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公开(公告)号:US20150147834A1
公开(公告)日:2015-05-28
申请号:US14608306
申请日:2015-01-29
发明人: Chen-Hua Yu , Hung-Pin Chang , Yung-Chi Lin , Chia-Lin Yu , Jui-Pin Hung , Chien Ling Hwang
CPC分类号: H01L21/76898 , H01L21/3065 , H01L21/486 , H01L21/6835 , H01L21/76843 , H01L21/76876 , H01L21/76877 , H01L21/76879 , H01L23/147 , H01L23/481 , H01L23/49827 , H01L24/29 , H01L24/48 , H01L24/49 , H01L24/97 , H01L33/005 , H01L33/0054 , H01L33/486 , H01L33/62 , H01L33/641 , H01L33/644 , H01L33/647 , H01L2221/68345 , H01L2221/68359 , H01L2224/16 , H01L2224/32225 , H01L2224/32506 , H01L2224/48091 , H01L2224/48227 , H01L2224/48233 , H01L2224/49113 , H01L2224/73265 , H01L2224/97 , H01L2924/00012 , H01L2924/00014 , H01L2924/01019 , H01L2924/01029 , H01L2924/01078 , H01L2924/01079 , H01L2924/01322 , H01L2924/04941 , H01L2924/12041 , H01L2924/14 , H01L2924/181 , H01L2924/19041 , H01L2924/3512 , H01L2933/0066 , H01L2924/00 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要: The substrate with through silicon plugs (or vias) described above removes the need for conductive bumps. The process flow is very simple and cost efficient. The structures described combines the separate TSV, redistribution layer, and conductive bump structures into a single structure. By combining the separate structures, a low resistance electrical connection with high heat dissipation capability is created. In addition, the substrate with through silicon plugs (or vias, or trenches) also allows multiple chips to be packaged together. A through silicon trench can surround the one or more chips to provide protection against copper diffusing to neighboring devices during manufacturing. In addition, multiple chips with similar or different functions can be integrated on the TSV substrate. Through silicon plugs with different patterns can be used under a semiconductor chip(s) to improve heat dissipation and to resolve manufacturing concerns.
摘要翻译: 具有上述通孔硅衬底(或通孔)的基板消除了对导电凸块的需要。 流程非常简单,成本效益高。 所描述的结构将单独的TSV,再分配层和导电凸块结构组合成单个结构。 通过组合单独的结构,产生具有高散热能力的低电阻电连接。 此外,具有通过硅插头(或通孔或沟槽)的基板还允许将多个芯片封装在一起。 通过硅沟槽可围绕一个或多个芯片,以在制造期间提供防止铜扩散到相邻器件的保护。 此外,具有相似或不同功能的多个芯片可以集成在TSV基板上。 通过具有不同图案的硅插头可以在半导体芯片下使用以改善散热并解决制造问题。