Plasma generation and control using a dual frequency RF source
    1.
    发明授权
    Plasma generation and control using a dual frequency RF source 有权
    使用双频RF源的等离子体发生和控制

    公开(公告)号:US07431857B2

    公开(公告)日:2008-10-07

    申请号:US10843914

    申请日:2004-05-12

    IPC分类号: G01R31/00

    摘要: A method and apparatus for generating and controlling a plasma in a semiconductor substrate processing chamber using a dual frequency RF source is provided. The method includes the steps of supplying a first RF signal from the source to an electrode within the processing chamber at a first frequency and supplying a second RF signal from the source to the electrode within the processing chamber at a second frequency. The second frequency is different from the first frequency by an amount equal to a desired frequency. Characteristics of a plasma formed in the chamber establish a sheath modulation at the desired frequency.

    摘要翻译: 提供了一种使用双频RF源在半导体衬底处理室中产生和控制等离子体的方法和装置。 该方法包括以第一频率将来自源的第一RF信号提供给处理室内的电极的步骤,并以第二频率将来自源的第二RF信号提供给处理室内的电极。 第二频率与第一频率不等于期望频率的量。 在腔室中形成的等离子体的特性以期望的频率建立护套调制。

    Plasma generation and control using dual frequency RF signals
    2.
    发明授权
    Plasma generation and control using dual frequency RF signals 有权
    使用双频RF信号的等离子体发生和控制

    公开(公告)号:US07510665B2

    公开(公告)日:2009-03-31

    申请号:US11416468

    申请日:2006-05-02

    IPC分类号: G01R31/00

    摘要: A method for controlling a plasma in a semiconductor substrate processing chamber is provided. The method includes the steps of supplying a first RF signal to a first electrode within the processing chamber at a first frequency selected to cause plasma sheath oscillation at the first frequency; and supplying a second RF signal from the source to the first electrode at a second frequency selected to cause plasma sheath oscillation at the second frequency, wherein the second frequency is different from the first frequency by a differential equal to a desired frequency selected to cause plasma sheath oscillation at the desired frequency.

    摘要翻译: 提供了一种用于控制半导体衬底处理室中的等离子体的方法。 该方法包括以第一频率向处理室内的第一电极提供第一RF信号以在第一频率引起等离子体鞘振荡的步骤; 以及以第二频率从所述源向所述第一电极提供第二RF信号,所述第二频率被选择为在所述第二频率处引起等离子体鞘振荡,其中所述第二频率与所述第一频率不同,所述差异等于所选择的频率以引起等离子体 鞘振荡在所需频率。

    Apparatus for multiple frequency power application
    5.
    发明授权
    Apparatus for multiple frequency power application 有权
    多频电源设备

    公开(公告)号:US07994872B2

    公开(公告)日:2011-08-09

    申请号:US12506658

    申请日:2009-07-21

    IPC分类号: H03H7/40

    CPC分类号: H03H7/38

    摘要: Apparatus and methods are provided for a power matching apparatus for use with a processing chamber. In one aspect of the invention, a power matching apparatus is provided including a first RF power input coupled to a first adjustable capacitor, a second RF power input coupled to a second adjustable capacitor, a power junction coupled to the first adjustable capacitor and the second adjustable capacitor, a receiver circuit coupled to the power junction, a high voltage filter coupled to the power junction and the high voltage filter has a high voltage output, a voltage/current detector coupled to the power junction and a RF power output connected to the voltage/current detector.

    摘要翻译: 提供了用于与处理室一起使用的功率匹配装置的装置和方法。 在本发明的一个方面,提供了一种功率匹配装置,其包括耦合到第一可调电容器的第一RF功率输入端,耦合到第二可调电容器的第二RF功率输入端,耦合到第一可调电容器的功率端, 耦合到功率结的接收器电路,耦合到功率结的高电压滤波器和高压滤波器具有高电压输出,耦合到功率结的电压/电流检测器和连接到功率结的RF功率输出 电压/电流检测器。

    METHOD FOR MONITORING PROCESS DRIFT USING PLASMA CHARACTERISTICS
    9.
    发明申请
    METHOD FOR MONITORING PROCESS DRIFT USING PLASMA CHARACTERISTICS 失效
    使用等离子体特性监测工艺流程的方法

    公开(公告)号:US20090130856A1

    公开(公告)日:2009-05-21

    申请号:US12355130

    申请日:2009-01-16

    IPC分类号: H01L21/3065

    摘要: Methods for monitoring process drift using plasma characteristics are provided. In one embodiment, a method for monitoring process drift using plasma characteristics includes obtaining metrics of current and voltage information of a first waveform coupled to a plasma during a plasma process formed on a substrate, obtaining metrics of current and voltage information of a second waveform coupled to the plasma during the plasma process formed on the substrate, the first and second waveforms having different frequencies, determining at least one characteristic of the plasma using the metrics obtained from each different frequency waveform, and adjusting the plasma process in response to the determined at least one characteristic of the plasma.

    摘要翻译: 提供了使用等离子体特性监测过程漂移的方法。 在一个实施例中,使用等离子体特性来监测过程漂移的方法包括获得在形成在衬底上的等离子体工艺期间耦合到等离子体的第一波形的电流和电压信息的度量,获得耦合的第二波形的电流和电压信息的度量 在形成在衬底上的等离子体工艺期间等离子体,第一和第二波形具有不同的频率,使用从每个不同频率波形获得的度量来确定等离子体的至少一个特性,以及响应于所确定的等离子体处理 等离子体的至少一个特征。