23

申请号：US13726764

申请日：2012-12-26

申请人： Shuichi Baba ,  Masahiro Watanabe ,  Toshihiko Nakata ,  Yukio Kembo ,  Toru Kurenuma ,  Takafumi Morimoto ,  Manabu Edamura ,  Satoshi Sekino

发明人： Shuichi Baba ,  Masahiro Watanabe ,  Toshihiko Nakata ,  Yukio Kembo ,  Toru Kurenuma ,  Takafumi Morimoto ,  Manabu Edamura ,  Satoshi Sekino

IPC分类号： G01Q60/28 ,  G01Q10/04 ,  G01Q60/24 ,  G01Q10/00 ,  G01Q60/34 ,  B82Y35/00

CPC分类号： G01Q10/00 ,  B82Y35/00 ,  G01Q60/28 ,  G01Q60/34

摘要： In the case of measuring a pattern having a steep side wall, a probe adheres to the side wall by the van der Waals forces acting between the probe and the side wall when approaching the pattern side wall, and an error occurs in a measured profile of the side wall portion. When a pattern having a groove width almost equal to a probe diameter is measured, the probe adheres to both side walls, the probe cannot reach the groove bottom, and the groove depth cannot be measured. When the probe adheres to a pattern side wall in measurements of a microscopic high-aspect ratio pattern using an elongated probe, the probe is caused to reach the side wall bottom by detecting the adhesion of the probe to the pattern side wall, and temporarily increasing a contact force between the probe and the sample. Also, by obtaining the data of the amount of torsion of a cantilever with the shape data of the pattern, a profile error of the side wall portion by the adhesion is corrected by the obtained data of the amount of torsion.

摘要翻译： 在测量具有陡峭侧壁的图案的情况下，当接近图案侧壁时，探针通过作用在探针和侧壁之间的范德华力附着在侧壁上，并且在测量的轮廓中发生错误 侧壁部分。 当测量具有几乎等于探针直径的槽宽度的图案时，探针粘附到两个侧壁，探针不能到达凹槽底部，并且不能测量凹槽深度。 当使用细长的探针测量微观高纵横比图案时探头粘附到图案侧壁上时，通过检测探针与图案侧壁的粘附力使探针到达侧壁底部，并暂时增加 探针和样品之间的接触力。 此外，通过利用图案的形状数据获得悬臂的扭转量的数据，通过获得的扭转量的数据来校正侧壁部分的粘附的轮廓误差。