Memory element, memory read-out element and memory cell
    1.
    发明授权
    Memory element, memory read-out element and memory cell 失效
    存储元件,存储器读出元件和存储单元

    公开(公告)号:US07400526B2

    公开(公告)日:2008-07-15

    申请号:US11427337

    申请日:2006-06-28

    IPC分类号: G11C11/00

    摘要: A memory element comprises a resistance element having a first resistance value in a first state and a second resistance value in a second state, it being possible to convert the resistance element from the first state into the second state and from the second state into the first state and the first resistance value and the second resistance value being different, a current generating device, coupled to a first terminal of the resistance element, the current generating device being designed to generate a current with a first amplitude through the resistance element when a predetermined potential is present at a second terminal of the resistance element, in order to convert the resistance element into the first state for setting the first resistance value, or to generate a current with a second amplitude through the resistance element when the predetermined potential is present at the second terminal of the resistance element, in order to convert the resistance element into the second state for setting the second resistance value, the first resistance value representing a first memory state and the second resistance value representing a second memory state.

    摘要翻译: 存储元件包括具有第一状态的第一电阻值和第二状态的第二电阻值的电阻元件,可以将电阻元件从第一状态转换为第二状态并从第二状态转换成第一状态 状态,并且所述第一电阻值和所述第二电阻值不同;电流产生装置,耦合到所述电阻元件的第一端子,所述电流产生装置被设计成当预定的电流值产生具有第一振幅的电流时, 电位存在于电阻元件的第二端子处,以便将电阻元件转换成用于设定第一电阻值的第一状态,或者当预定电位存在于电阻元件时通过电阻元件产生具有第二幅度的电流 电阻元件的第二端子,以便将电阻元件转换成第二端子 状态,用于设定第二电阻值,第一电阻值表示第一存储状态,第二电阻值表示第二存储状态。

    BISTABLE MULTIVIBRATOR WITH NON-VOLATILE STATE STORAGE
    2.
    发明申请
    BISTABLE MULTIVIBRATOR WITH NON-VOLATILE STATE STORAGE 审中-公开
    具有非挥发性状态存储的双稳态多机

    公开(公告)号:US20070002619A1

    公开(公告)日:2007-01-04

    申请号:US11427339

    申请日:2006-06-28

    IPC分类号: G11C11/34

    CPC分类号: G11C14/009 G11C13/0004

    摘要: The non-volatile memory cell has a volatile memory means for storing an item of binary information. Furthermore, the memory cell comprises only a single programmable resistance element for non-volatile saving of the stored information and a means for saving the information in the resistance element. A means for retrieving the saved information is additionally present.

    摘要翻译: 非易失性存储单元具有用于存储二进制信息项的易失性存储装置。 此外,存储单元仅包括用于非易失性地存储信息的单个可编程电阻元件和用于将信息保存在电阻元件中的装置。 另外存在用于检索保存的信息的装置。

    MEMORY ELEMENT, MEMORY READ-OUT ELEMENT AND MEMORY CELL
    3.
    发明申请
    MEMORY ELEMENT, MEMORY READ-OUT ELEMENT AND MEMORY CELL 失效
    存储器元件,存储器读出元件和存储器单元

    公开(公告)号:US20070002618A1

    公开(公告)日:2007-01-04

    申请号:US11427337

    申请日:2006-06-28

    IPC分类号: G11C11/34

    摘要: A memory element comprises a resistance element having a first resistance value in a first state and a second resistance value in a second state, it being possible to convert the resistance element from the first state into the second state and from the second state into the first state and the first resistance value and the second resistance value being different, a current generating device, coupled to a first terminal of the resistance element, the current generating device being designed to generate a current with a first amplitude through the resistance element when a predetermined potential is present at a second terminal of the resistance element, in order to convert the resistance element into the first state for setting the first resistance value, or to generate a current with a second amplitude through the resistance element when the predetermined potential is present at the second terminal of the resistance element, in order to convert the resistance element into the second state for setting the second resistance value, the first resistance value representing a first memory state and the second resistance value representing a second memory state.

    摘要翻译: 存储元件包括具有第一状态的第一电阻值和第二状态的第二电阻值的电阻元件,可以将电阻元件从第一状态转换为第二状态并从第二状态转换为第一状态 状态,并且所述第一电阻值和所述第二电阻值不同;电流产生装置,耦合到所述电阻元件的第一端子,所述电流产生装置被设计成当预定的电流值产生具有第一振幅的电流时, 电位存在于电阻元件的第二端子处,以便将电阻元件转换成用于设定第一电阻值的第一状态,或者当预定电位存在于电阻元件时通过电阻元件产生具有第二幅度的电流 电阻元件的第二端子,以便将电阻元件转换成第二端子 状态,用于设定第二电阻值,第一电阻值表示第一存储状态,第二电阻值表示第二存储状态。

    Nonvolatile memory cell
    4.
    发明授权
    Nonvolatile memory cell 失效
    非易失性存储单元

    公开(公告)号:US07436694B2

    公开(公告)日:2008-10-14

    申请号:US11444295

    申请日:2006-05-31

    IPC分类号: G11C11/00

    摘要: Nonvolatile memory cell, having a first resistor that is electrically programmable in a nonvolatile fashion, a second resistor that is electrically programmable in a nonvolatile fashion, a first leakage current reducing element connected between the first resistor and an operating potential, and a second leakage current reducing element connected between the second resistor and the operating potential.

    摘要翻译: 具有以非易失性方式电可编程的第一电阻器的非易失性存储器单元,以非易失性方式电可编程的第二电阻器,连接在第一电阻器和工作电位之间的第一漏电流减少元件和第二漏电流 连接在第二电阻和工作电位之间的减少元件。

    Nonvolatile memory cell
    5.
    发明申请
    Nonvolatile memory cell 失效
    非易失性存储单元

    公开(公告)号:US20070047292A1

    公开(公告)日:2007-03-01

    申请号:US11444295

    申请日:2006-05-31

    IPC分类号: G11C11/00

    摘要: Nonvolatile memory cell, having a first resistor that is electrically programmable in a nonvolatile fashion, a second resistor that is electrically programmable in a nonvolatile fashion, a first leakage current reducing element connected between the first resistor and an operating potential, and a second leakage current reducing element connected between the second resistor and the operating potential.

    摘要翻译: 具有以非易失性方式电可编程的第一电阻器的非易失性存储器单元,以非易失性方式电可编程的第二电阻器,连接在第一电阻器和工作电位之间的第一漏电流减少元件和第二漏电流 连接在第二电阻和工作电位之间的减少元件。

    Resistive memory arrangement
    7.
    发明授权
    Resistive memory arrangement 有权
    电阻记忆布置

    公开(公告)号:US07561460B2

    公开(公告)日:2009-07-14

    申请号:US11688556

    申请日:2007-03-20

    IPC分类号: G11C11/00

    摘要: Provided is a resistive memory arrangement having a cell array structured in rows and columns and having resistive memory cells connected to a drive element for driving. Each drive element is jointly connected to n cell resistors forming a memory cell, the cell resistors being CBRAM resistance elements, in particular, and also to a writing, reading and erasing method for a resistive memory arrangement realized with CBRAM resistance elements.

    摘要翻译: 提供了具有以行和列构成的单元阵列并且具有连接到用于驱动的​​驱动元件的电阻性存储单元的电阻式存储器装置。 每个驱动元件共同连接到形成存储单元的n个单元电阻器,单元电阻器是CBRAM电阻元件,特别是与CBRAM电阻元件实现的用于电阻存储器布置的写入,读取和擦除方法。

    Write/delete process for resistive switching memory components
    8.
    发明授权
    Write/delete process for resistive switching memory components 有权
    电阻式开关存储器组件的写/删除过程

    公开(公告)号:US07457145B2

    公开(公告)日:2008-11-25

    申请号:US11092969

    申请日:2005-03-30

    IPC分类号: G11C11/00

    摘要: The invention relates to a system, a memory component and a process for operating a memory cell, which includes an active material, which can be changed into a more or less conductive state by an appropriate switching process, whereby the process including (a) bringing the memory cell into the more or less conductive state and evaluating the state of the memory cell after it has been changed into the more or less conductive state.

    摘要翻译: 本发明涉及一种用于操作存储器单元的系统,存储器组件和用于操作存储单元的过程,其包括活性材料,其可以通过适当的切换过程改变为或多或少的导电状态,由此该过程包括(a)带来 存储器单元进入或多或少的导电状态,并且在将存储单元改变为或多或少的导电状态之后评估存储单元的状态。

    Method and device for programming CBRAM memory cells
    10.
    发明申请
    Method and device for programming CBRAM memory cells 失效
    用于编程CBRAM存储单元的方法和设备

    公开(公告)号:US20070053224A1

    公开(公告)日:2007-03-08

    申请号:US11515421

    申请日:2006-09-05

    IPC分类号: G11C16/04

    摘要: Methods and devices for programming conductive bridging RAM (CBRAM) memory cells improve the cycle stability by ensuring that the memory cells are erased before being written to anew. Optionally, in the event of overwriting the memory cells, memory cells may be written to only when the writing operation would alter the cell content (i.e., the state of bit stored in the memory cell is being changed from a logical 0 to a logical 1 or vice versa).

    摘要翻译: 用于编程导电桥接RAM(CBRAM)存储单元的方法和设备通过确保在重新写入之前擦除存储单元来提高周期稳定性。 可选地,在重写存储器单元的情况下,仅当写入操作将改变单元内容时(即,存储在存储单元中的位的状态正在从逻辑0改变为逻辑1 或相反亦然)。